DE602004025073D1 - Messgerät basierend auf der Oberflächenplasmonenresonanz - Google Patents

Messgerät basierend auf der Oberflächenplasmonenresonanz

Info

Publication number
DE602004025073D1
DE602004025073D1 DE602004025073T DE602004025073T DE602004025073D1 DE 602004025073 D1 DE602004025073 D1 DE 602004025073D1 DE 602004025073 T DE602004025073 T DE 602004025073T DE 602004025073 T DE602004025073 T DE 602004025073T DE 602004025073 D1 DE602004025073 D1 DE 602004025073D1
Authority
DE
Germany
Prior art keywords
surface plasmon
plasmon resonance
meter based
meter
resonance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602004025073T
Other languages
English (en)
Inventor
Yoshiyuki Kunuki
Hitoshi Shimizu
Toshihito Kimura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujifilm Corp
Original Assignee
Fujifilm Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujifilm Corp filed Critical Fujifilm Corp
Publication of DE602004025073D1 publication Critical patent/DE602004025073D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection
    • G01N21/553—Attenuated total reflection and using surface plasmons

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Optical Measuring Cells (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
DE602004025073T 2003-09-02 2004-08-30 Messgerät basierend auf der Oberflächenplasmonenresonanz Active DE602004025073D1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2003309968 2003-09-02
JP2003309969 2003-09-02
JP2003310058 2003-09-02

Publications (1)

Publication Number Publication Date
DE602004025073D1 true DE602004025073D1 (de) 2010-03-04

Family

ID=34139389

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602004025073T Active DE602004025073D1 (de) 2003-09-02 2004-08-30 Messgerät basierend auf der Oberflächenplasmonenresonanz

Country Status (3)

Country Link
US (1) US7450236B2 (de)
EP (1) EP1512961B1 (de)
DE (1) DE602004025073D1 (de)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005077317A (ja) * 2003-09-02 2005-03-24 Fuji Photo Film Co Ltd 測定装置
JP2006105911A (ja) * 2004-10-08 2006-04-20 Fuji Photo Film Co Ltd １次元測定ユニット
JP4004505B2 (ja) 2005-01-11 2007-11-07 富士フイルム株式会社 流路部材及びセンサユニット
JP4607684B2 (ja) * 2005-06-29 2011-01-05 富士フイルム株式会社 流路ブロック、センサユニット、及び全反射減衰を利用した測定装置
WO2009019619A1 (en) * 2007-08-09 2009-02-12 Koninklijke Philips Electronics N. V. Microelectronic sensor device for optical examinations in a sample medium
CN102590142B (zh) * 2012-03-12 2014-03-26 南开大学 聚焦全内反射法测量物质折射率分布
CA2989135A1 (en) 2015-06-12 2016-12-15 Anthony P. Cappo Handheld, field portable, surface plasmon resonance apparatus and its applications in the detection of chemical and biological agents
AU2016325627B2 (en) 2015-09-24 2021-11-25 Lacriscience, Llc Optical sensors, systems and methods of using same
WO2017083580A1 (en) 2015-11-10 2017-05-18 Lacriscience, Llc Systems and methods for determining sample osmolarity

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06167443A (ja) 1992-10-23 1994-06-14 Olympus Optical Co Ltd 表面プラズモン共鳴を利用した測定装置
JP3343086B2 (ja) * 1998-04-28 2002-11-11 富士写真フイルム株式会社 表面プラズモンセンサー
JP4368535B2 (ja) * 2000-05-11 2009-11-18 富士フイルム株式会社 測定チップ
JP2001337036A (ja) * 2000-05-25 2001-12-07 Masao Karube 差動式ｓｐｒセンサー及び該センサーを用いた測定法
US7030988B2 (en) * 2001-03-22 2006-04-18 Fuji Photo Film Co., Ltd. Measuring apparatus and measuring chip
US6885454B2 (en) * 2001-03-28 2005-04-26 Fuji Photo Film Co., Ltd. Measuring apparatus
JP2005077317A (ja) * 2003-09-02 2005-03-24 Fuji Photo Film Co Ltd 測定装置
US7187446B2 (en) * 2004-07-26 2007-03-06 Fuji Photo Film Co., Ltd. Measuring apparatus

Also Published As

Publication number Publication date
EP1512961A1 (de) 2005-03-09
US7450236B2 (en) 2008-11-11
EP1512961B1 (de) 2010-01-13
US20050046854A1 (en) 2005-03-03

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition