AU2002216147A1 - Device for electromagnetic characterisation of a tested structure - Google Patents

Device for electromagnetic characterisation of a tested structure

Info

Publication number
AU2002216147A1
AU2002216147A1 AU2002216147A AU1614702A AU2002216147A1 AU 2002216147 A1 AU2002216147 A1 AU 2002216147A1 AU 2002216147 A AU2002216147 A AU 2002216147A AU 1614702 A AU1614702 A AU 1614702A AU 2002216147 A1 AU2002216147 A1 AU 2002216147A1
Authority
AU
Australia
Prior art keywords
signals
signal generator
electromagnetic
characterisation
frequency band
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2002216147A
Inventor
Bernard Jean Yves Jecko
Michele Marie Lalande-Guionie
Edson Antoine Andre Martinod
Alain Jean Louis Reineix
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Centre National de la Recherche Scientifique CNRS
Original Assignee
Centre National de la Recherche Scientifique CNRS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Centre National de la Recherche Scientifique CNRS filed Critical Centre National de la Recherche Scientifique CNRS
Publication of AU2002216147A1 publication Critical patent/AU2002216147A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08Measuring electromagnetic field characteristics
    • G01R29/0864Measuring electromagnetic field characteristics characterised by constructional or functional features
    • G01R29/0871Complete apparatus or systems; circuits, e.g. receivers or amplifiers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
    • G01R27/32Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/001Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/66Testing of connections, e.g. of plugs or non-disconnectable joints
    • G01R31/68Testing of releasable connections, e.g. of terminals mounted on a printed circuit board
    • G01R31/69Testing of releasable connections, e.g. of terminals mounted on a printed circuit board of terminals at the end of a cable or a wire harness; of plugs; of sockets, e.g. wall sockets or power sockets in appliances

Abstract

A device for electromagnetic characterization of a tested structure elevates, on a predetermined frequency band, distribution parameters of the structure and parameters characteristic of the spurious rays of the structure. The device includes an electric signal generator and an analyzer for analyzing the signal transmitted by the generator and signals reflected by the structure and signals transmitted by the structure. In addition, the electric signal generator is a pulsed signal generator whereof the spectrum is at least as broad as the predetermined frequency band, and the analyzer includes a filter for temporal filtering of the signals it receives, to eliminate spurious signals.
AU2002216147A 2000-12-04 2001-11-28 Device for electromagnetic characterisation of a tested structure Abandoned AU2002216147A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
FR0015700 2000-12-04
FR0015700A FR2817620B1 (en) 2000-12-04 2000-12-04 ELECTROMAGNETIC CHARACTERIZATION DEVICE OF A STRUCTURE UNDER TEST
PCT/FR2001/003767 WO2002046780A1 (en) 2000-12-04 2001-11-28 Device for electromagnetic characterisation of a tested structure

Publications (1)

Publication Number Publication Date
AU2002216147A1 true AU2002216147A1 (en) 2002-06-18

Family

ID=8857218

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2002216147A Abandoned AU2002216147A1 (en) 2000-12-04 2001-11-28 Device for electromagnetic characterisation of a tested structure

Country Status (9)

Country Link
US (1) US6995569B2 (en)
EP (1) EP1342094B1 (en)
AT (1) ATE268912T1 (en)
AU (1) AU2002216147A1 (en)
DE (1) DE60103779T2 (en)
DK (1) DK1342094T3 (en)
ES (1) ES2223016T3 (en)
FR (1) FR2817620B1 (en)
WO (1) WO2002046780A1 (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101258412B (en) * 2005-09-01 2013-02-20 株式会社村田制作所 Method and apparatus for measuring scattering coefficient of device under test
DE102007034851B4 (en) * 2007-07-24 2015-02-26 Gunter Langer Device and method for determining the electromagnetic emission and immunity to interference
US20150084656A1 (en) * 2013-09-25 2015-03-26 Tektronix, Inc. Two port vector network analyzer using de-embed probes
DE102017216771A1 (en) 2017-09-21 2019-03-21 Bender Gmbh & Co. Kg Method and circuit arrangements for locating a fault location on an electrical line on the basis of time domain reflectometry
CN115808573A (en) * 2021-09-13 2023-03-17 英业达科技有限公司 Method and system for testing radiation sensitivity

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2652653B1 (en) * 1989-09-29 1991-12-13 Centre Nat Rech Scient VECTOR ANALYZER OF MILLIMETRIC AND / OR SUBMILLIMETRIC NETWORK.
US5059915A (en) * 1989-12-01 1991-10-22 Wiltron Company Vector network analyzer RF pulse profiling method and apparatus
EP1736788B1 (en) * 1995-04-05 2009-06-10 Nippon Telegraph And Telephone Corporation Apparatus for searching electromagnetic disturbing source
DE19621401C2 (en) * 1996-05-28 2001-03-01 Siemens Ag Procedure for determining the shielding effect of a shielded cable route
FR2751415B1 (en) * 1996-07-19 1998-10-23 Aerospatiale TRANSFER IMPEDANCE MEASUREMENT BENCH, PARTICULARLY FOR CONNECTORS OF LARGE DIAMETER AND / OR NON-UNIFORM PROFILE
US5821760A (en) * 1996-07-31 1998-10-13 Fluke Corporation Method and apparatus for measuring near-end cross-talk in patch cords

Also Published As

Publication number Publication date
EP1342094B1 (en) 2004-06-09
DE60103779D1 (en) 2004-07-15
US6995569B2 (en) 2006-02-07
WO2002046780A1 (en) 2002-06-13
US20040075441A1 (en) 2004-04-22
ES2223016T3 (en) 2005-02-16
DK1342094T3 (en) 2004-10-18
FR2817620A1 (en) 2002-06-07
ATE268912T1 (en) 2004-06-15
FR2817620B1 (en) 2003-02-07
DE60103779T2 (en) 2005-07-14
EP1342094A1 (en) 2003-09-10

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