DE60002908D1 - Vorrichtung und verfahren zur verbesserten fehlerortung und diagnose in rechnern - Google Patents

Vorrichtung und verfahren zur verbesserten fehlerortung und diagnose in rechnern

Info

Publication number
DE60002908D1
DE60002908D1 DE60002908T DE60002908T DE60002908D1 DE 60002908 D1 DE60002908 D1 DE 60002908D1 DE 60002908 T DE60002908 T DE 60002908T DE 60002908 T DE60002908 T DE 60002908T DE 60002908 D1 DE60002908 D1 DE 60002908D1
Authority
DE
Germany
Prior art keywords
data
diagnosis
flag
subsystem
initiated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60002908T
Other languages
English (en)
Other versions
DE60002908T2 (de
Inventor
Emrys Williams
Robert Cypher
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sun Microsystems Inc
Original Assignee
Sun Microsystems Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sun Microsystems Inc filed Critical Sun Microsystems Inc
Application granted granted Critical
Publication of DE60002908D1 publication Critical patent/DE60002908D1/de
Publication of DE60002908T2 publication Critical patent/DE60002908T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/07Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/0703Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
    • G06F11/0706Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation the processing taking place on a specific hardware platform or in a specific software environment
    • G06F11/0721Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation the processing taking place on a specific hardware platform or in a specific software environment within a central processing unit [CPU]
    • G06F11/0724Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation the processing taking place on a specific hardware platform or in a specific software environment within a central processing unit [CPU] in a multiprocessor or a multi-core unit
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/07Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/0703Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
    • G06F11/0751Error or fault detection not based on redundancy
    • G06F11/0763Error or fault detection not based on redundancy by bit configuration check, e.g. of formats or tags
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/07Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/0703Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
    • G06F11/079Root cause analysis, i.e. error or fault diagnosis
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/07Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/07Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
    • G06F11/1012Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices using codes or arrangements adapted for a specific type of error
    • G06F11/1024Identification of the type of error

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Health & Medical Sciences (AREA)
  • Biomedical Technology (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Detection And Correction Of Errors (AREA)
  • Hardware Redundancy (AREA)
  • Maintenance And Management Of Digital Transmission (AREA)
DE60002908T 1999-10-06 2000-09-26 Vorrichtung und verfahren zur verbesserten fehlerortung und diagnose in rechnern Expired - Lifetime DE60002908T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US413108 1999-10-06
US09/413,108 US6519717B1 (en) 1999-10-06 1999-10-06 Mechanism to improve fault isolation and diagnosis in computers
PCT/US2000/026506 WO2001025924A1 (en) 1999-10-06 2000-09-26 Mechanism to improve fault isolation and diagnosis in computers

Publications (2)

Publication Number Publication Date
DE60002908D1 true DE60002908D1 (de) 2003-06-26
DE60002908T2 DE60002908T2 (de) 2004-05-19

Family

ID=23635865

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60002908T Expired - Lifetime DE60002908T2 (de) 1999-10-06 2000-09-26 Vorrichtung und verfahren zur verbesserten fehlerortung und diagnose in rechnern

Country Status (7)

Country Link
US (2) US6519717B1 (de)
EP (1) EP1224548B1 (de)
JP (1) JP2003511756A (de)
AT (1) ATE241172T1 (de)
AU (1) AU7618500A (de)
DE (1) DE60002908T2 (de)
WO (1) WO2001025924A1 (de)

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US7137057B2 (en) 2003-01-07 2006-11-14 Sun Microsystems, Inc. Method and apparatus for performing error correction code (ECC) conversion
US7228474B2 (en) 2003-01-07 2007-06-05 Sun Microsystems, Inc. Semiconductor device and method and apparatus for testing such a device
US7222270B2 (en) * 2003-01-10 2007-05-22 International Business Machines Corporation Method for tagging uncorrectable errors for symmetric multiprocessors
US7065697B2 (en) * 2003-07-29 2006-06-20 Hewlett-Packard Development Company, L.P. Systems and methods of partitioning data to facilitate error correction
US7051265B2 (en) * 2003-07-29 2006-05-23 Hewlett-Packard Development Company, L.P. Systems and methods of routing data to facilitate error correction
US7353433B2 (en) * 2003-12-08 2008-04-01 Intel Corporation Poisoned error signaling for proactive OS recovery
US7116600B2 (en) * 2004-02-19 2006-10-03 Micron Technology, Inc. Memory device having terminals for transferring multiple types of data
US7577890B2 (en) 2005-01-21 2009-08-18 Hewlett-Packard Development Company, L.P. Systems and methods for mitigating latency associated with error detection and correction
US7480847B2 (en) 2005-08-29 2009-01-20 Sun Microsystems, Inc. Error correction code transformation technique
US7523342B1 (en) 2005-10-28 2009-04-21 Sun Microsystems, Inc. Data and control integrity for transactions in a computer system
JP4586750B2 (ja) * 2006-03-10 2010-11-24 日本電気株式会社 コンピュータシステムおよび起動監視方法
US7949931B2 (en) * 2007-01-02 2011-05-24 International Business Machines Corporation Systems and methods for error detection in a memory system
US20080168310A1 (en) * 2007-01-05 2008-07-10 Microsoft Corporation Hardware diagnostics and software recovery on headless server appliances
US7725770B2 (en) * 2007-04-01 2010-05-25 International Business Machines Corporation Enhanced failure data collection system apparatus and method
US7496784B1 (en) * 2008-01-10 2009-02-24 International Business Machines Corporation Method and system for thresholding hardware errors
US8839032B2 (en) 2009-12-08 2014-09-16 Hewlett-Packard Development Company, L.P. Managing errors in a data processing system
US8713350B2 (en) * 2009-12-08 2014-04-29 Hewlett-Packard Development Company, L.P. Handling errors in a data processing system
US20140006904A1 (en) * 2012-06-29 2014-01-02 Intel Corporation Encoding information in error correcting codes
JP5843804B2 (ja) * 2013-03-25 2016-01-13 株式会社東芝 演算装置およびエラー処理方法
EP3304111B1 (de) * 2015-06-06 2020-03-11 The Board of Trustees of the Leland Stanford Junior University Validierung auf systemebene von systemen-auf-einem-chip (soc)

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US4371930A (en) * 1980-06-03 1983-02-01 Burroughs Corporation Apparatus for detecting, correcting and logging single bit memory read errors
US4466099A (en) * 1981-12-20 1984-08-14 International Business Machines Corp. Information system using error syndrome for special control
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US5164914A (en) * 1991-01-03 1992-11-17 Hewlett-Packard Company Fast overflow and underflow limiting circuit for signed adder
US5379411A (en) * 1991-11-15 1995-01-03 Fujitsu Limited Fault indication in a storage device array
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Also Published As

Publication number Publication date
JP2003511756A (ja) 2003-03-25
US6519717B1 (en) 2003-02-11
DE60002908T2 (de) 2004-05-19
US20030163764A1 (en) 2003-08-28
WO2001025924A1 (en) 2001-04-12
AU7618500A (en) 2001-05-10
EP1224548A1 (de) 2002-07-24
EP1224548B1 (de) 2003-05-21
ATE241172T1 (de) 2003-06-15
US6823476B2 (en) 2004-11-23

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