DE602005016685D1 - Defektreparatureinrichtung und defektreparaturverfahren - Google Patents

Defektreparatureinrichtung und defektreparaturverfahren

Info

Publication number
DE602005016685D1
DE602005016685D1 DE602005016685T DE602005016685T DE602005016685D1 DE 602005016685 D1 DE602005016685 D1 DE 602005016685D1 DE 602005016685 T DE602005016685 T DE 602005016685T DE 602005016685 T DE602005016685 T DE 602005016685T DE 602005016685 D1 DE602005016685 D1 DE 602005016685D1
Authority
DE
Germany
Prior art keywords
defect
repair
layer film
energy
defektrepairing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602005016685T
Other languages
English (en)
Inventor
Yoshiaki Ikuta
Toshiyuki Uno
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AGC Inc
Original Assignee
Asahi Glass Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Asahi Glass Co Ltd filed Critical Asahi Glass Co Ltd
Publication of DE602005016685D1 publication Critical patent/DE602005016685D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y40/00—Manufacture or treatment of nanostructures
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
    • G03F1/22—Masks or mask blanks for imaging by radiation of 100nm or shorter wavelength, e.g. X-ray masks, extreme ultraviolet [EUV] masks; Preparation thereof
    • G03F1/24—Reflection masks; Preparation thereof
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
    • G03F1/68—Preparation processes not covered by groups G03F1/20 - G03F1/50
    • G03F1/72—Repair or correction of mask defects
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
    • G03F1/68—Preparation processes not covered by groups G03F1/20 - G03F1/50
    • G03F1/82—Auxiliary processes, e.g. cleaning or inspecting
    • G03F1/84—Inspecting
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
    • G03F7/70591—Testing optical components
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
    • G03F7/7095—Materials, e.g. materials for housing, stage or other support having particular properties, e.g. weight, strength, conductivity, thermal expansion coefficient
    • G03F7/70958—Optical materials or coatings, e.g. with particular transmittance, reflectance or anti-reflection properties
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • G21K1/062—Devices having a multilayer structure
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00—Arrangements for handling radiation or particles
    • G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/067—Construction details
DE602005016685T 2004-07-08 2005-07-07 Defektreparatureinrichtung und defektreparaturverfahren Active DE602005016685D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/885,641 US7230695B2 (en) 2004-07-08 2004-07-08 Defect repair device and defect repair method
PCT/JP2005/012964 WO2006006635A2 (en) 2004-07-08 2005-07-07 Defect repair device and defect repair method

Publications (1)

Publication Number Publication Date
DE602005016685D1 true DE602005016685D1 (de) 2009-10-29

Family

ID=35540983

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602005016685T Active DE602005016685D1 (de) 2004-07-08 2005-07-07 Defektreparatureinrichtung und defektreparaturverfahren

Country Status (7)

Country Link
US (1) US7230695B2 (de)
EP (1) EP1771773B1 (de)
JP (1) JP4285543B2 (de)
AT (1) ATE443281T1 (de)
DE (1) DE602005016685D1 (de)
TW (1) TW200615700A (de)
WO (1) WO2006006635A2 (de)

