AU2002216147A1 - Device for electromagnetic characterisation of a tested structure - Google Patents
Device for electromagnetic characterisation of a tested structureInfo
- Publication number
- AU2002216147A1 AU2002216147A1 AU2002216147A AU1614702A AU2002216147A1 AU 2002216147 A1 AU2002216147 A1 AU 2002216147A1 AU 2002216147 A AU2002216147 A AU 2002216147A AU 1614702 A AU1614702 A AU 1614702A AU 2002216147 A1 AU2002216147 A1 AU 2002216147A1
- Authority
- AU
- Australia
- Prior art keywords
- signals
- signal generator
- electromagnetic
- characterisation
- frequency band
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/0864—Measuring electromagnetic field characteristics characterised by constructional or functional features
- G01R29/0871—Complete apparatus or systems; circuits, e.g. receivers or amplifiers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
- G01R27/32—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
- G01R31/68—Testing of releasable connections, e.g. of terminals mounted on a printed circuit board
- G01R31/69—Testing of releasable connections, e.g. of terminals mounted on a printed circuit board of terminals at the end of a cable or a wire harness; of plugs; of sockets, e.g. wall sockets or power sockets in appliances
Abstract
A device for electromagnetic characterization of a tested structure elevates, on a predetermined frequency band, distribution parameters of the structure and parameters characteristic of the spurious rays of the structure. The device includes an electric signal generator and an analyzer for analyzing the signal transmitted by the generator and signals reflected by the structure and signals transmitted by the structure. In addition, the electric signal generator is a pulsed signal generator whereof the spectrum is at least as broad as the predetermined frequency band, and the analyzer includes a filter for temporal filtering of the signals it receives, to eliminate spurious signals.
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR0015700 | 2000-12-04 | ||
FR0015700A FR2817620B1 (en) | 2000-12-04 | 2000-12-04 | ELECTROMAGNETIC CHARACTERIZATION DEVICE OF A STRUCTURE UNDER TEST |
PCT/FR2001/003767 WO2002046780A1 (en) | 2000-12-04 | 2001-11-28 | Device for electromagnetic characterisation of a tested structure |
Publications (1)
Publication Number | Publication Date |
---|---|
AU2002216147A1 true AU2002216147A1 (en) | 2002-06-18 |
Family
ID=8857218
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AU2002216147A Abandoned AU2002216147A1 (en) | 2000-12-04 | 2001-11-28 | Device for electromagnetic characterisation of a tested structure |
Country Status (9)
Country | Link |
---|---|
US (1) | US6995569B2 (en) |
EP (1) | EP1342094B1 (en) |
AT (1) | ATE268912T1 (en) |
AU (1) | AU2002216147A1 (en) |
DE (1) | DE60103779T2 (en) |
DK (1) | DK1342094T3 (en) |
ES (1) | ES2223016T3 (en) |
FR (1) | FR2817620B1 (en) |
WO (1) | WO2002046780A1 (en) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101258412B (en) * | 2005-09-01 | 2013-02-20 | 株式会社村田制作所 | Method and apparatus for measuring scattering coefficient of device under test |
DE102007034851B4 (en) * | 2007-07-24 | 2015-02-26 | Gunter Langer | Device and method for determining the electromagnetic emission and immunity to interference |
US20150084656A1 (en) * | 2013-09-25 | 2015-03-26 | Tektronix, Inc. | Two port vector network analyzer using de-embed probes |
DE102017216771A1 (en) | 2017-09-21 | 2019-03-21 | Bender Gmbh & Co. Kg | Method and circuit arrangements for locating a fault location on an electrical line on the basis of time domain reflectometry |
CN115808573A (en) * | 2021-09-13 | 2023-03-17 | 英业达科技有限公司 | Method and system for testing radiation sensitivity |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2652653B1 (en) * | 1989-09-29 | 1991-12-13 | Centre Nat Rech Scient | VECTOR ANALYZER OF MILLIMETRIC AND / OR SUBMILLIMETRIC NETWORK. |
US5059915A (en) * | 1989-12-01 | 1991-10-22 | Wiltron Company | Vector network analyzer RF pulse profiling method and apparatus |
EP1736788B1 (en) * | 1995-04-05 | 2009-06-10 | Nippon Telegraph And Telephone Corporation | Apparatus for searching electromagnetic disturbing source |
DE19621401C2 (en) * | 1996-05-28 | 2001-03-01 | Siemens Ag | Procedure for determining the shielding effect of a shielded cable route |
FR2751415B1 (en) * | 1996-07-19 | 1998-10-23 | Aerospatiale | TRANSFER IMPEDANCE MEASUREMENT BENCH, PARTICULARLY FOR CONNECTORS OF LARGE DIAMETER AND / OR NON-UNIFORM PROFILE |
US5821760A (en) * | 1996-07-31 | 1998-10-13 | Fluke Corporation | Method and apparatus for measuring near-end cross-talk in patch cords |
-
2000
- 2000-12-04 FR FR0015700A patent/FR2817620B1/en not_active Expired - Fee Related
-
2001
- 2001-11-28 ES ES01999827T patent/ES2223016T3/en not_active Expired - Lifetime
- 2001-11-28 DK DK01999827T patent/DK1342094T3/en active
- 2001-11-28 US US10/433,501 patent/US6995569B2/en not_active Expired - Lifetime
- 2001-11-28 AT AT01999827T patent/ATE268912T1/en not_active IP Right Cessation
- 2001-11-28 EP EP01999827A patent/EP1342094B1/en not_active Expired - Lifetime
- 2001-11-28 WO PCT/FR2001/003767 patent/WO2002046780A1/en not_active Application Discontinuation
- 2001-11-28 DE DE60103779T patent/DE60103779T2/en not_active Expired - Lifetime
- 2001-11-28 AU AU2002216147A patent/AU2002216147A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
EP1342094B1 (en) | 2004-06-09 |
DE60103779D1 (en) | 2004-07-15 |
US6995569B2 (en) | 2006-02-07 |
WO2002046780A1 (en) | 2002-06-13 |
US20040075441A1 (en) | 2004-04-22 |
ES2223016T3 (en) | 2005-02-16 |
DK1342094T3 (en) | 2004-10-18 |
FR2817620A1 (en) | 2002-06-07 |
ATE268912T1 (en) | 2004-06-15 |
FR2817620B1 (en) | 2003-02-07 |
DE60103779T2 (en) | 2005-07-14 |
EP1342094A1 (en) | 2003-09-10 |
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