DE60043099D1 - Herstellungsverfahren für einen pixel-röntgendetektor - Google Patents

Herstellungsverfahren für einen pixel-röntgendetektor

Info

Publication number
DE60043099D1
DE60043099D1 DE60043099T DE60043099T DE60043099D1 DE 60043099 D1 DE60043099 D1 DE 60043099D1 DE 60043099 T DE60043099 T DE 60043099T DE 60043099 T DE60043099 T DE 60043099T DE 60043099 D1 DE60043099 D1 DE 60043099D1
Authority
DE
Germany
Prior art keywords
detector
pixel
ray
matrix
pore
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE60043099T
Other languages
English (en)
Inventor
Sture Petersson
Jan Linnros
Christer Froejdh
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Scint X AB
Original Assignee
Scint X AB
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Scint X AB filed Critical Scint X AB
Application granted granted Critical
Publication of DE60043099D1 publication Critical patent/DE60043099D1/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2006—Measuring radiation intensity with scintillation detectors using a combination of a scintillator and photodetector which measures the means radiation intensity

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DE60043099T 1999-01-21 2000-01-21 Herstellungsverfahren für einen pixel-röntgendetektor Expired - Fee Related DE60043099D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
SE9900181A SE513536C2 (sv) 1999-01-21 1999-01-21 Arrangemang för en röntgenbildpunktsdetektoranordning samt anordning vid ett röntgenavbildningsarrangemang
PCT/SE2000/000135 WO2000043810A1 (en) 1999-01-21 2000-01-21 X-ray pixel detector device and fabrication method

Publications (1)

Publication Number Publication Date
DE60043099D1 true DE60043099D1 (de) 2009-11-19

Family

ID=20414176

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60043099T Expired - Fee Related DE60043099D1 (de) 1999-01-21 2000-01-21 Herstellungsverfahren für einen pixel-röntgendetektor

Country Status (8)

Country Link
US (1) US6744052B1 (de)
EP (1) EP1161693B1 (de)
AT (1) ATE445173T1 (de)
AU (1) AU2340300A (de)
CA (1) CA2360931C (de)
DE (1) DE60043099D1 (de)
SE (1) SE513536C2 (de)
WO (1) WO2000043810A1 (de)

