DE602007000870D1 - Verfahren zur Fehlererkennung einer Zustandsmachine - Google Patents

Verfahren zur Fehlererkennung einer Zustandsmachine

Info

Publication number
DE602007000870D1
DE602007000870D1 DE602007000870T DE602007000870T DE602007000870D1 DE 602007000870 D1 DE602007000870 D1 DE 602007000870D1 DE 602007000870 T DE602007000870 T DE 602007000870T DE 602007000870 T DE602007000870 T DE 602007000870T DE 602007000870 D1 DE602007000870 D1 DE 602007000870D1
Authority
DE
Germany
Prior art keywords
state machine
error detection
error
detection
machine
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602007000870T
Other languages
English (en)
Inventor
Francois Taillet
Laurent Murillo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics SA
Original Assignee
STMicroelectronics SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by STMicroelectronics SA filed Critical STMicroelectronics SA
Publication of DE602007000870D1 publication Critical patent/DE602007000870D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318392—Generation of test inputs, e.g. test vectors, patterns or sequences for sequential circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31703—Comparison aspects, e.g. signature analysis, comparators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31705—Debugging aspects, e.g. using test circuits for debugging, using dedicated debugging test circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3177—Testing of logic operation, e.g. by logic analysers

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Logic Circuits (AREA)
DE602007000870T 2006-02-03 2007-01-25 Verfahren zur Fehlererkennung einer Zustandsmachine Active DE602007000870D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR0600974A FR2897173A1 (fr) 2006-02-03 2006-02-03 Procede de detection d'un dysfonctionnement dans une machine d'etat

Publications (1)

Publication Number Publication Date
DE602007000870D1 true DE602007000870D1 (de) 2009-05-28

Family

ID=37441080

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602007000870T Active DE602007000870D1 (de) 2006-02-03 2007-01-25 Verfahren zur Fehlererkennung einer Zustandsmachine

Country Status (4)

Country Link
US (1) US7620868B2 (de)
EP (1) EP1816484B1 (de)
DE (1) DE602007000870D1 (de)
FR (1) FR2897173A1 (de)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8094706B2 (en) * 2007-04-10 2012-01-10 International Business Machines Corporation Frequency-based, active monitoring of reliability of a digital system
US9471544B1 (en) 2012-05-24 2016-10-18 Google Inc. Anomaly detection in a signal
US9628499B1 (en) 2012-08-08 2017-04-18 Google Inc. Statistics-based anomaly detection
US9614742B1 (en) 2013-03-14 2017-04-04 Google Inc. Anomaly detection in time series data
US9692674B1 (en) 2013-12-30 2017-06-27 Google Inc. Non-parametric change point detection
US11755342B2 (en) 2020-12-16 2023-09-12 Texas Instruments Incorporated Monitoring transitions of a circuit
EP4227694A1 (de) * 2022-02-11 2023-08-16 STMicroelectronics S.r.l. Systeme und verfahren zum testen eines asynchronen endlichen automaten

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4727548A (en) * 1986-09-08 1988-02-23 Harris Corporation On-line, limited mode, built-in fault detection/isolation system for state machines and combinational logic

Also Published As

Publication number Publication date
US20070204191A1 (en) 2007-08-30
EP1816484B1 (de) 2009-04-15
EP1816484A1 (de) 2007-08-08
US7620868B2 (en) 2009-11-17
FR2897173A1 (fr) 2007-08-10

Similar Documents

Publication Publication Date Title
DE112007000599A5 (de) Verfahren zur Kalibrierung einer Gierratenmessung
DE502007006736D1 (de) Verfahren zur automatischen Modifikation eines Programms
DE602007012785D1 (de) Verfahren zur Herstellung einer Photomaske
AT505197A3 (de) Verfahren zur aktivierung eines photosensibilisators
DE112006003449A5 (de) Verfahren zur Beschichtung eines Bauteils
DE602007007400D1 (de) Verfahren zur Niveauregulierung
DE602008001998D1 (de) Verfahren zur Beurteilung eines Halbleitersubstrats
DE112009001523A5 (de) Verfahren zur Erkennung ausgedehnter statischer Objekte
ATE538286T1 (de) Verfahren zur radialen erweiterung eines röhrenförmigen elements
DE502005011215D1 (de) Verfahren zur reparatur eines bauteils einer strömungsmaschine
DE602006018537D1 (de) Verfahren zum herstellen einer transportpalette
DE602007012868D1 (de) Verfahren zur erhaltung eines konstanten schleifprozesses
DE602008000073D1 (de) Verfahren zur Kalibrierung eines Gassensors
AT508824A3 (de) Verfahren zur eindeutigen kennzeichnung eines druckteils
DE602007000870D1 (de) Verfahren zur Fehlererkennung einer Zustandsmachine
DE602008003975D1 (de) Verfahren zum Herausfiltern von Berührungsvorrichtungssignalen
DE102009039937A8 (de) Verfahren zur Eingabe eines zweistelligen Wertes an einer Bedieneinrichtung
AT503190A3 (de) Verfahren zur herstellung einer halbleitervorrichtung
DE502006002555D1 (de) Verfahren zur Zustandserfassung eines Stromabnehmers
DE502007000380D1 (de) Verfahren zum Ablängen eines Schlauch-Teilstückes
DE102007031206B8 (de) Verfahren zur automatischen Inspektion einer Schweißnaht
DE112007002183A5 (de) Verfahren zur Bewertung der Funktionsfähigkeit eines Sensorsystems
DE502007003575D1 (de) Verfahren zur Niveauregelung eines pneumatisch gefederten Fahrzeuges
DE112007001447A5 (de) Verfahren zur Abstandsregelung
ATE544755T1 (de) Verfahren zur herstellung einer 5-alkoxy-4- hydroxymethylpyrazolverbindung

Legal Events

Date Code Title Description
8364 No opposition during term of opposition