DE60220014D1 - Fokalebenen-array-kalibrationssystem - Google Patents

Fokalebenen-array-kalibrationssystem

Info

Publication number
DE60220014D1
DE60220014D1 DE60220014T DE60220014T DE60220014D1 DE 60220014 D1 DE60220014 D1 DE 60220014D1 DE 60220014 T DE60220014 T DE 60220014T DE 60220014 T DE60220014 T DE 60220014T DE 60220014 D1 DE60220014 D1 DE 60220014D1
Authority
DE
Germany
Prior art keywords
focal plane
calibration system
plane array
array
calibration
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60220014T
Other languages
English (en)
Other versions
DE60220014T2 (de
Inventor
Cheng-Chih Tsai
Chungte W Chen
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Raytheon Co
Original Assignee
Raytheon Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Raytheon Co filed Critical Raytheon Co
Publication of DE60220014D1 publication Critical patent/DE60220014D1/de
Application granted granted Critical
Publication of DE60220014T2 publication Critical patent/DE60220014T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/52—Radiation pyrometry, e.g. infrared or optical thermometry using comparison with reference sources, e.g. disappearing-filament pyrometer
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
    • H04N25/671—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
    • H04N25/672—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction between adjacent sensors or output registers for reading a single image
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/20—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from infrared radiation only
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N5/00—Details of television systems
    • H04N5/30—Transforming light or analogous information into electric information
    • H04N5/33—Transforming infrared radiation

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
DE60220014T 2001-08-06 2002-08-06 Fokalebenen-array-kalibrationssystem Expired - Lifetime DE60220014T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09/923,162 US6670596B2 (en) 2001-08-06 2001-08-06 Radiometry calibration system and method for electro-optical sensors
US923162 2001-08-06
PCT/US2002/024931 WO2003015397A1 (en) 2001-08-06 2002-08-06 Focal plane array calibration system

Publications (2)

Publication Number Publication Date
DE60220014D1 true DE60220014D1 (de) 2007-06-21
DE60220014T2 DE60220014T2 (de) 2008-01-10

Family

ID=25448222

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60220014T Expired - Lifetime DE60220014T2 (de) 2001-08-06 2002-08-06 Fokalebenen-array-kalibrationssystem

Country Status (5)

Country Link
US (1) US6670596B2 (de)
EP (1) EP1332612B1 (de)
JP (1) JP4417713B2 (de)
DE (1) DE60220014T2 (de)
WO (1) WO2003015397A1 (de)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7132648B2 (en) * 2003-04-15 2006-11-07 Science & Technology Corporation@Unm Uniform, non-disruptive, and radiometrically accurate calibration of infrared focal plane arrays using global scene motion
US7304297B1 (en) 2004-07-01 2007-12-04 Raytek Corporation Thermal imager utilizing improved radiometric calibration technique
DE102005047595A1 (de) * 2005-10-05 2007-04-12 Carl Zeiss Sms Gmbh Verfahren zur Ermittlung der Empfindlichkeit von Sensorarrays
DE102006000976A1 (de) * 2006-01-07 2007-07-12 Leica Microsystems Cms Gmbh Vorrichtung, Mikroskop mit Vorrichtung und Verfahren zum Kalibrieren eines Photosensor-Chips
US8111290B2 (en) 2008-06-06 2012-02-07 Microsoft Corporation Radiometric calibration using temporal irradiance mixtures
US8373757B1 (en) * 2009-02-23 2013-02-12 Flir Systems, Inc. Flat field correction for infrared cameras
US9491376B2 (en) 2009-02-23 2016-11-08 Flir Systems, Inc. Flat field correction for infrared cameras
US8824029B2 (en) * 2011-06-16 2014-09-02 Cal-Comp Electronics & Communications Company Limited Color calibration method and image processing device using the same
IL216515A (en) 2011-11-22 2015-02-26 Israel Aerospace Ind Ltd A system and method for processing images from a camera set
CN103076156B (zh) * 2013-01-08 2015-07-22 江苏涛源电子科技有限公司 红外焦平面阵列的多判据盲元检测方法
FR3018022B1 (fr) * 2014-02-26 2017-07-14 Centre Nat D'etudes Spatiales (Cnes) Procede et dispositif d'estimation de parametres d'egalisation d'image numerique
DE102014018340B3 (de) * 2014-11-20 2016-01-07 Bundesrepublik Deutschland, vertr. durch das Bundesministerium für Wirtschaft und Energie, dieses vertreten durch den Präsidenten der Physikalisch-Technischen Bundesanstalt Verfahren zum Ermitteln von Korrekturparametern zum Korrigieren von Messwerten von Bildpunkten, um die Ungleichheit des Übertragungsverhaltens einzelner oder aller Bildpunkte eines Bildaufnahmesystems zu korrigieren
US11614365B1 (en) * 2021-04-13 2023-03-28 Bae Systems Information And Electronic Systems Integration Inc. Luminescent cold shield paneling for infrared camera continuous non-uniformity correction

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4876453A (en) 1986-02-19 1989-10-24 Hughes Aircraft Company Method and apparatus for calibrating an imaging sensor
US5302824A (en) 1992-12-01 1994-04-12 Hughes Aircraft Company Measurement of relative detector gain
US5514865A (en) 1994-06-10 1996-05-07 Westinghouse Electric Corp. Dither image scanner with compensation for individual detector response and gain correction
US5925880A (en) * 1996-08-30 1999-07-20 Raytheon Company Non uniformity compensation for infrared detector arrays
US5789622A (en) * 1996-09-12 1998-08-04 Trw Inc. Focal plane array calibration method
US5902994A (en) * 1997-05-06 1999-05-11 Eastman Kodak Company Apparatus for calibrating a linear image sensor

Also Published As

Publication number Publication date
US6670596B2 (en) 2003-12-30
EP1332612B1 (de) 2007-05-09
EP1332612A1 (de) 2003-08-06
WO2003015397A1 (en) 2003-02-20
DE60220014T2 (de) 2008-01-10
JP2004538476A (ja) 2004-12-24
JP4417713B2 (ja) 2010-02-17
US20030025067A1 (en) 2003-02-06

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition