DE602006007214D1 - Digitale Datenabtastung unter Anwendung mehrerer zeitverschobener Auslösersignale - Google Patents

Digitale Datenabtastung unter Anwendung mehrerer zeitverschobener Auslösersignale

Info

Publication number
DE602006007214D1
DE602006007214D1 DE200660007214 DE602006007214T DE602006007214D1 DE 602006007214 D1 DE602006007214 D1 DE 602006007214D1 DE 200660007214 DE200660007214 DE 200660007214 DE 602006007214 T DE602006007214 T DE 602006007214T DE 602006007214 D1 DE602006007214 D1 DE 602006007214D1
Authority
DE
Germany
Prior art keywords
digital data
multiple time
data sampling
trigger signals
shifted trigger
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE200660007214
Other languages
English (en)
Inventor
Joachim Moll
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of DE602006007214D1 publication Critical patent/DE602006007214D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31924—Voltage or current aspects, e.g. driver, receiver
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31708—Analysis of signal quality

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Dc Digital Transmission (AREA)
DE200660007214 2006-04-21 2006-04-21 Digitale Datenabtastung unter Anwendung mehrerer zeitverschobener Auslösersignale Active DE602006007214D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP06112941A EP1847843B1 (de) 2006-04-21 2006-04-21 Digitale Datenabtastung unter Anwendung mehrerer zeitverschobener Auslösersignale

Publications (1)

Publication Number Publication Date
DE602006007214D1 true DE602006007214D1 (de) 2009-07-23

Family

ID=37189411

Family Applications (1)

Application Number Title Priority Date Filing Date
DE200660007214 Active DE602006007214D1 (de) 2006-04-21 2006-04-21 Digitale Datenabtastung unter Anwendung mehrerer zeitverschobener Auslösersignale

Country Status (2)

Country Link
EP (1) EP1847843B1 (de)
DE (1) DE602006007214D1 (de)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2060924B1 (de) * 2006-08-24 2013-10-23 NEC Corporation Ausfallvorhersageschaltung und verfahren und integrierte halbleiterschaltung
US10161967B2 (en) 2016-01-09 2018-12-25 Taiwan Semiconductor Manufacturing Co., Ltd. On-chip oscilloscope
EP3438692B1 (de) * 2017-08-03 2024-04-24 Melexis Technologies NV Abtast- und halteschaltung für ein lidar-system
CN116048426B (zh) * 2023-03-27 2023-06-27 南京芯驰半导体科技有限公司 信号处理方法、装置、电子设备及存储介质

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3524993A (en) * 1967-02-17 1970-08-18 Tektronix Inc Triggering method and apparatus wherein the triggering period is determined
US4704036A (en) * 1986-06-23 1987-11-03 Tektronix, Inc. Pulse measurement circuit
US5235270A (en) * 1990-03-19 1993-08-10 Yokogawa Electric Corporation Waveform measuring device
US20040236527A1 (en) * 2003-05-21 2004-11-25 Felps Jimmie Doyle Method and apparatus for synchronous viewing of asynchronous waveforms
US7191079B2 (en) * 2004-03-23 2007-03-13 Tektronix, Inc. Oscilloscope having advanced triggering capability

Also Published As

Publication number Publication date
EP1847843B1 (de) 2009-06-10
EP1847843A1 (de) 2007-10-24

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition