DE60211573D1 - Eichungsmittel und zugehörige Benutzungsmethode - Google Patents

Eichungsmittel und zugehörige Benutzungsmethode

Info

Publication number
DE60211573D1
DE60211573D1 DE60211573T DE60211573T DE60211573D1 DE 60211573 D1 DE60211573 D1 DE 60211573D1 DE 60211573 T DE60211573 T DE 60211573T DE 60211573 T DE60211573 T DE 60211573T DE 60211573 D1 DE60211573 D1 DE 60211573D1
Authority
DE
Germany
Prior art keywords
size
calibrator
substrate
change
associated method
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60211573T
Other languages
English (en)
Other versions
DE60211573T2 (de
Inventor
Richard Roelke
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Heidenhain Corp
Original Assignee
Metronics Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Metronics Inc filed Critical Metronics Inc
Application granted granted Critical
Publication of DE60211573D1 publication Critical patent/DE60211573D1/de
Publication of DE60211573T2 publication Critical patent/DE60211573T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/024—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of diode-array scanning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/042—Calibration or calibration artifacts

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Dental Tools And Instruments Or Auxiliary Dental Instruments (AREA)
  • Electrotherapy Devices (AREA)
DE60211573T 2001-02-06 2002-01-25 Kalibrierungssystem für ein Bildverarbeitungs-Messsystem Expired - Lifetime DE60211573T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/777,529 US6704102B2 (en) 2001-02-06 2001-02-06 Calibration artifact and method of using the same
US777529 2001-02-06

Publications (2)

Publication Number Publication Date
DE60211573D1 true DE60211573D1 (de) 2006-06-29
DE60211573T2 DE60211573T2 (de) 2006-09-28

Family

ID=25110499

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60211573T Expired - Lifetime DE60211573T2 (de) 2001-02-06 2002-01-25 Kalibrierungssystem für ein Bildverarbeitungs-Messsystem

Country Status (4)

Country Link
US (1) US6704102B2 (de)
EP (1) EP1229303B1 (de)
AT (1) ATE327495T1 (de)
DE (1) DE60211573T2 (de)

Families Citing this family (45)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7248356B2 (en) * 2004-04-06 2007-07-24 Pulsion Medical Systems Ag Calibration aid
GB0603653D0 (en) * 2006-02-24 2006-04-05 Renishaw Plc Tool detection
CA2582112A1 (en) * 2006-03-13 2007-09-13 Clemex Technologies Inc. System and method for automatic measurements and calibration of computerized magnifying instruments
JP2008008636A (ja) * 2006-06-27 2008-01-17 Reitetsukusu:Kk 端部検査装置の校正方法
US7788818B1 (en) * 2007-10-02 2010-09-07 Sandia Corporation Mesoscale hybrid calibration artifact
US8883261B2 (en) 2007-12-21 2014-11-11 United Technologies Corporation Artifacts, method of creating such artifacts and methods of using such artifacts
US7869026B2 (en) * 2007-12-21 2011-01-11 United Technologies Corp. Targeted artifacts and methods for evaluating 3-D coordinate system measurement accuracy of optical 3-D measuring systems using such targeted artifacts
US8105651B2 (en) * 2007-12-21 2012-01-31 United Technologies Corp. Artifacts, methods of creating such artifacts and methods of using such artifacts
US8908995B2 (en) 2009-01-12 2014-12-09 Intermec Ip Corp. Semi-automatic dimensioning with imager on a portable device
CN102175151B (zh) * 2011-02-16 2012-11-21 珠海市怡信测量科技有限公司 一种影像测量仪
DE102011001388A1 (de) * 2011-03-18 2012-09-20 SPERING micro-systems Verfahren zur Bestimmung eines Rohrdurchmessers
US9779546B2 (en) 2012-05-04 2017-10-03 Intermec Ip Corp. Volume dimensioning systems and methods
US10007858B2 (en) 2012-05-15 2018-06-26 Honeywell International Inc. Terminals and methods for dimensioning objects
US10321127B2 (en) 2012-08-20 2019-06-11 Intermec Ip Corp. Volume dimensioning system calibration systems and methods
US9841311B2 (en) * 2012-10-16 2017-12-12 Hand Held Products, Inc. Dimensioning system
US10228452B2 (en) 2013-06-07 2019-03-12 Hand Held Products, Inc. Method of error correction for 3D imaging device
US9823059B2 (en) 2014-08-06 2017-11-21 Hand Held Products, Inc. Dimensioning system with guided alignment
US10810715B2 (en) 2014-10-10 2020-10-20 Hand Held Products, Inc System and method for picking validation
US10775165B2 (en) 2014-10-10 2020-09-15 Hand Held Products, Inc. Methods for improving the accuracy of dimensioning-system measurements
US9779276B2 (en) 2014-10-10 2017-10-03 Hand Held Products, Inc. Depth sensor based auto-focus system for an indicia scanner
US9897434B2 (en) 2014-10-21 2018-02-20 Hand Held Products, Inc. Handheld dimensioning system with measurement-conformance feedback
US9752864B2 (en) 2014-10-21 2017-09-05 Hand Held Products, Inc. Handheld dimensioning system with feedback
US10060729B2 (en) 2014-10-21 2018-08-28 Hand Held Products, Inc. Handheld dimensioner with data-quality indication
US9786101B2 (en) 2015-05-19 2017-10-10 Hand Held Products, Inc. Evaluating image values
US10066982B2 (en) 2015-06-16 2018-09-04 Hand Held Products, Inc. Calibrating a volume dimensioner
US20160377414A1 (en) 2015-06-23 2016-12-29 Hand Held Products, Inc. Optical pattern projector
US9835486B2 (en) 2015-07-07 2017-12-05 Hand Held Products, Inc. Mobile dimensioner apparatus for use in commerce
US20170017301A1 (en) 2015-07-16 2017-01-19 Hand Held Products, Inc. Adjusting dimensioning results using augmented reality
US10094650B2 (en) 2015-07-16 2018-10-09 Hand Held Products, Inc. Dimensioning and imaging items
US10249030B2 (en) 2015-10-30 2019-04-02 Hand Held Products, Inc. Image transformation for indicia reading
US10225544B2 (en) 2015-11-19 2019-03-05 Hand Held Products, Inc. High resolution dot pattern
US10025314B2 (en) 2016-01-27 2018-07-17 Hand Held Products, Inc. Vehicle positioning and object avoidance
US10339352B2 (en) 2016-06-03 2019-07-02 Hand Held Products, Inc. Wearable metrological apparatus
US10163216B2 (en) 2016-06-15 2018-12-25 Hand Held Products, Inc. Automatic mode switching in a volume dimensioner
US10288410B2 (en) * 2016-11-10 2019-05-14 The Boeing Company Method and system for identifying wire contact insertion holes of a connector
US10909708B2 (en) * 2016-12-09 2021-02-02 Hand Held Products, Inc. Calibrating a dimensioner using ratios of measurable parameters of optic ally-perceptible geometric elements
US11047672B2 (en) 2017-03-28 2021-06-29 Hand Held Products, Inc. System for optically dimensioning
DE102017113897A1 (de) * 2017-06-22 2018-12-27 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Kalibriernormal und Verfahren zu seiner Herstellung
US10733748B2 (en) 2017-07-24 2020-08-04 Hand Held Products, Inc. Dual-pattern optical 3D dimensioning
DE202017107883U1 (de) 2017-12-22 2018-01-12 Carl Mahr Holding Gmbh Kalibrierschablone und Halteeinrichtung für eine Kalibrierschablone
DE202017107915U1 (de) 2017-12-27 2018-01-15 Carl Mahr Holding Gmbh Kalibrierschablone und Halteeinrichtung für eine Kalibrierschablone
US10584962B2 (en) 2018-05-01 2020-03-10 Hand Held Products, Inc System and method for validating physical-item security
DE102018133671A1 (de) * 2018-12-28 2020-07-02 Carl Zeiss Industrielle Messtechnik Gmbh Normal zur Kalibrierung eines Koordinatenmessgeräts
US11639846B2 (en) 2019-09-27 2023-05-02 Honeywell International Inc. Dual-pattern optical 3D dimensioning
CN111047586B (zh) * 2019-12-26 2023-07-14 中国矿业大学 一种基于机器视觉的像素当量测量方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4750141A (en) * 1985-11-26 1988-06-07 Ade Corporation Method and apparatus for separating fixture-induced error from measured object characteristics and for compensating the measured object characteristic with the error, and a bow/warp station implementing same
US5327907A (en) * 1992-12-01 1994-07-12 Peter Fischer Biomechanical measurement tool
US5507740A (en) * 1993-05-03 1996-04-16 O'donnell, Jr.; Francis E. Corneal topography enhancement device
US5389774A (en) 1993-11-08 1995-02-14 Optical Gaging Products, Inc. Method and means for calibrating the magnification of zoom optical systems using reticle images
JP2002503338A (ja) 1997-05-30 2002-01-29 ブリティッシュ・ブロードキャスティング・コーポレーション 位置検出
US6567570B1 (en) 1998-10-30 2003-05-20 Hewlett-Packard Development Company, L.P. Optical image scanner with internal measurement of point-spread function and compensation for optical aberrations
US6459481B1 (en) * 1999-05-06 2002-10-01 David F. Schaack Simple system for endoscopic non-contact three-dimentional measurement
GB9928124D0 (en) 1999-11-26 2000-01-26 Instro Prec Ltd An optical position detector

