DE60206121D1 - Federstruktur - Google Patents

Federstruktur

Info

Publication number
DE60206121D1
DE60206121D1 DE60206121T DE60206121T DE60206121D1 DE 60206121 D1 DE60206121 D1 DE 60206121D1 DE 60206121 T DE60206121 T DE 60206121T DE 60206121 T DE60206121 T DE 60206121T DE 60206121 D1 DE60206121 D1 DE 60206121D1
Authority
DE
Germany
Prior art keywords
spring structure
spring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60206121T
Other languages
English (en)
Other versions
DE60206121T2 (de
Inventor
Linda T Romano
David K Fork
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Xerox Corp
Original Assignee
Xerox Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Xerox Corp filed Critical Xerox Corp
Publication of DE60206121D1 publication Critical patent/DE60206121D1/de
Application granted granted Critical
Publication of DE60206121T2 publication Critical patent/DE60206121T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00—Apparatus or processes for manufacturing printed circuits
    • H05K3/40—Forming printed elements for providing electric connections to or between printed circuits
    • H05K3/4092—Integral conductive tabs, i.e. conductive parts partly detached from the substrate
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06727—Cantilever beams
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R3/00—Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/49—Method of mechanical manufacture
    • Y10T29/49002—Electrical device making
    • Y10T29/49117—Conductor or circuit manufacturing
    • Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
    • Y10T29/4913—Assembling to base an electrical component, e.g., capacitor, etc.

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Micromachines (AREA)
  • Wire Bonding (AREA)
  • Magnetic Heads (AREA)
  • Measuring Leads Or Probes (AREA)
DE60206121T 2001-10-12 2002-10-02 Federstruktur Expired - Lifetime DE60206121T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US976394 2001-10-12
US09/976,394 US6794737B2 (en) 2001-10-12 2001-10-12 Spring structure with stress-balancing layer

Publications (2)

Publication Number Publication Date
DE60206121D1 true DE60206121D1 (de) 2005-10-20
DE60206121T2 DE60206121T2 (de) 2006-05-04

Family

ID=25524048

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60206121T Expired - Lifetime DE60206121T2 (de) 2001-10-12 2002-10-02 Federstruktur

Country Status (4)

Country Link
US (1) US6794737B2 (de)
EP (1) EP1304768B1 (de)
JP (1) JP4427239B2 (de)
DE (1) DE60206121T2 (de)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100470708B1 (ko) 2003-05-22 2005-03-10 삼성전자주식회사 금속막의 내부응력을 이용한 박막 벌크 음향 공진기제조방법 및 그에 의한 공진기
FR2859201B1 (fr) * 2003-08-29 2007-09-21 Commissariat Energie Atomique Dispositif micromecanique comportant un element suspendu rattache a un support par un pilier et procede de fabrication d'un tel dispositif
US7410590B2 (en) * 2003-12-19 2008-08-12 Palo Alto Research Center Incorporated Transferable micro spring structure
WO2005104717A2 (en) * 2004-04-23 2005-11-10 Research Triangle Institute Flexible electrostatic actuator
US7262495B2 (en) * 2004-10-07 2007-08-28 Hewlett-Packard Development Company, L.P. 3D interconnect with protruding contacts
US7550855B2 (en) * 2005-12-02 2009-06-23 Palo Alto Research Center Incorporated Vertically spaced plural microsprings
US20090140433A1 (en) * 2007-11-30 2009-06-04 Alces Technology, Inc. MEMS chip-to-chip interconnects
TWI404428B (zh) * 2009-11-25 2013-08-01 Ind Tech Res Inst 聲學感測器
US8579414B2 (en) 2009-12-23 2013-11-12 Xerox Corporation Self-assembling structures for electrostatic extraction of pigments from liquid inks for marking
US8519534B2 (en) 2010-09-22 2013-08-27 Palo Alto Research Center Incorporated Microsprings partially embedded in a laminate structure and methods for producing same
US8441808B2 (en) 2010-09-22 2013-05-14 Palo Alto Research Center Incorporated Interposer with microspring contacts
CN102305256B (zh) * 2011-09-06 2013-06-12 复旦大学 一种金属微米/纳米弹簧及其制备方法和应用
US8525353B2 (en) 2011-12-19 2013-09-03 Palo Alto Research Center Incorporated Microspring structures adapted for target device cooling
CN104555908A (zh) * 2014-12-04 2015-04-29 复旦大学 一种微弹簧的加工方法
US11434130B2 (en) * 2019-12-31 2022-09-06 Texas Instruments Incorporated Surface micromachined structures

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3842189A (en) * 1973-01-08 1974-10-15 Rca Corp Contact array and method of making the same
US5613861A (en) * 1995-06-07 1997-03-25 Xerox Corporation Photolithographically patterned spring contact
US6236491B1 (en) * 1999-05-27 2001-05-22 Mcnc Micromachined electrostatic actuator with air gap
US6290510B1 (en) * 2000-07-27 2001-09-18 Xerox Corporation Spring structure with self-aligned release material
US6528250B1 (en) * 2000-09-09 2003-03-04 Akzo Nobel N.V. Equine infectious anemia challenge model for testing vaccines, diagnostics and treatments
US6560861B2 (en) * 2001-07-11 2003-05-13 Xerox Corporation Microspring with conductive coating deposited on tip after release

Also Published As

Publication number Publication date
EP1304768A3 (de) 2004-02-04
US6794737B2 (en) 2004-09-21
JP2003218292A (ja) 2003-07-31
EP1304768B1 (de) 2005-09-14
JP4427239B2 (ja) 2010-03-03
DE60206121T2 (de) 2006-05-04
US20030071330A1 (en) 2003-04-17
EP1304768A2 (de) 2003-04-23

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition