DE602004021251D1 - Festkörperbildsensor mit elektronischer Kontrolle der Apertur - Google Patents

Festkörperbildsensor mit elektronischer Kontrolle der Apertur

Info

Publication number
DE602004021251D1
DE602004021251D1 DE602004021251T DE602004021251T DE602004021251D1 DE 602004021251 D1 DE602004021251 D1 DE 602004021251D1 DE 602004021251 T DE602004021251 T DE 602004021251T DE 602004021251 T DE602004021251 T DE 602004021251T DE 602004021251 D1 DE602004021251 D1 DE 602004021251D1
Authority
DE
Germany
Prior art keywords
image sensor
solid state
state image
aperture control
electronic aperture
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602004021251T
Other languages
English (en)
Inventor
Peter Seitz
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Centre Suisse dElectronique et Microtechnique SA CSEM
Original Assignee
Centre Suisse dElectronique et Microtechnique SA CSEM
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Centre Suisse dElectronique et Microtechnique SA CSEM filed Critical Centre Suisse dElectronique et Microtechnique SA CSEM
Publication of DE602004021251D1 publication Critical patent/DE602004021251D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
    • H01L31/10—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by potential barriers, e.g. phototransistors
    • H01L31/101—Devices sensitive to infrared, visible or ultraviolet radiation
    • H01L31/112—Devices sensitive to infrared, visible or ultraviolet radiation characterised by field-effect operation, e.g. junction field-effect phototransistor
    • H01L31/113—Devices sensitive to infrared, visible or ultraviolet radiation characterised by field-effect operation, e.g. junction field-effect phototransistor being of the conductor-insulator-semiconductor type, e.g. metal-insulator-semiconductor field-effect transistor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/148—Charge coupled imagers

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Solid State Image Pick-Up Elements (AREA)
DE602004021251T 2004-08-04 2004-08-04 Festkörperbildsensor mit elektronischer Kontrolle der Apertur Active DE602004021251D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP04405490A EP1624491B1 (de) 2004-08-04 2004-08-04 Festkörperbildsensor mit elektronischer Kontrolle der Apertur

Publications (1)

Publication Number Publication Date
DE602004021251D1 true DE602004021251D1 (de) 2009-07-09

Family

ID=34932228

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602004021251T Active DE602004021251D1 (de) 2004-08-04 2004-08-04 Festkörperbildsensor mit elektronischer Kontrolle der Apertur

Country Status (4)

Country Link
US (1) US8436401B2 (de)
EP (1) EP1624491B1 (de)
DE (1) DE602004021251D1 (de)
WO (1) WO2006012764A1 (de)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1624490B1 (de) * 2004-08-04 2018-10-03 Heptagon Micro Optics Pte. Ltd. Grossflächiger Pixel für die Verwendung in einem Bildsensor
GB2446429A (en) 2006-12-08 2008-08-13 E2V Tech Photosensor with variable sensing area
GB0803702D0 (en) 2008-02-28 2008-04-09 Isis Innovation Transparent conducting oxides
DE102009001159A1 (de) * 2009-02-25 2010-09-02 Johann Wolfgang Goethe-Universität Frankfurt am Main Elektrooptische Kamera mit demodulierendem Detektorarray
KR101623960B1 (ko) 2009-06-04 2016-05-25 삼성전자주식회사 광전자 셔터, 이의 동작 방법 및 광전자 셔터를 채용한 광학 장치
GB0915376D0 (en) 2009-09-03 2009-10-07 Isis Innovation Transparent conducting oxides
US8464952B2 (en) * 2009-11-18 2013-06-18 Hand Held Products, Inc. Optical reader having improved back-illuminated image sensor
FR2961347B1 (fr) * 2010-06-15 2012-08-24 E2V Semiconductors Capteur d'image a multiplication d'electrons
ITUD20110149A1 (it) * 2011-09-29 2013-03-30 Monica Vatteroni Dispositivo fotorilevatore per sensori elettro-ottici a dinamica di luce variabile
TWI465979B (zh) * 2012-04-16 2014-12-21 Au Optronics Corp 觸控面板
EP2867923B1 (de) 2012-06-27 2020-01-15 Teledyne Dalsa B.V. Bildsensor und vorrichtung mit solch einem bildsensor
US9191637B2 (en) * 2013-09-10 2015-11-17 Kabushiki Kaisha Toshiba Solid-state imaging apparatus
EP3193190B1 (de) * 2016-01-15 2023-04-12 Sony Depthsensing Solutions N.V. Detektorvorrichtung mit majoritätsstrom und schaltung zur steuerung des stroms
CN109814083B (zh) * 2018-11-14 2024-06-14 光微信息科技(合肥)有限公司 电流辅助光子解调型像素单元、背照式图像传感器芯片、成像系统、形成方法和测算方法
CN112864183B (zh) * 2021-01-18 2023-08-25 上海集成电路装备材料产业创新中心有限公司 一种改善传输迟滞的像元结构