Also Published As

Publication number Publication date
DE60211573T2 (de) 2006-09-28
EP1229303A2 (de) 2002-08-07
EP1229303A3 (de) 2003-06-25
US6704102B2 (en) 2004-03-09
ATE327495T1 (de) 2006-06-15
US20020105639A1 (en) 2002-08-08
EP1229303B1 (de) 2006-05-24

Similar Documents

Publication Publication Date Title
DE60211573D1 (de) Eichungsmittel und zugehörige Benutzungsmethode
DE69632810D1 (de) Optisches Element, Verfahren zur Herstellung eines optischen Elements, und dreidimensionale Anzeigevorrichtung
DE69111932T2 (de) Tönungsskala-herstellungsverfahren und vorrichtung für digitale röntgenbilder.
WO2001089201A3 (en) Apparatus and method for measurement, encoding and displaying of object color for digital imaging
DE69622943T2 (de) Optisches Dünnfilmmessverfahren, Filmformationsverfahren und Halbleiterlaserfabrikationsverfahren
GB2369279B (en) User interface apparatuses data signals articles of manufacture image forming systems and processor-implemented methods
DE69418842T2 (de) Apparat zur Messung der Oxidladung auf Halbleiterscheiben und Methode zur Herstellung einer Sonde für den vorerwähnten Apparat
SG155035A1 (en) Specification determining method, projection optical system making method and adjusting method, exposure apparatus and making method thereof, and computer system
DE69127151T2 (de) Farbeichungsgerät und -verfahren
DE69222963D1 (de) Abbildungsverfahren zur Herstellung von Mikrovorrichtungen
DE69404000D1 (de) Flache Bildwiedergabeanordnung und Herstellungsverfahren
DE69402041D1 (de) Phantom zur Röntgenkalibrierung
FI20002209A0 (fi) Rannelaite
ITRM970233A0 (it) Gamma camera miniaturizzata ad alta risoluzione spaziale
DE50201477D1 (de) Optisch variables flächenmuster
WO2002102222A8 (en) Back projection visual field tester
DE60121785D1 (de) Aktive tft-matrix für einen optischen sensor mit lichtempfindlicher halbleiterschicht, und optischer sensor mit einer solchen matrix
ATA27293A (de) Streckwerk für eine ringspinnvorrichtung
DE60040197D1 (de) Test- und Messinstrument mit mehrkanaliger Telekommunikationsmaskentestfähigkeit
FR2829290B1 (fr) Capteur d'image couleur sur substrat transparent et procede de fabrication
DE602004001175D1 (de) Kernspintomograph
DE69605601D1 (de) Elektronenemittierende Vorrichtung, Elektronenquelle mit dieser elektronenemittierenden Vorrichtung, Bilderzeugungsgerät mit dieser Elektronenquelle und Herstellungsverfahren dieser elektronenemittierenden Vorrichtung
WO2004008079A3 (en) A rotary scale
WO2002043604A3 (en) Apparatus for the transillumination imaging of teeth
DE60143560D1 (de) Transfer-folie und Verfahren und Vorrichtung, flache Kathodenstrahlröhre und Herstellung derselben

Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: HEIDENHAIN CORP., SCHAUMBURG, III., US