DE602006018231D1 - Erregerspulenansteuerung eines Magnetsensors - Google Patents

Erregerspulenansteuerung eines Magnetsensors

Info

Publication number
DE602006018231D1
DE602006018231D1 DE602006018231T DE602006018231T DE602006018231D1 DE 602006018231 D1 DE602006018231 D1 DE 602006018231D1 DE 602006018231 T DE602006018231 T DE 602006018231T DE 602006018231 T DE602006018231 T DE 602006018231T DE 602006018231 D1 DE602006018231 D1 DE 602006018231D1
Authority
DE
Germany
Prior art keywords
magnetic sensor
coil control
exciter coil
exciter
control
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602006018231T
Other languages
English (en)
Inventor
Kazuyuki Kobayashi
Tatsuya Suzuki
Yasuhiro Kaneta
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sanyo Electric Co Ltd
Original Assignee
Sanyo Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sanyo Electric Co Ltd filed Critical Sanyo Electric Co Ltd
Publication of DE602006018231D1 publication Critical patent/DE602006018231D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/04—Measuring direction or magnitude of magnetic fields or magnetic flux using the flux-gate principle

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Magnetic Variables (AREA)
DE602006018231T 2005-09-12 2006-09-12 Erregerspulenansteuerung eines Magnetsensors Active DE602006018231D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005264284A JP4856915B2 (ja) 2005-09-12 2005-09-12 磁気センサの励磁コイル駆動回路

Publications (1)

Publication Number Publication Date
DE602006018231D1 true DE602006018231D1 (de) 2010-12-30

Family

ID=37591621

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602006018231T Active DE602006018231D1 (de) 2005-09-12 2006-09-12 Erregerspulenansteuerung eines Magnetsensors

Country Status (7)

Country Link
US (1) US7355398B2 (de)
EP (1) EP1762858B1 (de)
JP (1) JP4856915B2 (de)
KR (1) KR100804389B1 (de)
CN (1) CN1932542B (de)
DE (1) DE602006018231D1 (de)
TW (1) TWI300850B (de)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4856916B2 (ja) * 2005-09-12 2012-01-18 オンセミコンダクター・トレーディング・リミテッド 磁気センサの信号検出回路
JP4856915B2 (ja) * 2005-09-12 2012-01-18 オンセミコンダクター・トレーディング・リミテッド 磁気センサの励磁コイル駆動回路
JP2008292325A (ja) * 2007-05-24 2008-12-04 Sanyo Electric Co Ltd 信号検出回路
JP2010199822A (ja) * 2009-02-24 2010-09-09 Panasonic Corp 検波回路、物理量センサ装置
JP5518661B2 (ja) * 2010-09-30 2014-06-11 株式会社フジクラ 半導体集積回路、磁気検出装置、電子方位計
US9201122B2 (en) * 2012-02-16 2015-12-01 Allegro Microsystems, Llc Circuits and methods using adjustable feedback for self-calibrating or self-testing a magnetic field sensor with an adjustable time constant
JP5364814B2 (ja) 2012-05-15 2013-12-11 株式会社フジクラ 磁気素子制御装置、磁気素子制御方法及び磁気検出装置
JP5364816B1 (ja) 2012-06-08 2013-12-11 株式会社フジクラ 磁気素子制御装置、磁気素子制御方法及び磁気検出装置
JP5393844B2 (ja) 2012-06-08 2014-01-22 株式会社フジクラ 磁気素子制御装置、磁気素子制御方法及び磁気検出装置
JP6014544B2 (ja) * 2013-05-13 2016-10-25 株式会社フジクラ 磁界検出装置の検査用回路及びその検査方法
US9261571B2 (en) * 2013-08-15 2016-02-16 Texas Instruments Incorporated Fluxgate magnetic sensor readout apparatus
JP6280767B2 (ja) * 2014-02-21 2018-02-14 ルネサスエレクトロニクス株式会社 駆動回路
EP3292272B1 (de) * 2015-04-30 2019-12-04 Salunda Limited Erfassung des inhalts einer erdbohrung
CN110557016B (zh) * 2018-05-31 2021-07-30 西门子(深圳)磁共振有限公司 电源装置和磁共振成像系统
CN109612503B (zh) * 2018-12-03 2020-12-29 重庆文理学院 一种磁传感器的励磁线圈驱动装置
CN110376419B (zh) * 2019-08-13 2021-06-01 上海联影医疗科技股份有限公司 超导磁体的励磁检测电路及其控制方法
CN111610250B (zh) * 2020-07-06 2023-09-05 管网集团(新疆)联合管道有限责任公司 一种智能剩磁检测试验装置
CN113359202B (zh) * 2021-06-07 2023-07-25 中国地震局地球物理研究所 基于单片机的磁通门激励信号产生方法及磁通门激励电路

Family Cites Families (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63115231A (ja) * 1986-10-31 1988-05-19 Nok Corp 関数信号発生装置
JP2617615B2 (ja) * 1990-10-19 1997-06-04 日本鋼管株式会社 磁気測定方法およびその装置
JPH03272483A (ja) * 1990-02-28 1991-12-04 Nkk Corp 磁気検出装置
US5091697A (en) * 1989-07-31 1992-02-25 Ii Morrow, Inc. Low power, high accuracy magnetometer and magnetic field strength measurement method
WO1991018299A1 (fr) * 1990-05-19 1991-11-28 Nkk Corporation Dispositif detecteur de magnetisme
JPH0493781A (ja) * 1990-08-10 1992-03-26 Seiko Instr Inc 三次元積分磁束計
US5644851A (en) * 1991-12-20 1997-07-08 Blank; Rodney K. Compensation system for electronic compass
JPH06303143A (ja) * 1993-04-15 1994-10-28 Matsushita Electric Ind Co Ltd 積分型ｄａ変換器
JP3353533B2 (ja) 1995-04-19 2002-12-03 株式会社島津製作所 磁力計
JP3360550B2 (ja) 1996-10-17 2002-12-24 住友電気工業株式会社 磁気センサ駆動回路装置
JP3063654B2 (ja) 1996-12-06 2000-07-12 住友電気工業株式会社 磁気センサ用電圧増幅回路
JP4007464B2 (ja) * 1997-10-06 2007-11-14 Ｔｄｋ株式会社 磁気探知装置
US6268725B1 (en) * 1998-04-29 2001-07-31 Medtronic, Inc. Flux-gate magnetometer with drive signal for reducing effects of electromagnetic interference
US6222363B1 (en) * 1999-01-08 2001-04-24 Methode Electronics, Inc. Switch-mode flux-gate magnetometer
DE69925573T2 (de) * 1999-05-12 2006-04-27 Asulab S.A. Magnetischer F?hler hergestellt auf einem halbleitenden Substrat
US6218831B1 (en) * 1999-05-19 2001-04-17 Arthur D. Little, Inc. Low power fluxgate circuit with current balance
JP2000337808A (ja) 1999-05-26 2000-12-08 Matsushita Electric Works Ltd センサ
KR100465335B1 (ko) * 2002-09-18 2005-01-13 삼성전자주식회사 플럭스게이트를 구비한 감지장치
CN1580757A (zh) * 2003-08-05 2005-02-16 北京有色金属研究总院 高温超导带材非接触无损磁测量方法及装置
JP2005061969A (ja) 2003-08-11 2005-03-10 Asahi Kasei Electronics Co Ltd 方位角計測装置及び方位角計測方法
KR100555668B1 (ko) * 2003-11-11 2006-03-03 삼성전자주식회사 경사진 환경에서 방위각 측정이 가능한 플럭스게이트지자기 센서 및 그 측정 방법
JP2005147947A (ja) 2003-11-18 2005-06-09 Meisei Electric Co Ltd 磁気センサー用コア、磁気センサー及びフラックスゲート磁力計
JP4856915B2 (ja) * 2005-09-12 2012-01-18 オンセミコンダクター・トレーディング・リミテッド 磁気センサの励磁コイル駆動回路

Also Published As

Publication number Publication date
KR100804389B1 (ko) 2008-02-15
KR20070030130A (ko) 2007-03-15
JP2007078422A (ja) 2007-03-29
EP1762858A2 (de) 2007-03-14
TW200710421A (en) 2007-03-16
EP1762858A3 (de) 2009-05-06
JP4856915B2 (ja) 2012-01-18
US20070057669A1 (en) 2007-03-15
EP1762858B1 (de) 2010-11-17
CN1932542B (zh) 2012-05-23
US7355398B2 (en) 2008-04-08
CN1932542A (zh) 2007-03-21
TWI300850B (en) 2008-09-11

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