DE60103779D1 - Einrichtung zum elektromagnetischen charakterisieren einer zu testenden struktur - Google Patents

Einrichtung zum elektromagnetischen charakterisieren einer zu testenden struktur

Info

Publication number
DE60103779D1
DE60103779D1 DE60103779T DE60103779T DE60103779D1 DE 60103779 D1 DE60103779 D1 DE 60103779D1 DE 60103779 T DE60103779 T DE 60103779T DE 60103779 T DE60103779 T DE 60103779T DE 60103779 D1 DE60103779 D1 DE 60103779D1
Authority
DE
Germany
Prior art keywords
signals
signal generator
tested
frequency band
predetermined frequency
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60103779T
Other languages
English (en)
Other versions
DE60103779T2 (de
Inventor
Jean Jecko
Antoine Martinod
Marie Lalande-Guionie
Jean Reineix
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Centre National de la Recherche Scientifique CNRS
Original Assignee
Centre National de la Recherche Scientifique CNRS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Centre National de la Recherche Scientifique CNRS filed Critical Centre National de la Recherche Scientifique CNRS
Publication of DE60103779D1 publication Critical patent/DE60103779D1/de
Application granted granted Critical
Publication of DE60103779T2 publication Critical patent/DE60103779T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/0864—Measuring electromagnetic field characteristics characterised by constructional or functional features
    • G01R29/0871—Complete apparatus or systems; circuits, e.g. receivers or amplifiers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
    • G01R27/32—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
    • G01R31/68—Testing of releasable connections, e.g. of terminals mounted on a printed circuit board
    • G01R31/69—Testing of releasable connections, e.g. of terminals mounted on a printed circuit board of terminals at the end of a cable or a wire harness; of plugs; of sockets, e.g. wall sockets or power sockets in appliances

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Control Of High-Frequency Heating Circuits (AREA)
  • Testing Relating To Insulation (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Magnetic Resonance Imaging Apparatus (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Shielding Devices Or Components To Electric Or Magnetic Fields (AREA)
DE60103779T 2000-12-04 2001-11-28 Einrichtung zum elektromagnetischen charakterisieren einer zu testenden struktur Expired - Lifetime DE60103779T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
FR0015700A FR2817620B1 (fr) 2000-12-04 2000-12-04 Dispositif de caracterisation electromagnetique d'une structure sous test
FR0015700 2000-12-04
PCT/FR2001/003767 WO2002046780A1 (fr) 2000-12-04 2001-11-28 Dispositif de caracterisation electromagentique d'une structure sous test

Publications (2)

Publication Number Publication Date
DE60103779D1 true DE60103779D1 (de) 2004-07-15
DE60103779T2 DE60103779T2 (de) 2005-07-14

Family

ID=8857218

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60103779T Expired - Lifetime DE60103779T2 (de) 2000-12-04 2001-11-28 Einrichtung zum elektromagnetischen charakterisieren einer zu testenden struktur

Country Status (9)

Country Link
US (1) US6995569B2 (de)
EP (1) EP1342094B1 (de)
AT (1) ATE268912T1 (de)
AU (1) AU2002216147A1 (de)
DE (1) DE60103779T2 (de)
DK (1) DK1342094T3 (de)
ES (1) ES2223016T3 (de)
FR (1) FR2817620B1 (de)
WO (1) WO2002046780A1 (de)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1939637A4 (de) * 2005-09-01 2011-02-23 Murata Manufacturing Co Verfahren und einrichtung zur messung des streukoeffizienten eines untersuchten
DE102007034851B4 (de) * 2007-07-24 2015-02-26 Gunter Langer Vorrichtung und Verfahren zur Ermittlung der elektromagnetischen Störaussendung und Störfestigkeit
US20150084656A1 (en) * 2013-09-25 2015-03-26 Tektronix, Inc. Two port vector network analyzer using de-embed probes
DE102017216771A1 (de) 2017-09-21 2019-03-21 Bender Gmbh & Co. Kg Verfahren und Schaltungsanordnungen zur Lokalisierung eines Fehlerortes auf einer elektrischen Leitung auf Basis der Zeitbereichsreflektometrie
CN115808573A (zh) * 2021-09-13 2023-03-17 英业达科技有限公司 测试辐射敏感度的方法及系统

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2652653B1 (fr) * 1989-09-29 1991-12-13 Centre Nat Rech Scient Analyseur vectoriel de reseau millimetrique et/ou submillimetrique.
US5059915A (en) * 1989-12-01 1991-10-22 Wiltron Company Vector network analyzer RF pulse profiling method and apparatus
EP0736776B1 (de) * 1995-04-05 2010-04-28 Nippon Telegraph And Telephone Corporation Berührungslose spannungssondengerät
DE19621401C2 (de) * 1996-05-28 2001-03-01 Siemens Ag Verfahren zur Bestimmung der Schirmwirkung einer abgeschirmten Verkabelungsstrecke
FR2751415B1 (fr) * 1996-07-19 1998-10-23 Aerospatiale Banc de mesure d'impedance de transfert notamment pour connecteurs de diametre important et/ou de profil non uniforme
US5821760A (en) * 1996-07-31 1998-10-13 Fluke Corporation Method and apparatus for measuring near-end cross-talk in patch cords

Also Published As

Publication number Publication date
ATE268912T1 (de) 2004-06-15
FR2817620B1 (fr) 2003-02-07
FR2817620A1 (fr) 2002-06-07
DE60103779T2 (de) 2005-07-14
AU2002216147A1 (en) 2002-06-18
WO2002046780A1 (fr) 2002-06-13
ES2223016T3 (es) 2005-02-16
EP1342094A1 (de) 2003-09-10
EP1342094B1 (de) 2004-06-09
DK1342094T3 (da) 2004-10-18
US6995569B2 (en) 2006-02-07
US20040075441A1 (en) 2004-04-22

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