DE602006007551D1 - A/d-wandler mit austausch von auflösungen durch mehrere probe- und haltekanäle - Google Patents

A/d-wandler mit austausch von auflösungen durch mehrere probe- und haltekanäle

Info

Publication number
DE602006007551D1
DE602006007551D1 DE602006007551T DE602006007551T DE602006007551D1 DE 602006007551 D1 DE602006007551 D1 DE 602006007551D1 DE 602006007551 T DE602006007551 T DE 602006007551T DE 602006007551 T DE602006007551 T DE 602006007551T DE 602006007551 D1 DE602006007551 D1 DE 602006007551D1
Authority
DE
Germany
Prior art keywords
sar adc
hold
convert
sample
adc
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602006007551T
Other languages
English (en)
Inventor
Sumit K Mitra
Harry Hu
Pieter Schieke
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Microchip Technology Inc
Original Assignee
Microchip Technology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Microchip Technology Inc filed Critical Microchip Technology Inc
Publication of DE602006007551D1 publication Critical patent/DE602006007551D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/004—Reconfigurable analogue/digital or digital/analogue converters
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/004—Reconfigurable analogue/digital or digital/analogue converters
    • H03M1/007—Reconfigurable analogue/digital or digital/analogue converters among different resolutions
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/1205—Multiplexed conversion systems
    • H03M1/122—Shared using a single converter or a part thereof for multiple channels, e.g. a residue amplifier for multiple stages
    • H03M1/1225—Shared using a single converter or a part thereof for multiple channels, e.g. a residue amplifier for multiple stages using time-division multiplexing
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/34—Analogue value compared with reference values
    • H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
    • H03M1/46—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter
    • H03M1/466—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter using switched capacitors
    • H03M1/468—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter using switched capacitors in which the input S/H circuit is merged with the feedback DAC array
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/66—Digital/analogue converters
    • H03M1/68—Digital/analogue converters with conversions of different sensitivity, i.e. one conversion relating to the more significant digital bits and another conversion to the less significant bits
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/66—Digital/analogue converters
    • H03M1/74—Simultaneous conversion
    • H03M1/80—Simultaneous conversion using weighted impedances
    • H03M1/802—Simultaneous conversion using weighted impedances using capacitors, e.g. neuron-mos transistors, charge coupled devices
    • H03M1/804—Simultaneous conversion using weighted impedances using capacitors, e.g. neuron-mos transistors, charge coupled devices with charge redistribution

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Analogue/Digital Conversion (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DE602006007551T 2005-02-24 2006-02-21 A/d-wandler mit austausch von auflösungen durch mehrere probe- und haltekanäle Active DE602006007551D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US65593305P 2005-02-24 2005-02-24
PCT/US2006/006365 WO2006091711A1 (en) 2005-02-24 2006-02-21 Analog-to-digital converter with interchange of resolution against number of sample and hold channels

Publications (1)

Publication Number Publication Date
DE602006007551D1 true DE602006007551D1 (de) 2009-08-13

Family

ID=36231853

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602006007551T Active DE602006007551D1 (de) 2005-02-24 2006-02-21 A/d-wandler mit austausch von auflösungen durch mehrere probe- und haltekanäle

Country Status (6)

Country Link
US (1) US7265708B2 (de)
EP (1) EP1851859B1 (de)
CN (1) CN101128980B (de)
AT (1) ATE435526T1 (de)
DE (1) DE602006007551D1 (de)
WO (1) WO2006091711A1 (de)

