DE602007003385D1 - Beschichtungen und verfahren zur hemmung von zinnwhiskerwachstum - Google Patents
Beschichtungen und verfahren zur hemmung von zinnwhiskerwachstumInfo
- Publication number
- DE602007003385D1 DE602007003385D1 DE602007003385T DE602007003385T DE602007003385D1 DE 602007003385 D1 DE602007003385 D1 DE 602007003385D1 DE 602007003385 T DE602007003385 T DE 602007003385T DE 602007003385 T DE602007003385 T DE 602007003385T DE 602007003385 D1 DE602007003385 D1 DE 602007003385D1
- Authority
- DE
- Germany
- Prior art keywords
- interested
- coatings
- inhibiting
- wax growth
- wax
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C26/00—Coating not provided for in groups C23C2/00 - C23C24/00
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C28/00—Coating for obtaining at least two superposed coatings either by methods not provided for in a single one of groups C23C2/00 - C23C26/00 or by combinations of methods provided for in subclasses C23C and C25C or C25D
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/48—After-treatment of electroplated surfaces
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/22—Secondary treatment of printed circuits
- H05K3/28—Applying non-metallic protective coatings
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/01—Dielectrics
- H05K2201/0104—Properties and characteristics in general
- H05K2201/0116—Porous, e.g. foam
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/07—Electric details
- H05K2201/0753—Insulation
- H05K2201/0769—Anti metal-migration, e.g. avoiding tin whisker growth
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/08—Treatments involving gases
- H05K2203/086—Using an inert gas
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/08—Treatments involving gases
- H05K2203/087—Using a reactive gas
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/22—Secondary treatment of printed circuits
- H05K3/24—Reinforcing the conductive pattern
- H05K3/244—Finish plating of conductors, especially of copper conductors, e.g. for pads or lands
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Mechanical Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Electrochemistry (AREA)
- Electroplating Methods And Accessories (AREA)
- Other Surface Treatments For Metallic Materials (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/506,541 US20070284700A1 (en) | 2006-06-07 | 2006-08-18 | Coatings and methods for inhibiting tin whisker growth |
PCT/US2007/076066 WO2008022236A1 (en) | 2006-08-18 | 2007-08-16 | Coatings and methods for inhibiting tin whisker growth |
Publications (1)
Publication Number | Publication Date |
---|---|
DE602007003385D1 true DE602007003385D1 (de) | 2009-12-31 |
Family
ID=38692061
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE602007003385T Active DE602007003385D1 (de) | 2006-08-18 | 2007-08-16 | Beschichtungen und verfahren zur hemmung von zinnwhiskerwachstum |
Country Status (4)
Country | Link |
---|---|
US (1) | US20070284700A1 (de) |
EP (1) | EP2051850B1 (de) |
DE (1) | DE602007003385D1 (de) |
WO (1) | WO2008022236A1 (de) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10231344B2 (en) | 2007-05-18 | 2019-03-12 | Applied Nanotech Holdings, Inc. | Metallic ink |
US8404160B2 (en) | 2007-05-18 | 2013-03-26 | Applied Nanotech Holdings, Inc. | Metallic ink |
US8506849B2 (en) | 2008-03-05 | 2013-08-13 | Applied Nanotech Holdings, Inc. | Additives and modifiers for solvent- and water-based metallic conductive inks |