Families Citing this family (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7230695B2 (en) 2004-07-08 2007-06-12 Asahi Glass Company, Ltd. Defect repair device and defect repair method
JP2006039059A (ja) * 2004-07-23 2006-02-09 Toshiba Corp フォトマスクデータの作成方法およびフォトマスクの製造方法
WO2007065769A1 (de) * 2005-12-09 2007-06-14 Carl Zeiss Smt Ag Verfahren zur bearbeitung eines optischen elementes sowie optisches element
US7678511B2 (en) * 2006-01-12 2010-03-16 Asahi Glass Company, Limited Reflective-type mask blank for EUV lithography
JP4978626B2 (ja) * 2006-12-15 2012-07-18 旭硝子株式会社 Ｅｕｖリソグラフィ用反射型マスクブランク、および該マスクブランク用の機能膜付基板
DE102007028172B3 (de) * 2007-06-20 2008-12-11 Advanced Mask Technology Center Gmbh & Co. Kg EUV-Maske und Verfahren zur Reparatur einer EUV-Maske
JP2009007609A (ja) * 2007-06-27 2009-01-15 Meidensha Corp 金属部材の補修方法
US7993464B2 (en) 2007-08-09 2011-08-09 Rave, Llc Apparatus and method for indirect surface cleaning
US8182609B1 (en) * 2007-08-09 2012-05-22 Rave, Llc Apparatus and method for direct surface cleaning
WO2009020662A1 (en) 2007-08-09 2009-02-12 Rave, Llc Apparatus and method for modifying optical material properties
US11311917B2 (en) 2007-08-09 2022-04-26 Bruker Nano, Inc. Apparatus and method for contamination identification
DE102008062928A1 (de) * 2008-12-23 2010-07-01 Nawotec Gmbh Verfahren zum Ermitteln einer Reparaturform eines Defekts an oder in der Nähe einer Kante eines Substrats einer Photomaske
US8175373B2 (en) * 2009-02-16 2012-05-08 Kla-Tencor Corporation Use of design information and defect image information in defect classification
DE102009029471A1 (de) * 2009-09-15 2011-03-31 Carl Zeiss Smt Gmbh Spiegel zur Verwendung in einer Mikrolithographie-Projektionsbelichtungsanlage
WO2011108470A1 (ja) 2010-03-02 2011-09-09 旭硝子株式会社 Ｅｕｖリソグラフィ用反射型マスクブランクおよびその製造方法
JP5471835B2 (ja) * 2010-05-26 2014-04-16 大日本印刷株式会社 反射型マスクの位相欠陥補正方法および反射型マスクの製造方法
DE102010025033B4 (de) * 2010-06-23 2021-02-11 Carl Zeiss Smt Gmbh Verfahren zur Defekterkennung und Reparatur von EUV-Masken
DE102011083774B4 (de) 2010-10-04 2019-06-13 Carl Zeiss Sms Ltd. Verfahren zum Bestimmen von Laser korrigierenden Tool-Parametern
US8994918B2 (en) * 2010-10-21 2015-03-31 Nikon Corporation Apparatus and methods for measuring thermally induced reticle distortion
JP5340321B2 (ja) 2011-01-01 2013-11-13 キヤノン株式会社 ミラーおよびその製造方法、露光装置、ならびに、デバイス製造方法
US9249501B2 (en) 2011-05-18 2016-02-02 Carl Zeiss Smt Gmbh Surface correction on coated mirrors
DE102011076014A1 (de) * 2011-05-18 2012-08-09 Carl Zeiss Smt Gmbh Oberflächenkorrektur an beschichteten Spiegeln
DE102011079382B4 (de) 2011-07-19 2020-11-12 Carl Zeiss Smt Gmbh Verfahren und Vorrichtung zum Analysieren und zum Beseitigen eines Defekts einer EUV Maske
US8748063B2 (en) 2012-08-01 2014-06-10 International Business Machines Corporation Extreme ultraviolet (EUV) multilayer defect compensation and EUV masks
US8753788B1 (en) 2013-01-02 2014-06-17 Taiwan Semiconductor Manufacturing Company, Ltd. Apparatus of repairing a mask and a method for the same
FR3007678B1 (fr) * 2013-06-28 2015-07-31 Essilor Int Procede de fabrication d'une lentille ophtalmique comportant une etape de marquage laser pour realiser des gravures permanentes sur une surface de ladite lentille ophtalmique
US9134602B2 (en) * 2013-07-29 2015-09-15 Taiwan Semiconductor Manufacturing Co., Ltd. Method of manufacturing an extreme ultraviolet (EUV) mask and the mask manufactured therefrom
JP6685777B2 (ja) * 2016-03-09 2020-04-22 三菱重工業株式会社 部材の検査装置及び部材の補修方法
CN109305586A (zh) * 2018-11-16 2019-02-05 河北金力新能源科技股份有限公司 一种水性涂膜漏涂缺陷修复装置
TW202138867A (zh) 2019-12-06 2021-10-16 美商伊路米納有限公司 提供參數估計的裝置和方法
TW202138866A (zh) * 2019-12-06 2021-10-16 美商伊路米納有限公司 從影像中估計值的裝置和方法
DE102021210869A1 (de) 2021-09-29 2022-09-15 Carl Zeiss Smt Gmbh Verfahren zur Überprüfung von Masken für die Projektionslithographie

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3193678B2 (ja) * 1997-10-20 2001-07-30 株式会社アドバンテスト 半導体ウエハリペア装置及び方法
JP2000012428A (ja) * 1998-06-19 2000-01-14 Canon Inc Ｘ線マスク構造体、該ｘ線マスク構造体を用いたｘ線露光方法、前記ｘ線マスク構造体を用いたｘ線露光装置、前記ｘ線マスク構造体を用いた半導体デバイスの製造方法、および該製造方法によって製造された半導体デバイス
JP4653867B2 (ja) * 1999-06-30 2011-03-16 エーユー オプトロニクス コーポレイション 電子部品の欠陥修復方法
JP3770542B2 (ja) * 1999-07-22 2006-04-26 コーニング インコーポレイテッド 遠紫外軟ｘ線投影リソグラフィー法およびマスク装置
JP4442962B2 (ja) * 1999-10-19 2010-03-31 株式会社ルネサステクノロジ フォトマスクの製造方法
US6322935B1 (en) * 2000-02-28 2001-11-27 Metron Technology Method and apparatus for repairing an alternating phase shift mask
JP3619118B2 (ja) * 2000-05-01 2005-02-09 キヤノン株式会社 露光用反射型マスクとその製造方法、並びに露光装置とデバイス製造方法
US6821682B1 (en) 2000-09-26 2004-11-23 The Euv Llc Repair of localized defects in multilayer-coated reticle blanks for extreme ultraviolet lithography
US6884999B1 (en) * 2000-10-24 2005-04-26 Advanced Micro Devices, Inc. Use of scanning probe microscope for defect detection and repair
US6737201B2 (en) * 2000-11-22 2004-05-18 Hoya Corporation Substrate with multilayer film, reflection type mask blank for exposure, reflection type mask for exposure and production method thereof as well as production method of semiconductor device
US6844272B2 (en) * 2002-03-01 2005-01-18 Euv Limited Liability Corporation Correction of localized shape errors on optical surfaces by altering the localized density of surface or near-surface layers
US7084970B2 (en) * 2004-05-14 2006-08-01 Photon Dynamics, Inc. Inspection of TFT LCD panels using on-demand automated optical inspection sub-system
US7230695B2 (en) 2004-07-08 2007-06-12 Asahi Glass Company, Ltd. Defect repair device and defect repair method

Also Published As

Publication number Publication date
US20060007433A1 (en) 2006-01-12
EP1771773B1 (de) 2009-09-16
ATE443281T1 (de) 2009-10-15
JP4285543B2 (ja) 2009-06-24
US7230695B2 (en) 2007-06-12
EP1771773A2 (de) 2007-04-11
WO2006006635A2 (en) 2006-01-19
JP2008506138A (ja) 2008-02-28
WO2006006635A3 (en) 2006-05-26
TW200615700A (en) 2006-05-16

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Legal Events

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8364 No opposition during term of opposition