DE571576C - Method for the X-ray spectroscopic investigation of the structure of crystals - Google Patents
Method for the X-ray spectroscopic investigation of the structure of crystalsInfo
- Publication number
- DE571576C DE571576C DES74159D DES0074159D DE571576C DE 571576 C DE571576 C DE 571576C DE S74159 D DES74159 D DE S74159D DE S0074159 D DES0074159 D DE S0074159D DE 571576 C DE571576 C DE 571576C
- Authority
- DE
- Germany
- Prior art keywords
- lines
- crystals
- ray
- spectrum
- crystal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/205—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials using diffraction cameras
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Description
Verfahren zur röntgenspektroskopischen Untersuchung der Struktur von Kristallen Die Erfindung betrifft ein Verfahren zur Untersuchung -der Struktur von Kristallen oder kristallinischen Stoffen mittels Bestrahlung des zu prüfenden Körpers durch Röntgenstrahlen. Derartige Untersuchungsmethoden sind an sich bekannt. Doch ist die Ermittlung der Kristallstruktur aus den erhaltenen spektrographischen Bildern eine unter Umständen recht schwierige - Aufgabe, so daß neue Verfahren zur Strukturbestimmung sehr erwünscht sind.Method for the X-ray spectroscopic examination of the structure of Crystals The invention relates to a method for studying the structure of Crystals or crystalline substances by irradiating the body to be tested by x-rays. Such examination methods are known per se. Indeed is the determination of the crystal structure from the obtained spectrographic images a possibly quite difficult task, so that new methods for structure determination are very welcome.
Das neue Verfahren beruht auf der durch eine Reihe von Versuchen festgestellten Erkenntnis, daß bei bestimmten Stellungen des Kristalls, die von Fall zu Fall .empirisch ermittelt werden können, in dem kontinuierlichen Grunde des von dem Kristall erzeugten Röntgenstrahlspektrums mannigfaltige Aufhellungslinien oder -fiächen entstehen, die das Spektrum in verschiedenen Richtungen durchziehen und in Abhängigkeit von der Struktur des Kristalls stehen. Gemäß der angestellten Untersuchungen ist die jeweilig gegebene Beziehung zu den Netzebenen des Kristallgitters gerade in den Fällen leicht festzustellen und auszuwerten, in denen die Aufhellungslinien zu den bekannten Linien des Spektrums schräg stehen und in denen leicht erkennbare Schnittpunkte mit diesen Linien oder verschiedener der schrägen Aufhellungslinien miteinander auftreten.The new method is based on that established by a series of experiments Realization that with certain positions of the crystal, this is empirical from case to case can be determined in the continuous basis of the generated by the crystal The X-ray spectrum produces manifold lines or areas of brightening, which traverse the spectrum in different directions and depending on the structure of the crystal. According to the investigations made, the respective given relationship to the lattice planes of the crystal lattice in the Easily identify and evaluate cases in which the lines of clearing lead to the known lines of the spectrum are inclined and in which easily recognizable intersections with these lines or different ones of the oblique lightening lines with one another appear.
Gemäß der Erfindung besteht das neue Verfahren darin, daß der Prüfkristall in einer solchen Stellung einem Bündel von Röntgenstrahlen ausgesetzt wird, daß die Aufhellungslinien im Röntgenspektrum in schräger Lage zu den bekannten Spektrallinien auftreten und die gegenseitige Lage dieser Aufhellungslinien, insbesondere die Schnittpunkte dieser Linien untereinander, oder mit den Spektrallinien der Beurteilung des Kristalls zugrunde gelegt werden kann.According to the invention, the new method is that the test crystal is exposed to a beam of X-rays in such a position that the lightening lines in the X-ray spectrum at an angle to the known spectral lines occur and the mutual position of these lightening lines, especially the intersection points of these lines with each other or with the spectral lines of the assessment of the crystal can be used as a basis.
Bezüglich der Beschaffenheit der Apparatur ist darauf zu verweisen, daß die schrägen Aufhellungslinien nur bei sehr scharfer Ausblendung des Röntgenstrahlenbüschels auftreten. Röntgenstrahlenbündel größeren Durchmessers ergeben zu unklare Bilder, um die hier interressierenden zusätzlichen Linien erkennen zu können.With regard to the condition of the apparatus, reference should be made to that the oblique lines of illumination only when the X-ray beam is faded out very sharply appear. X-ray beams of larger diameter result in images that are too unclear, in order to be able to recognize the additional lines of interest here.
Claims (1)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DES74159D DE571576C (en) | 1926-04-17 | 1926-04-17 | Method for the X-ray spectroscopic investigation of the structure of crystals |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DES74159D DE571576C (en) | 1926-04-17 | 1926-04-17 | Method for the X-ray spectroscopic investigation of the structure of crystals |
Publications (1)
Publication Number | Publication Date |
---|---|
DE571576C true DE571576C (en) | 1933-03-02 |
Family
ID=7504458
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DES74159D Expired DE571576C (en) | 1926-04-17 | 1926-04-17 | Method for the X-ray spectroscopic investigation of the structure of crystals |
Country Status (1)
Country | Link |
---|---|
DE (1) | DE571576C (en) |
-
1926
- 1926-04-17 DE DES74159D patent/DE571576C/en not_active Expired
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