DE602005000292D1 - Mobiles Mikroskop zum Echtzeit-Prüfen des Schweissens mit einer Laserschweissanlage - Google Patents

Mobiles Mikroskop zum Echtzeit-Prüfen des Schweissens mit einer Laserschweissanlage

Info

Publication number
DE602005000292D1
DE602005000292D1 DE200560000292 DE602005000292T DE602005000292D1 DE 602005000292 D1 DE602005000292 D1 DE 602005000292D1 DE 200560000292 DE200560000292 DE 200560000292 DE 602005000292 T DE602005000292 T DE 602005000292T DE 602005000292 D1 DE602005000292 D1 DE 602005000292D1
Authority
DE
Germany
Prior art keywords
real
welding
time testing
mobile microscope
laser welding
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE200560000292
Other languages
English (en)
Other versions
DE602005000292T2 (de
Inventor
Chung Kweon Yong
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Publication of DE602005000292D1 publication Critical patent/DE602005000292D1/de
Application granted granted Critical
Publication of DE602005000292T2 publication Critical patent/DE602005000292T2/de
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/0016Technical microscopes, e.g. for inspection or measuring in industrial production processes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Laser Beam Processing (AREA)
  • Microscoopes, Condenser (AREA)
DE602005000292T 2004-04-22 2005-04-21 Mobiles Mikroskop zum Echtzeit-Prüfen des Schweissens mit einer Laserschweissanlage Expired - Fee Related DE602005000292T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR2004027749 2004-04-22
KR20040027749A KR100566087B1 (ko) 2004-04-22 2004-04-22 레이저 용접용 현미경

Publications (2)

Publication Number Publication Date
DE602005000292D1 true DE602005000292D1 (de) 2007-01-11
DE602005000292T2 DE602005000292T2 (de) 2007-06-28

Family

ID=34935572

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602005000292T Expired - Fee Related DE602005000292T2 (de) 2004-04-22 2005-04-21 Mobiles Mikroskop zum Echtzeit-Prüfen des Schweissens mit einer Laserschweissanlage

Country Status (5)

Country Link
EP (2) EP1589363B1 (de)
KR (1) KR100566087B1 (de)
CN (1) CN100335937C (de)
DE (1) DE602005000292T2 (de)
TW (1) TWI283302B (de)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1983766B1 (de) 2006-02-11 2012-08-15 Huawei Technologies Co., Ltd. Verfahren zur realisierung eines wac-dienstes, system und calling-steuerung und anwendungsserver dafür
KR101407627B1 (ko) * 2012-06-20 2014-06-30 한국기계연구원 금속패턴 형성 장치 및 이를 이용한 금속패턴 형성 방법

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1147455A (en) * 1965-08-04 1969-04-02 Watson W & Sons Ltd Improvements in or relating to microscopes
US3818125A (en) * 1971-10-26 1974-06-18 J Butterfield Stereo television microscope
US5299053A (en) * 1990-10-26 1994-03-29 American Cyanamid Company Variable shutter illumination system for microscope
US5245409A (en) * 1991-11-27 1993-09-14 Arvin Industries, Inc. Tube seam weld inspection device
JP2885040B2 (ja) * 1993-12-27 1999-04-19 日産自動車株式会社 レーザ溶接の溶接品質管理方法
JP3854665B2 (ja) * 1996-08-30 2006-12-06 オリンパス株式会社 顕微鏡
JP4282120B2 (ja) * 1998-01-06 2009-06-17 オリンパス株式会社 手術用顕微鏡
CN1474210A (zh) * 2002-08-09 2004-02-11 中国科学院西安光学精密机械研究所 激光微作用数字显微装置

Also Published As

Publication number Publication date
DE602005000292T2 (de) 2007-06-28
CN1690760A (zh) 2005-11-02
EP1757970A2 (de) 2007-02-28
KR100566087B1 (ko) 2006-03-30
KR20050102398A (ko) 2005-10-26
EP1589363A1 (de) 2005-10-26
TW200538756A (en) 2005-12-01
EP1757970A3 (de) 2007-03-14
TWI283302B (en) 2007-07-01
CN100335937C (zh) 2007-09-05
EP1589363B1 (de) 2006-11-29

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee