DE602006004529D1 - Verfahren und Vorrichtung zur Kontrolle von Objekten - Google Patents

Verfahren und Vorrichtung zur Kontrolle von Objekten

Info

Publication number
DE602006004529D1
DE602006004529D1 DE602006004529T DE602006004529T DE602006004529D1 DE 602006004529 D1 DE602006004529 D1 DE 602006004529D1 DE 602006004529 T DE602006004529 T DE 602006004529T DE 602006004529 T DE602006004529 T DE 602006004529T DE 602006004529 D1 DE602006004529 D1 DE 602006004529D1
Authority
DE
Germany
Prior art keywords
controlling objects
objects
controlling
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602006004529T
Other languages
German (de)
English (en)
Inventor
Kevin George Harding
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
General Electric Co
Original Assignee
General Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by General Electric Co filed Critical General Electric Co
Publication of DE602006004529D1 publication Critical patent/DE602006004529D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2509—Color coding

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
DE602006004529T 2005-10-24 2006-10-23 Verfahren und Vorrichtung zur Kontrolle von Objekten Active DE602006004529D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/256,886 US7285767B2 (en) 2005-10-24 2005-10-24 Methods and apparatus for inspecting an object

Publications (1)

Publication Number Publication Date
DE602006004529D1 true DE602006004529D1 (de) 2009-02-12

Family

ID=37576558

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602006004529T Active DE602006004529D1 (de) 2005-10-24 2006-10-23 Verfahren und Vorrichtung zur Kontrolle von Objekten

Country Status (5)

Country Link
US (1) US7285767B2 (enExample)
EP (1) EP1777489B1 (enExample)
JP (1) JP2007121291A (enExample)
CN (1) CN1963381B (enExample)
DE (1) DE602006004529D1 (enExample)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070193012A1 (en) * 2006-02-22 2007-08-23 Robert Bergman Metal forming process
JP2011002305A (ja) * 2009-06-17 2011-01-06 Topcon Corp 回路パターンの欠陥検出装置、回路パターンの欠陥検出方法およびプログラム
CN102645159A (zh) * 2011-02-22 2012-08-22 贺明志 一种影像测量装置
CN102278943B (zh) * 2011-05-06 2012-10-10 华东师范大学 非接触式数字微镜器件微镜片一致性检测仪
EP2631730B1 (en) * 2012-02-24 2014-09-24 Samsung Electronics Co., Ltd Sensor assembly and robot cleaner having the same
CN103777206B (zh) * 2014-01-26 2016-04-06 上海交通大学 一种基于偏振关联成像的单像素成像系统
JP6065875B2 (ja) 2014-06-02 2017-01-25 横河電機株式会社 偏光検査装置
JP6363903B2 (ja) 2014-07-31 2018-07-25 株式会社キーエンス 光学的情報読取装置
CN104345318A (zh) * 2014-11-18 2015-02-11 上海交通大学 基于计算关联成像的可绕过墙角的成像系统及成像方法
CN105066906B (zh) * 2015-07-24 2018-06-12 南京理工大学 一种快速高动态范围三维测量方法
TWI571649B (zh) * 2015-12-03 2017-02-21 財團法人金屬工業研究發展中心 A scanning device and method for establishing an outline image of an object
CN105572138A (zh) * 2016-02-24 2016-05-11 唐山英莱科技有限公司 基于偏振态检测的高反光对接焊缝检测方法及检测装置
CN105866129A (zh) * 2016-05-16 2016-08-17 天津工业大学 一种基于数字投影的产品表面质量在线检测方法
CN105841618B (zh) * 2016-06-08 2019-05-10 浙江汉振智能技术有限公司 二维三维复合式测量仪及其数据融合标定方法
CN106813574A (zh) * 2016-11-02 2017-06-09 北京信息科技大学 一种基于偏振光的关节臂测头光学系统
US11204508B2 (en) * 2017-01-19 2021-12-21 Lockheed Martin Corporation Multiple band multiple polarizer optical device
CN110044927B (zh) * 2019-04-23 2020-02-21 华中科技大学 一种空间编码光场对曲面玻璃表面缺陷的检测方法
CN110275098B (zh) * 2019-06-28 2021-07-09 杭州赫太克科技有限公司 紫外成像仪
EP4081846A1 (en) * 2019-12-27 2022-11-02 Sony Group Corporation Polarization imaging system and polarization imaging method
KR102558937B1 (ko) * 2020-01-27 2023-07-21 코그넥스코오포레이션 다수의 유형들의 광을 이용한 비전 검사를 위한 시스템들 및 방법들

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US4864123A (en) * 1987-05-08 1989-09-05 Nikon Corporation Apparatus for detecting the level of an object surface
DE4130237A1 (de) 1991-09-11 1993-03-18 Zeiss Carl Fa Verfahren und vorrichtung zur dreidimensionalen optischen vermessung von objektoberflaechen
JPH05142141A (ja) * 1991-11-19 1993-06-08 Katsuya Masao 薄膜測定装置
JPH085569A (ja) * 1994-06-15 1996-01-12 Matsushita Electron Corp パーティクル測定装置およびパーティクル検査方法
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US6064759A (en) 1996-11-08 2000-05-16 Buckley; B. Shawn Computer aided inspection machine
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US6937348B2 (en) 2000-01-28 2005-08-30 Genex Technologies, Inc. Method and apparatus for generating structural pattern illumination
US6639685B1 (en) 2000-02-25 2003-10-28 General Motors Corporation Image processing method using phase-shifted fringe patterns and curve fitting
JP3858571B2 (ja) * 2000-07-27 2006-12-13 株式会社日立製作所 パターン欠陥検査方法及びその装置
US6831742B1 (en) * 2000-10-23 2004-12-14 Applied Materials, Inc Monitoring substrate processing using reflected radiation
JP4358982B2 (ja) * 2000-10-25 2009-11-04 株式会社堀場製作所 分光エリプソメータ
JP3519698B2 (ja) * 2001-04-20 2004-04-19 照明 與語 ３次元形状測定方法
JP2003035613A (ja) * 2001-07-23 2003-02-07 Omron Corp 光透過性物質の残留応力検査装置
US6678057B2 (en) 2001-12-19 2004-01-13 General Electric Company Method and device for reduction in noise in images from shiny parts
JP3878023B2 (ja) * 2002-02-01 2007-02-07 シーケーディ株式会社 三次元計測装置
JP2004061371A (ja) * 2002-07-30 2004-02-26 Nikon Corp 欠陥検査装置および欠陥検査方法
US20040026622A1 (en) 2002-08-06 2004-02-12 Dimarzio Don System and method for imaging of coated substrates

Also Published As

Publication number Publication date
US20070090280A1 (en) 2007-04-26
JP2007121291A (ja) 2007-05-17
CN1963381A (zh) 2007-05-16
US7285767B2 (en) 2007-10-23
EP1777489B1 (en) 2008-12-31
EP1777489A1 (en) 2007-04-25
CN1963381B (zh) 2012-07-04

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Legal Events

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