DE59202894D1 - Method and device for testing an electrical conductor arrangement. - Google Patents

Method and device for testing an electrical conductor arrangement.

Info

Publication number
DE59202894D1
DE59202894D1 DE59202894T DE59202894T DE59202894D1 DE 59202894 D1 DE59202894 D1 DE 59202894D1 DE 59202894 T DE59202894 T DE 59202894T DE 59202894 T DE59202894 T DE 59202894T DE 59202894 D1 DE59202894 D1 DE 59202894D1
Authority
DE
Germany
Prior art keywords
testing
electrical conductor
conductor arrangement
arrangement
electrical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE59202894T
Other languages
German (de)
Inventor
Manfred Prokopp
Alexandr Chanevitsch Schen
Andrey Jurevitsch Poskatscheev
Evgeniy Oktavievitsch Janenko
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ATG Luther and Maelzer GmbH
Original Assignee
atg electronic GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by atg electronic GmbH filed Critical atg electronic GmbH
Application granted granted Critical
Publication of DE59202894D1 publication Critical patent/DE59202894D1/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2805—Bare printed circuit boards

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
DE59202894T 1991-04-10 1992-02-12 Method and device for testing an electrical conductor arrangement. Expired - Lifetime DE59202894D1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
SU4925774 1991-04-10
DE4134193A DE4134193A1 (en) 1991-04-10 1991-10-16 Testing electrical conductor arrangement, esp. on circuit board

Publications (1)

Publication Number Publication Date
DE59202894D1 true DE59202894D1 (en) 1995-08-24

Family

ID=21568789

Family Applications (2)

Application Number Title Priority Date Filing Date
DE4134193A Withdrawn DE4134193A1 (en) 1991-04-10 1991-10-16 Testing electrical conductor arrangement, esp. on circuit board
DE59202894T Expired - Lifetime DE59202894D1 (en) 1991-04-10 1992-02-12 Method and device for testing an electrical conductor arrangement.

Family Applications Before (1)

Application Number Title Priority Date Filing Date
DE4134193A Withdrawn DE4134193A1 (en) 1991-04-10 1991-10-16 Testing electrical conductor arrangement, esp. on circuit board

Country Status (1)

Country Link
DE (2) DE4134193A1 (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19541307C2 (en) * 1995-11-06 2001-09-27 Atg Test Systems Gmbh Method for testing electrical conductor arrangements and device for carrying out the method
DE19644725C1 (en) * 1996-10-28 1998-04-02 Atg Test Systems Gmbh System for testing electric printed circuit board
DE19700505A1 (en) * 1997-01-09 1998-07-16 Atg Test Systems Gmbh Process for testing printed circuit boards
DE19744925B4 (en) * 1997-10-10 2006-08-10 Deutsche Telekom Ag Method for detecting unwanted open connections
DE102006005800B4 (en) 2006-02-08 2007-12-06 Atg Test Systems Gmbh Method and apparatus for testing unpopulated printed circuit boards

Also Published As

Publication number Publication date
DE4134193A1 (en) 1992-10-15

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Legal Events

Date Code Title Description
8327 Change in the person/name/address of the patent owner

Owner name: ATG TEST SYSTEMS GMBH, 97877 WERTHEIM, DE ADAPTRON

8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: ATG TEST SYSTEMS GMBH, 97877 WERTHEIM, DE

8327 Change in the person/name/address of the patent owner

Owner name: ATG TEST SYSTEMS GMBH & CO.KG, 97877 WERTHEIM, DE

8327 Change in the person/name/address of the patent owner

Owner name: ATG LUTHER & MAELZER GMBH, 50668 KOELN, DE