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US7501965B2 (en) * 2007-02-06 2009-03-10 Texas Instruments Incorporated Correcting for errors that cause generated digital codes to deviate from expected values in an ADC
EP2053748B1 (de) * 2007-10-25 2010-12-08 Stichting IMEC Nederland Analog-Digital-Wandler und Verwendungsverfahren dafür
US7944386B2 (en) * 2008-10-21 2011-05-17 Analog Devices, Inc. Apparatus for and method of performing an analog to digital conversion
JP2010109660A (ja) * 2008-10-30 2010-05-13 Mitsumi Electric Co Ltd 逐次比較型ａｄ変換回路
US7956787B2 (en) * 2008-12-19 2011-06-07 Silicon Laboratories Inc. SAR analog-to-digital converter having differing bit modes of operation
KR101056380B1 (ko) * 2009-01-19 2011-08-12 한국과학기술원 Ｓａｒ 아날로그 디지털 변환기
DE102009005770B4 (de) * 2009-01-23 2012-01-26 Texas Instruments Deutschland Gmbh SAR-ADC und Verfahren mit INL-Kompensation
JP5287291B2 (ja) * 2009-01-26 2013-09-11 富士通セミコンダクター株式会社 逐次比較型ａ／ｄ変換器
US8072360B2 (en) * 2009-05-08 2011-12-06 Analog Devices, Inc. Simultaneous sampling analog to digital converter
US8232905B2 (en) * 2009-11-19 2012-07-31 Linear Technology Corporation Sequentially configured analog to digital converter
JP5482158B2 (ja) * 2009-12-04 2014-04-23 ヤマハ株式会社 逐次比較ａ／ｄ変換器
US8188902B2 (en) * 2010-06-11 2012-05-29 Texas Instruments Incorporated Ternary search SAR ADC
DE102010063405A1 (de) * 2010-12-17 2012-06-21 Siemens Aktiengesellschaft Analog-Digital-Umsetzer, Verfahren zum Betrieb eines Analog-Digital-Umsetzers und Verfahren zur Umsetzung eines analogen Eingangssignals in ein digitales Ausgangssignal
JP5868065B2 (ja) * 2011-08-05 2016-02-24 キヤノン株式会社 撮像装置
US8587465B2 (en) 2011-10-11 2013-11-19 International Business Machines Corporation Successive approximation analog to digital converter with comparator input toggling
CN103138762B (zh) * 2011-11-30 2016-04-27 禾瑞亚科技股份有限公司 多阶取样保持电路
US8416113B1 (en) 2012-04-06 2013-04-09 Cypress Semiconductor Corporation Integrated circuit device with programmable blocks and analog circuit control
CN103023504B (zh) * 2012-12-18 2015-09-16 中国科学院微电子研究所 一种逐次逼近型adc版图结构
US9270293B2 (en) * 2014-06-18 2016-02-23 Texas Instruments Incorporated System and method for multi channel sampling SAR ADC
WO2016029858A1 (en) * 2014-08-28 2016-03-03 Mediatek Inc. Hybrid analog-to-digital converter using digital slope analog-to-digital converter and related hybrid analog-to-digital conversion method thereof
US9369140B1 (en) 2015-03-02 2016-06-14 General Electric Company Analog to digital converter for digital ultrasound probe
US9386240B1 (en) * 2015-03-12 2016-07-05 Omnivision Technologies, Inc. Compensation for dual conversion gain high dynamic range sensor
CN104796147A (zh) * 2015-03-25 2015-07-22 佛山酷微微电子有限公司 一种逐次逼近模数转换器
CN105007069A (zh) * 2015-06-26 2015-10-28 深圳市芯海科技有限公司 一种用于电容检测的数模转换器和多路选择器
CN107181490A (zh) * 2016-12-13 2017-09-19 成都华微电子科技有限公司 模数转换电路
US9882576B1 (en) * 2017-01-04 2018-01-30 Arm Limited Analog to digital converter using correlated electron material devices
US9906232B1 (en) 2017-03-10 2018-02-27 Xilinx, Inc. Resolution programmable SAR ADC
US11372032B2 (en) 2017-09-27 2022-06-28 Texas Instruments Incorporated Voltage monitor using a capacitive digital-to-analog converter
WO2019116444A1 (ja) * 2017-12-12 2019-06-20 オリンパス株式会社 Ａｄ変換回路、撮像装置、および内視鏡システム
US10763875B2 (en) * 2019-01-11 2020-09-01 Realtek Semiconductor Corporation Switched capacitor circuit and analog-to-digital converter device
CN111865318B (zh) * 2019-04-30 2024-06-21 瑞昱半导体股份有限公司 模拟数字转换装置及其电容调整方法
US11121720B2 (en) * 2019-08-07 2021-09-14 Mediatek Inc. Analog-to-digital converter having quantization error duplicate mechanism
GB2605466A (en) * 2021-06-21 2022-10-05 Nordic Semiconductor Asa Error-feedback SAR-ADC
CN116380135B (zh) * 2023-06-06 2023-08-11 成都市晶蓉微电子有限公司 一种电荷转移平衡式电容到电压转换电路

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US5675340A (en) * 1995-04-07 1997-10-07 Iowa State University Research Foundation, Inc. Charge-redistribution analog-to-digital converter with reduced comparator-hysteresis effects
KR100190766B1 (ko) * 1996-06-24 1999-06-01 김영환 고조파 왜곡을 감소시킨 스위치드 캐패시터 디지탈-아날로그변환기
US6144331A (en) * 1998-04-08 2000-11-07 Texas Instruments Incorporated Analog to digital converter with a differential output resistor-digital-to-analog-converter for improved noise reduction
US6130635A (en) * 1998-08-03 2000-10-10 Motorola Inc. Method of converting an analog signal in an A/D converter utilizing RDAC precharging
US6297757B1 (en) * 1999-02-11 2001-10-02 Motorola, Inc. Method and circuit for testing an analog-to-digital converter module on a data processing system having an intermodule bus
US6486806B1 (en) * 1999-09-09 2002-11-26 Cirrus Logic, Inc. Systems and methods for adaptive auto-calibration of Radix<2 A/D SAR converters with internally generated stimuli
US6297759B1 (en) * 2000-05-25 2001-10-02 Lewyn Consulting, Inc. Digital-to-analog converter with high-speed output
US20030063026A1 (en) * 2001-09-28 2003-04-03 Stmicroelectronics Pvt. Ltd. Switched-capacitor based charge redistribution successive approximation analog to digital converter (ADC)

Also Published As

Publication number Publication date
US7265708B2 (en) 2007-09-04
CN101128980A (zh) 2008-02-20
WO2006091711A1 (en) 2006-08-31
CN101128980B (zh) 2016-03-30
ATE435526T1 (de) 2009-07-15
EP1851859B1 (de) 2009-07-01
US20060187106A1 (en) 2006-08-24
EP1851859A1 (de) 2007-11-07

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