GB2440253B - Equivalent time sampling system - Google Patents

Equivalent time sampling system

Info

Publication number
GB2440253B
GB2440253B GB0713720A GB0713720A GB2440253B GB 2440253 B GB2440253 B GB 2440253B GB 0713720 A GB0713720 A GB 0713720A GB 0713720 A GB0713720 A GB 0713720A GB 2440253 B GB2440253 B GB 2440253B
Authority
GB
United Kingdom
Prior art keywords
sampling system
time sampling
equivalent time
equivalent
time
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
GB0713720A
Other versions
GB2440253A (en
GB0713720D0 (en
Inventor
Jeffrey Bottman
William K Gessaman
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fluke Corp
Original Assignee
Fluke Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US11/462,996 external-priority patent/US7403274B2/en
Application filed by Fluke Corp filed Critical Fluke Corp
Publication of GB0713720D0 publication Critical patent/GB0713720D0/en
Publication of GB2440253A publication Critical patent/GB2440253A/en
Application granted granted Critical
Publication of GB2440253B publication Critical patent/GB2440253B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/31Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers
    • G01M11/3109Reflectometers detecting the back-scattered light in the time-domain, e.g. OTDR
    • G01M11/3145Details of the optoelectronics or data analysis
GB0713720A 2006-07-16 2007-07-16 Equivalent time sampling system Active GB2440253B (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US80749806P 2006-07-16 2006-07-16
US46278306A 2006-08-07 2006-08-07
US11/462,996 US7403274B2 (en) 2006-07-16 2006-08-07 Equivalent time sampling system

Publications (3)

Publication Number Publication Date
GB0713720D0 GB0713720D0 (en) 2007-08-22
GB2440253A GB2440253A (en) 2008-01-23
GB2440253B true GB2440253B (en) 2011-07-13

Family

ID=38461602

Family Applications (2)

Application Number Title Priority Date Filing Date
GBGB0713585.8A Ceased GB0713585D0 (en) 2006-07-16 2007-07-12 Equivalent
GB0713720A Active GB2440253B (en) 2006-07-16 2007-07-16 Equivalent time sampling system

Family Applications Before (1)

Application Number Title Priority Date Filing Date
GBGB0713585.8A Ceased GB0713585D0 (en) 2006-07-16 2007-07-12 Equivalent

Country Status (2)

Country Link
DE (1) DE102007032791B4 (en)
GB (2) GB0713585D0 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2219018B1 (en) * 2009-02-17 2016-02-17 Alcatel Lucent Method for monitoring an optical data line, and optical transmission module therefor
CN103454903B (en) * 2013-09-23 2016-05-04 哈尔滨工程大学 A kind of time interval measurement calibrating installation and calibration steps thereof based on optics times journey
JP7257105B2 (en) * 2018-03-02 2023-04-13 株式会社東京精密 Absolute distance measuring device and method

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2163315A (en) * 1984-08-18 1986-02-19 Iwatsu Electric Co Ltd Time domain reflectometer
JP2000221248A (en) * 1998-11-24 2000-08-11 Advantest Corp Semiconductor testing device
US20030120443A1 (en) * 2001-12-21 2003-06-26 Yokogawa Electric Corporation Waveform measuring instrument using equivalent time sampling
US6594004B1 (en) * 1999-09-10 2003-07-15 Anritsu Corporation Compact optical time domain reflectometer having enhanced accuracy
US7173443B1 (en) * 1998-11-24 2007-02-06 Advantest Corp. Semiconductor test system
US20070066265A1 (en) * 2005-09-22 2007-03-22 May Michael R Method to adjustably convert a first data signal having a first time domain to a second data signal having a second time domain

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2163315A (en) * 1984-08-18 1986-02-19 Iwatsu Electric Co Ltd Time domain reflectometer
JP2000221248A (en) * 1998-11-24 2000-08-11 Advantest Corp Semiconductor testing device
US7173443B1 (en) * 1998-11-24 2007-02-06 Advantest Corp. Semiconductor test system
US6594004B1 (en) * 1999-09-10 2003-07-15 Anritsu Corporation Compact optical time domain reflectometer having enhanced accuracy
US20030120443A1 (en) * 2001-12-21 2003-06-26 Yokogawa Electric Corporation Waveform measuring instrument using equivalent time sampling
US20070066265A1 (en) * 2005-09-22 2007-03-22 May Michael R Method to adjustably convert a first data signal having a first time domain to a second data signal having a second time domain

Also Published As

Publication number Publication date
GB2440253A (en) 2008-01-23
GB0713585D0 (en) 2007-08-22
DE102007032791B4 (en) 2020-10-01
GB0713720D0 (en) 2007-08-22
DE102007032791A1 (en) 2008-04-24

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