DE571576C - Method for the X-ray spectroscopic investigation of the structure of crystals - Google Patents

Method for the X-ray spectroscopic investigation of the structure of crystals

Info

Publication number
DE571576C
DE571576C DES74159D DES0074159D DE571576C DE 571576 C DE571576 C DE 571576C DE S74159 D DES74159 D DE S74159D DE S0074159 D DES0074159 D DE S0074159D DE 571576 C DE571576 C DE 571576C
Authority
DE
Germany
Prior art keywords
lines
crystals
ray
spectrum
crystal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DES74159D
Other languages
German (de)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens and Halske AG
Siemens AG
Original Assignee
Siemens and Halske AG
Siemens AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens and Halske AG, Siemens AG filed Critical Siemens and Halske AG
Priority to DES74159D priority Critical patent/DE571576C/en
Application granted granted Critical
Publication of DE571576C publication Critical patent/DE571576C/en
Expired legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/205—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials using diffraction cameras

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Description

Verfahren zur röntgenspektroskopischen Untersuchung der Struktur von Kristallen Die Erfindung betrifft ein Verfahren zur Untersuchung -der Struktur von Kristallen oder kristallinischen Stoffen mittels Bestrahlung des zu prüfenden Körpers durch Röntgenstrahlen. Derartige Untersuchungsmethoden sind an sich bekannt. Doch ist die Ermittlung der Kristallstruktur aus den erhaltenen spektrographischen Bildern eine unter Umständen recht schwierige - Aufgabe, so daß neue Verfahren zur Strukturbestimmung sehr erwünscht sind.Method for the X-ray spectroscopic examination of the structure of Crystals The invention relates to a method for studying the structure of Crystals or crystalline substances by irradiating the body to be tested by x-rays. Such examination methods are known per se. Indeed is the determination of the crystal structure from the obtained spectrographic images a possibly quite difficult task, so that new methods for structure determination are very welcome.

Das neue Verfahren beruht auf der durch eine Reihe von Versuchen festgestellten Erkenntnis, daß bei bestimmten Stellungen des Kristalls, die von Fall zu Fall .empirisch ermittelt werden können, in dem kontinuierlichen Grunde des von dem Kristall erzeugten Röntgenstrahlspektrums mannigfaltige Aufhellungslinien oder -fiächen entstehen, die das Spektrum in verschiedenen Richtungen durchziehen und in Abhängigkeit von der Struktur des Kristalls stehen. Gemäß der angestellten Untersuchungen ist die jeweilig gegebene Beziehung zu den Netzebenen des Kristallgitters gerade in den Fällen leicht festzustellen und auszuwerten, in denen die Aufhellungslinien zu den bekannten Linien des Spektrums schräg stehen und in denen leicht erkennbare Schnittpunkte mit diesen Linien oder verschiedener der schrägen Aufhellungslinien miteinander auftreten.The new method is based on that established by a series of experiments Realization that with certain positions of the crystal, this is empirical from case to case can be determined in the continuous basis of the generated by the crystal The X-ray spectrum produces manifold lines or areas of brightening, which traverse the spectrum in different directions and depending on the structure of the crystal. According to the investigations made, the respective given relationship to the lattice planes of the crystal lattice in the Easily identify and evaluate cases in which the lines of clearing lead to the known lines of the spectrum are inclined and in which easily recognizable intersections with these lines or different ones of the oblique lightening lines with one another appear.

Gemäß der Erfindung besteht das neue Verfahren darin, daß der Prüfkristall in einer solchen Stellung einem Bündel von Röntgenstrahlen ausgesetzt wird, daß die Aufhellungslinien im Röntgenspektrum in schräger Lage zu den bekannten Spektrallinien auftreten und die gegenseitige Lage dieser Aufhellungslinien, insbesondere die Schnittpunkte dieser Linien untereinander, oder mit den Spektrallinien der Beurteilung des Kristalls zugrunde gelegt werden kann.According to the invention, the new method is that the test crystal is exposed to a beam of X-rays in such a position that the lightening lines in the X-ray spectrum at an angle to the known spectral lines occur and the mutual position of these lightening lines, especially the intersection points of these lines with each other or with the spectral lines of the assessment of the crystal can be used as a basis.

Bezüglich der Beschaffenheit der Apparatur ist darauf zu verweisen, daß die schrägen Aufhellungslinien nur bei sehr scharfer Ausblendung des Röntgenstrahlenbüschels auftreten. Röntgenstrahlenbündel größeren Durchmessers ergeben zu unklare Bilder, um die hier interressierenden zusätzlichen Linien erkennen zu können.With regard to the condition of the apparatus, reference should be made to that the oblique lines of illumination only when the X-ray beam is faded out very sharply appear. X-ray beams of larger diameter result in images that are too unclear, in order to be able to recognize the additional lines of interest here.

Claims (1)

PATENTANSPRUCH: Verfahren zur röntgenspektroskopischen Untersuchung der Struktur von Kristallen oder kristallinischen Stoffen, dadurch gekennzeichnet, daß der Kristall derart in dem Röntgenstrahlenbündel angeordnet wird, daß ein Röntgenspektrum entsteht und in diesem Spektrum schräg zu den bekannten Linien des Spektrums gelagerte und mit diesen gegebenenfalls auch untereinander Kreuzungspunkte ergebende Aufhellungslinien auftreten.PATENT CLAIM: Method for X-ray spectroscopic examination the structure of crystals or crystalline substances, characterized by that the crystal is arranged in the X-ray beam in such a way that an X-ray spectrum arises and is positioned in this spectrum at an angle to the known lines of the spectrum and with these, if necessary, also intersecting points resulting in lightening lines appear.
DES74159D 1926-04-17 1926-04-17 Method for the X-ray spectroscopic investigation of the structure of crystals Expired DE571576C (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DES74159D DE571576C (en) 1926-04-17 1926-04-17 Method for the X-ray spectroscopic investigation of the structure of crystals

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DES74159D DE571576C (en) 1926-04-17 1926-04-17 Method for the X-ray spectroscopic investigation of the structure of crystals

Publications (1)

Publication Number Publication Date
DE571576C true DE571576C (en) 1933-03-02

Family

ID=7504458

Family Applications (1)

Application Number Title Priority Date Filing Date
DES74159D Expired DE571576C (en) 1926-04-17 1926-04-17 Method for the X-ray spectroscopic investigation of the structure of crystals

Country Status (1)

Country Link
DE (1) DE571576C (en)

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