US9730333B2 (en) | 2008-05-15 | 2017-08-08 | Applied Nanotech Holdings, Inc. | Photo-curing process for metallic inks |
CN102365713B (zh) | 2009-03-27 | 2015-11-25 | 应用纳米技术控股股份有限公司 | 增强光和/或激光烧结的缓冲层 |
US8422197B2 (en) | 2009-07-15 | 2013-04-16 | Applied Nanotech Holdings, Inc. | Applying optical energy to nanoparticles to produce a specified nanostructure |
US8551263B1 (en) * | 2009-12-15 | 2013-10-08 | Emc Corporation | Method for reducing whisker growth |
WO2014011578A1 (en) | 2012-07-09 | 2014-01-16 | Applied Nanotech Holdings, Inc. | Photosintering of micron-sized copper particles |
US8907225B1 (en) * | 2013-04-11 | 2014-12-09 | The United States Of America As Represented By The Secretary Of The Navy | Structures and methods related to detection, sensing, and/or mitigating undesirable structures or intrusion events on structures |
US10178756B1 (en) * | 2014-10-29 | 2019-01-08 | National Technology & Engineering Solutions Of Sandia, Llc | Multifunctional composite coatings for metal whisker mitigation |
CN105297137B (zh) * | 2015-11-17 | 2018-03-02 | 中国科学院金属研究所 | 一种从薄膜表面可控制备单晶锡纳米线/微米线的方法 |
Family Cites Families (39)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3042780A (en) * | 1960-09-28 | 1962-07-03 | Gen Electric | Resin foam insulated cabinet structure including improved electrical conductor arrangement |
US3670091A (en) * | 1971-05-20 | 1972-06-13 | Sqrague Electric Co | Encapsulated electrical components with protective pre-coat containing collapsible microspheres |
US4749626A (en) * | 1985-08-05 | 1988-06-07 | Olin Corporation | Whisker resistant tin coatings and baths and methods for making such coatings |
US4959278A (en) * | 1988-06-16 | 1990-09-25 | Nippon Mining Co., Ltd. | Tin whisker-free tin or tin alloy plated article and coating technique thereof |
US4888057A (en) * | 1988-06-29 | 1989-12-19 | Her Majesty The Queen As Represented By The Minister Of National Defence Of Her Majesty's Canadian Government | Inorganic intumescent fire protective coatings |
US5320737A (en) * | 1989-08-10 | 1994-06-14 | Olin Corporation | Treatment to reduce solder plating whisker formation |
US5032421A (en) * | 1990-08-21 | 1991-07-16 | Amp Incorporated | Metal coating method |
US5393573A (en) * | 1991-07-16 | 1995-02-28 | Microelectronics And Computer Technology Corporation | Method of inhibiting tin whisker growth |
US5206088A (en) * | 1991-11-13 | 1993-04-27 | Development Products, Inc. | Ablative-intumescent system |
EP0854768A1 (de) * | 1995-10-06 | 1998-07-29 | Brown University Research Foundation | Weichlotzusammensetzungen und - verfahren |
JP3302240B2 (ja) * | 1995-11-28 | 2002-07-15 | シャープ株式会社 | 薄膜トランジスタ及びその製造方法 |
US20010051209A1 (en) * | 1996-10-11 | 2001-12-13 | Richard Silberglitt | Suppresion of voltage breakdown and field emission from surfaces |
US6083633A (en) * | 1997-06-16 | 2000-07-04 | Olin Corporation | Multi-layer diffusion barrier for a tin coated electrical connector |
US6248455B1 (en) * | 1998-12-22 | 2001-06-19 | International Business Machines Corporation | Alloy-plated sheet steel cured with a thin layer of insulating polymer material forming an electrically nonconductive breachable metal substrate |
WO2001039558A1 (en) * | 1999-11-23 | 2001-05-31 | Koninklijke Philips Electronics N.V. | X-ray examination apparatus with exposure control |
US6361823B1 (en) * | 1999-12-03 | 2002-03-26 | Atotech Deutschland Gmbh | Process for whisker-free aqueous electroless tin plating |
US20030180621A1 (en) * | 2000-08-30 | 2003-09-25 | Isao Matsumoto | Non-sintered type thin electrode for battery, battery using same and process for same |
EP1340839B1 (de) * | 2000-11-21 | 2009-01-07 | Sambix Corporation | Whiskerloses galvanisiertes produkt mit vielschichtigem rostschutzfilm und herstellungsverfahren von whiskerlosem galvanisiertem produkt mit vielschichtigem rostschutzfilm |
JP3908912B2 (ja) * | 2001-02-22 | 2007-04-25 | 新日本製鐵株式会社 | 半田濡れ性、耐錆性、耐ホイスカー性に優れた環境対応型電子部品用表面処理鋼板 |
US20020185716A1 (en) * | 2001-05-11 | 2002-12-12 | Abys Joseph Anthony | Metal article coated with multilayer finish inhibiting whisker growth |
US20030025182A1 (en) * | 2001-06-22 | 2003-02-06 | Abys Joseph A. | Metal article coated with tin or tin alloy under tensile stress to inhibit whisker growth |
CN100517422C (zh) * | 2002-03-07 | 2009-07-22 | 三洋电机株式会社 | 配线结构、其制造方法、以及光学设备 |
TW543164B (en) * | 2002-05-29 | 2003-07-21 | Kingtron Electronics Co Ltd | Tape structure and fabrication method thereof |
DE10238943B4 (de) * | 2002-08-24 | 2013-01-03 | Evonik Degussa Gmbh | Separator-Elektroden-Einheit für Lithium-Ionen-Batterien, Verfahren zu deren Herstellung und Verwendung in Lithium-Batterien sowie eine Batterie, aufweisend die Separator-Elektroden-Einheit |
US7105383B2 (en) * | 2002-08-29 | 2006-09-12 | Freescale Semiconductor, Inc. | Packaged semiconductor with coated leads and method therefore |
KR100495184B1 (ko) * | 2002-12-02 | 2005-06-14 | 엘지마이크론 주식회사 | 테이프기판 및 그의 주석도금방법 |
JP4688406B2 (ja) * | 2003-04-17 | 2011-05-25 | セイコーインスツル株式会社 | 端子付き電気化学セル |
US6773828B1 (en) * | 2003-04-18 | 2004-08-10 | Ase Electronics (M) Sdn. Bhd. | Surface preparation to eliminate whisker growth caused by plating process interruptions |
JP4603812B2 (ja) * | 2003-05-12 | 2010-12-22 | ローム・アンド・ハース・エレクトロニック・マテリアルズ,エル.エル.シー. | 改良されたスズめっき方法 |
JP4434669B2 (ja) * | 2003-09-11 | 2010-03-17 | Necエレクトロニクス株式会社 | 電子部品 |
US7391116B2 (en) * | 2003-10-14 | 2008-06-24 | Gbc Metals, Llc | Fretting and whisker resistant coating system and method |
US20050249969A1 (en) * | 2004-05-04 | 2005-11-10 | Enthone Inc. | Preserving solderability and inhibiting whisker growth in tin surfaces of electronic components |
US20050249968A1 (en) * | 2004-05-04 | 2005-11-10 | Enthone Inc. | Whisker inhibition in tin surfaces of electronic components |
US20050274480A1 (en) * | 2004-05-24 | 2005-12-15 | Barsoum Michel W | Reduction of spontaneous metal whisker formation |
US7215014B2 (en) * | 2004-07-29 | 2007-05-08 | Freescale Semiconductor, Inc. | Solderable metal finish for integrated circuit package leads and method for forming |
US20060068218A1 (en) * | 2004-09-28 | 2006-03-30 | Hooghan Kultaransingh N | Whisker-free lead frames |
JP4185480B2 (ja) * | 2004-09-28 | 2008-11-26 | 富士通マイクロエレクトロニクス株式会社 | 積層無鉛めっきを用いた半導体装置及びその製造方法 |
JP4525285B2 (ja) * | 2004-10-12 | 2010-08-18 | 富士通株式会社 | 電子部品及びその製造方法 |
US20070287023A1 (en) * | 2006-06-07 | 2007-12-13 | Honeywell International, Inc. | Multi-phase coatings for inhibiting tin whisker growth and methods of making and using the same |
-
2006
- 2006-08-18 US US11/506,541 patent/US20070284700A1/en not_active Abandoned
-
2007
- 2007-08-16 EP EP07814146A patent/EP2051850B1/de not_active Expired - Fee Related
- 2007-08-16 WO PCT/US2007/076066 patent/WO2008022236A1/en active Application Filing
- 2007-08-16 DE DE602007003385T patent/DE602007003385D1/de active Active
Also Published As
Publication number | Publication date |
---|---|
US20070284700A1 (en) | 2007-12-13 |
EP2051850A1 (de) | 2009-04-29 |
EP2051850B1 (de) | 2009-11-18 |
WO2008022236A1 (en) | 2008-02-21 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |