DE60214746D1 - Testschaltung - Google Patents
TestschaltungInfo
- Publication number
- DE60214746D1 DE60214746D1 DE60214746T DE60214746T DE60214746D1 DE 60214746 D1 DE60214746 D1 DE 60214746D1 DE 60214746 T DE60214746 T DE 60214746T DE 60214746 T DE60214746 T DE 60214746T DE 60214746 D1 DE60214746 D1 DE 60214746D1
- Authority
- DE
- Germany
- Prior art keywords
- power supply
- subset
- current drawing
- drawing circuits
- activation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C5/00—Details of stores covered by group G11C11/00
- G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16533—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application
- G01R19/16538—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies
- G01R19/16552—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies in I.C. power supplies
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Semiconductor Integrated Circuits (AREA)
- Tests Of Electronic Circuits (AREA)
- Glass Compositions (AREA)
- Air Bags (AREA)
- Oscillators With Electromechanical Resonators (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP01201973 | 2001-05-23 | ||
EP01201973 | 2001-05-23 | ||
PCT/IB2002/001817 WO2002095430A2 (en) | 2001-05-23 | 2002-05-21 | Test circuit |
Publications (2)
Publication Number | Publication Date |
---|---|
DE60214746D1 true DE60214746D1 (de) | 2006-10-26 |
DE60214746T2 DE60214746T2 (de) | 2007-12-06 |
Family
ID=8180369
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60214746T Expired - Lifetime DE60214746T2 (de) | 2001-05-23 | 2002-05-21 | Testschaltung |
Country Status (6)
Country | Link |
---|---|
EP (1) | EP1435004B1 (de) |
JP (1) | JP4090891B2 (de) |
KR (1) | KR100860214B1 (de) |
AT (1) | ATE339695T1 (de) |
DE (1) | DE60214746T2 (de) |
WO (1) | WO2002095430A2 (de) |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0306656A1 (de) * | 1987-08-20 | 1989-03-15 | Siemens Aktiengesellschaft | Einrichtung zur Prüfung von IC-Bausteinen |
EP0747930B1 (de) * | 1995-05-19 | 2000-09-27 | STMicroelectronics S.r.l. | Elektronische Schaltung mit mehreren Banddrähten, Herstellungsmethode und Testverfahren des Banddrahtzusammenhangs |
KR0172347B1 (ko) * | 1995-12-23 | 1999-03-30 | 김광호 | 반도체 메모리장치의 병렬테스트 회로 |
JPH11237441A (ja) * | 1998-02-20 | 1999-08-31 | Nec Corp | 半導体集積回路装置、半導体集積回路装置の製造方法、及び半導体集積回路装置の検査方法 |
KR20020008158A (ko) * | 2000-02-23 | 2002-01-29 | 롤페스 요하네스 게라투스 알베르투스 | 테스트 인터페이스를 가지는 집적 회로 및 집적 회로테스트 방법 |
-
2002
- 2002-05-21 JP JP2002591850A patent/JP4090891B2/ja not_active Expired - Lifetime
- 2002-05-21 AT AT02730604T patent/ATE339695T1/de not_active IP Right Cessation
- 2002-05-21 KR KR1020037000957A patent/KR100860214B1/ko not_active IP Right Cessation
- 2002-05-21 EP EP02730604A patent/EP1435004B1/de not_active Expired - Lifetime
- 2002-05-21 DE DE60214746T patent/DE60214746T2/de not_active Expired - Lifetime
- 2002-05-21 WO PCT/IB2002/001817 patent/WO2002095430A2/en active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
WO2002095430A3 (en) | 2004-04-22 |
KR20030020941A (ko) | 2003-03-10 |
EP1435004B1 (de) | 2006-09-13 |
ATE339695T1 (de) | 2006-10-15 |
KR100860214B1 (ko) | 2008-09-24 |
WO2002095430A2 (en) | 2002-11-28 |
DE60214746T2 (de) | 2007-12-06 |
JP4090891B2 (ja) | 2008-05-28 |
EP1435004A2 (de) | 2004-07-07 |
JP2004531728A (ja) | 2004-10-14 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8328 | Change in the person/name/address of the agent |
Representative=s name: EISENFUEHR, SPEISER & PARTNER, 10178 BERLIN |
|
8327 | Change in the person/name/address of the patent owner |
Owner name: NXP B.V., EINDHOVEN, NL |