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4481522A (en) * 1982-03-24 1984-11-06 Rca Corporation CCD Imagers with substrates having drift field
US4994405A (en) * 1989-11-21 1991-02-19 Eastman Kodak Company Area image sensor with transparent electrodes
JPH06140442A (ja) * 1992-10-29 1994-05-20 Matsushita Electric Ind Co Ltd 電荷転送装置
DE4440613C1 (de) 1994-11-14 1996-07-25 Leica Ag Vorrichtung und Verfahren zur Detektion und Demodulation eines intensitätsmodulierten Strahlungsfeldes
US5591996A (en) * 1995-03-24 1997-01-07 Analog Devices, Inc. Recirculating charge transfer magnetic field sensor
SE509569C2 (sv) 1995-10-26 1999-02-08 Hoernell International Ab Vätskekristallslutarkonstruktion
ES2206748T3 (es) 1996-09-05 2004-05-16 Rudolf Schwarte Procedimiento y dispositivo para la determinacion de la informacion sobre fases y/o amplitudes de una onda electromagnetica.
KR100246358B1 (ko) 1997-09-25 2000-03-15 김영환 전자셔터를 구비한 액티브 픽셀 센서
US6667768B1 (en) 1998-02-17 2003-12-23 Micron Technology, Inc. Photodiode-type pixel for global electronic shutter and reduced lag
DE10035135B4 (de) 2000-07-19 2010-02-18 Sick Ag Verfahren und Vorrichtung zur Entfernungsmessung
US6906793B2 (en) * 2000-12-11 2005-06-14 Canesta, Inc. Methods and devices for charge management for three-dimensional sensing
US7352454B2 (en) * 2000-11-09 2008-04-01 Canesta, Inc. Methods and devices for improved charge management for three-dimensional and color sensing
EP1356525A1 (de) * 2001-01-23 2003-10-29 Dalsa Corporation Ladungsgekoppelte anordnung
TW530951U (en) 2001-05-30 2003-05-01 Hon Hai Prec Ind Co Ltd Manual tunable optical attenuator
GB2389960A (en) * 2002-06-20 2003-12-24 Suisse Electronique Microtech Four-tap demodulation pixel
DE10228103A1 (de) 2002-06-24 2004-01-15 Bayer Cropscience Ag Fungizide Wirkstoffkombinationen
ATE306745T1 (de) * 2003-03-10 2005-10-15 Suisse Electronique Microtech Elektrische schaltung, verfahren und vorrichtung zur demodulation eines intensitätsmodulierten signals
JP4391145B2 (ja) * 2003-06-27 2009-12-24 富士フイルム株式会社 固体撮像装置

Also Published As

Publication number Publication date
EP1624491A1 (de) 2006-02-08
US20090026508A1 (en) 2009-01-29
US8436401B2 (en) 2013-05-07
WO2006012764A1 (en) 2006-02-09
EP1624491B1 (de) 2009-05-27

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Legal Events

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