Families Citing this family (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10110673A1 (de) 2001-03-06 2002-09-26 Siemens Ag Röntgendetektorarray und Verfahren zu seiner Herstellung
DE102004026842B4 (de) * 2004-06-02 2007-12-27 Siemens Ag Röntgendetektor
US7199884B2 (en) * 2004-12-21 2007-04-03 Honeywell International Inc. Thin thickness measurement method and apparatus
WO2007025485A1 (fr) * 2005-09-01 2007-03-08 Dezheng Tang Detecteur de rayons x et procede de fabrication du detecteur
US8017927B2 (en) * 2005-12-16 2011-09-13 Honeywell International Inc. Apparatus, system, and method for print quality measurements using multiple adjustable sensors
US7688447B2 (en) * 2005-12-29 2010-03-30 Honeywell International Inc. Color sensor
US20100014631A1 (en) * 2006-09-14 2010-01-21 Koninklijke Philips Electronics N.V. Scintillator based x-ray sensitive integrated circuit element with depleted electron drift region
US7608837B2 (en) * 2006-11-24 2009-10-27 Tower Semiconductor Ltd. High resolution integrated X-ray CMOS image sensor
US7880156B2 (en) * 2006-12-27 2011-02-01 Honeywell International Inc. System and method for z-structure measurements using simultaneous multi-band tomography
CN101861529B (zh) * 2007-10-04 2013-06-19 丹麦技术大学 用于检测能量在150eV至300keV范围内的粒子辐射的检测器以及具有这种检测器的材料映像装置
EP2517049B1 (de) * 2010-01-28 2014-01-08 Canon Kabushiki Kaisha Szintillatorkristallkörper, verfahren zu seiner herstellung und strahlungsdetektor
US8401809B2 (en) 2010-07-12 2013-03-19 Honeywell International Inc. System and method for adjusting an on-line appearance sensor system
DE102011004936A1 (de) * 2011-03-02 2012-09-06 Siemens Aktiengesellschaft Röntgendetektor und medizinisches Röntgengerät
US8618929B2 (en) 2011-05-09 2013-12-31 Honeywell International Inc. Wireless conveyor belt condition monitoring system and related apparatus and method
JP2013019796A (ja) * 2011-07-12 2013-01-31 Canon Inc 放射線検出器
JP5947499B2 (ja) * 2011-07-26 2016-07-06 キヤノン株式会社 放射線検出器
US8502170B2 (en) 2011-07-29 2013-08-06 Carestream Health, Inc. Patterned radiation-sensing thermoplastic composite panels
JP2015507741A (ja) 2011-12-22 2015-03-12 サン−ゴバン セラミックス アンド プラスティクス，インコーポレイティド 蓄積蛍光体粉末を含む画像蓄積装置、画像蓄積装置の形成方法、およびコンピューテッドラジオグラフィ装置
EP2629118A3 (de) 2012-02-15 2017-09-06 CSEM Centre Suisse d'Electronique et de Microtechnique SA - Recherche et Développement Hochempfindlicher Röntgendetektor
JP2013176468A (ja) * 2012-02-28 2013-09-09 Canon Inc 情報処理装置、情報処理方法
US9063238B2 (en) * 2012-08-08 2015-06-23 General Electric Company Complementary metal-oxide-semiconductor X-ray detector
BR112015012550A2 (pt) 2012-12-03 2018-02-06 Koninklijke Philips Nv matriz detectora e método
CN104903745B (zh) * 2013-01-08 2018-07-24 斯基恩特-X公司 包含多层涂层的x射线闪烁体
US9606244B2 (en) * 2013-03-14 2017-03-28 Varex Imaging Corporation X-ray imager with lens array and transparent non-structured scintillator
CN105190358B (zh) 2013-05-10 2019-08-30 皇家飞利浦有限公司 大面积闪烁体元件和辐射探测器以及使用其的辐射吸收事件定位系统
US10683585B2 (en) * 2015-11-18 2020-06-16 Vivamos Limited Method for melting and solidification of scintillating material in micromechanical structures
WO2017111681A1 (en) * 2015-12-22 2017-06-29 Scint-X Ab A scintillator, scintillator assembly, x-ray detector and x-ray imaging system and a method for manufacturing a scintillator
WO2017213622A1 (en) * 2016-06-06 2017-12-14 Terapede Systems Inc. Integrated scintillator grid with photodiodes
US10679762B2 (en) 2016-06-08 2020-06-09 Koninklijke Philips N.V. Analyzing grid for phase contrast imaging and/or dark-field imaging
CN109964118A (zh) * 2016-11-10 2019-07-02 皇家飞利浦有限公司 基于光栅的相位对比成像
RU2754112C1 (ru) * 2021-02-12 2021-08-26 Общество с ограниченной ответственностью "ДАЙМОНД ВИЖЕН" Устройство для высокоскоростной высокочувствительной регистрации рентгенографических изображений с дискриминацией вторичного рассеянного излучения
KR102604256B1 (ko) 2022-10-17 2023-11-20 한국전기연구원 하이브리드 섬광체 기반 엑스선 디텍터

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4533489A (en) 1983-12-07 1985-08-06 Harshaw/Filtrol Partnership Formable light reflective compositions
US5149971A (en) 1991-01-16 1992-09-22 Martin Marietta Energy Systems, Inc. Scintillator assembly for alpha radiation detection and method of making the assembly
US5208460A (en) 1991-09-23 1993-05-04 General Electric Company Photodetector scintillator radiation imager having high efficiency light collection
EP0576090B1 (de) * 1992-06-22 2001-10-10 Packard Instrument B.V. Plastischer Selbsklebender Szintillator
US5294795A (en) * 1992-11-12 1994-03-15 Wallac Oy Arrangement for counting liquid scintillation samples on multi-well filtration plates
US5519227A (en) * 1994-08-08 1996-05-21 The University Of Massachusetts Medical Center Structured scintillation screens
US6177236B1 (en) * 1997-12-05 2001-01-23 Xerox Corporation Method of making a pixelized scintillation layer and structures incorporating same

Also Published As

Publication number Publication date
US6744052B1 (en) 2004-06-01
SE9900181D0 (sv) 1999-01-21
SE513536C2 (sv) 2000-09-25
CA2360931A1 (en) 2000-07-27
ATE445173T1 (de) 2009-10-15
EP1161693B1 (de) 2009-10-07
CA2360931C (en) 2009-03-24
WO2000043810A1 (en) 2000-07-27
EP1161693A1 (de) 2001-12-12
SE9900181L (sv) 2000-07-22
AU2340300A (en) 2000-08-07

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee