DE60045055D1 - Dekrompressionsgerat/ PRPG Zur Erzeugung Von Pseudo-Zufalligen Und Deterministischen Prufmustern - Google Patents

Dekrompressionsgerat/ PRPG Zur Erzeugung Von Pseudo-Zufalligen Und Deterministischen Prufmustern

Info

Publication number
DE60045055D1
DE60045055D1 DE60045055T DE60045055T DE60045055D1 DE 60045055 D1 DE60045055 D1 DE 60045055D1 DE 60045055 T DE60045055 T DE 60045055T DE 60045055 T DE60045055 T DE 60045055T DE 60045055 D1 DE60045055 D1 DE 60045055D1
Authority
DE
Germany
Prior art keywords
test patterns
random
test
prpg
deterministic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60045055T
Other languages
English (en)
Inventor
Janusz Rajski
Jerzy Tyszer
Mark Kassab
Nilanjan Mukherjee
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mentor Graphics Corp
Original Assignee
Mentor Graphics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mentor Graphics Corp filed Critical Mentor Graphics Corp
Application granted granted Critical
Publication of DE60045055D1 publication Critical patent/DE60045055D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/31813—Test pattern generators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318335—Test pattern compression or decompression
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318385—Random or pseudo-random test pattern

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Stereo-Broadcasting Methods (AREA)
  • Monitoring And Testing Of Transmission In General (AREA)
DE60045055T 1999-11-23 2000-11-16 Dekrompressionsgerat/ PRPG Zur Erzeugung Von Pseudo-Zufalligen Und Deterministischen Prufmustern Expired - Lifetime DE60045055D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US16713799P 1999-11-23 1999-11-23

Publications (1)

Publication Number Publication Date
DE60045055D1 true DE60045055D1 (de) 2010-11-11

Family

ID=39682590

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60045055T Expired - Lifetime DE60045055D1 (de) 1999-11-23 2000-11-16 Dekrompressionsgerat/ PRPG Zur Erzeugung Von Pseudo-Zufalligen Und Deterministischen Prufmustern

Country Status (3)

Country Link
EP (1) EP1975634B1 (de)
AT (1) ATE483168T1 (de)
DE (1) DE60045055D1 (de)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6684358B1 (en) 1999-11-23 2004-01-27 Janusz Rajski Decompressor/PRPG for applying pseudo-random and deterministic test patterns
WO2015119541A1 (en) * 2014-02-05 2015-08-13 Telefonaktiebolaget L M Ericsson (Publ) Configurable built-in self-tests of digital logic circuits

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5694402A (en) * 1996-10-22 1997-12-02 Texas Instruments Incorporated System and method for structurally testing integrated circuit devices
US5894402A (en) 1997-11-25 1999-04-13 Pacesetter, Inc. Electrolytic capacitor and heat sink assembly

Also Published As

Publication number Publication date
EP1975634B1 (de) 2010-09-29
EP1975634A3 (de) 2008-10-15
EP1975634A2 (de) 2008-10-01
ATE483168T1 (de) 2010-10-15

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