DE449450C - Process for the analysis of substances by excitation of characteristic secondary rays - Google Patents

Process for the analysis of substances by excitation of characteristic secondary rays

Info

Publication number
DE449450C
DE449450C DEM90020D DEM0090020D DE449450C DE 449450 C DE449450 C DE 449450C DE M90020 D DEM90020 D DE M90020D DE M0090020 D DEM0090020 D DE M0090020D DE 449450 C DE449450 C DE 449450C
Authority
DE
Germany
Prior art keywords
radiation
characteristic secondary
substances
analysis
excitation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DEM90020D
Other languages
German (de)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Metallbank und Metallurgische Gesellschaft AG
Original Assignee
Metallbank und Metallurgische Gesellschaft AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Metallbank und Metallurgische Gesellschaft AG filed Critical Metallbank und Metallurgische Gesellschaft AG
Priority to DEM90020D priority Critical patent/DE449450C/en
Application granted granted Critical
Publication of DE449450C publication Critical patent/DE449450C/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/084—Investigating materials by wave or particle radiation secondary emission photo-electric effect

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Description

Verfahren zur Analyse von Stoffen durch Erregung charakteristischer Sekundärstrahlen. Durch selektive Absorption von Röntgen-oder Kathodenstrahlen bzw. durch die damit verbundene erhöhte Elektronenemission des die Strahlen absorbierenden Prüfkörpers lassen sich quantitative Stoffanalysen ausführen. Zu diesem Zweck werden die Strahlen in ein Gefäß geleitet, in welchem sich der zu untersuchende Körper befindet. Die Tonisation in diesem Raum wird gemessen.Method for the analysis of substances by excitation characteristic Secondary rays. Through selective absorption of X-rays or cathode rays or due to the associated increased electron emission from absorbing the rays Quantitative material analyzes can be carried out using test specimens. Be for this purpose the rays are directed into a vessel in which the body to be examined is located is located. The toning in this room is measured.

Gegenstand der Erfindung ist eine Ausbildung dieses Verfahrens, bei welcher der Analysatoreffekt besonders stark zur Wirkung kommt: erfindungsgemäß wird .dies dadurch erreicht, daß die Primärstrahlung derart streifend oder schräg auf den Prüfkörper zum Auffallen gebracht wird, daß der Austritt der Elektronen ,der charakteristischen Sekundärstrahlung gegenüber dem Austritt derjenigen der nichtcharakteristischen Sekundärstrahlung überwiegt. Um diesen schrägen Einfall zu erreichen, kann man entweder den Probekörper entsprechend ausgestalten, etwa in Form eines spitzen Kegels oder Keiles, der bei Festmetallen gedreht oder sonstwie gefertigt und bei Pulvern gepreßt wird, und von dessen Spitze her streifend die Röntgen- oder Kathodenstrahlung einfällt, oder man kann die geometrische Gestaltung der lonenkammer und die Stellung der Einfallöffnung zu der Stellung des Probestückes so einrichten, daß die Strahlung in der oben bezeichneten Weise streifend auf den Prüfkörper auffällt. 'The subject of the invention is an embodiment of this method which the analyzer effect is particularly effective: according to the invention Is .dies achieved in that the primary radiation grazes or obliquely on the test body is made to notice that the exit of the electrons , the characteristic secondary radiation compared to the exit of that of the non-characteristic secondary radiation predominates. About this weird idea to achieve, you can either design the test specimen accordingly, for example in the form of a pointed cone or wedge that rotates in the case of solid metals or in some other way is manufactured and pressed with powders, and grazing from the tip of the X-rays or cathode rays are incident, or you can use the geometric design the ion chamber and the position of the entrance opening relative to the position of the specimen set up so that the radiation grazes in the manner described above on the Test specimen is noticeable. '

Claims (1)

PATENTANSPRÜCHE: i. Verfahren zur Analyse von Stoffen durch Erregung charakteristischer Sekundärstrahlen an dem zu untersuchenden, innerhalb einer Ionenkamm.er angeordneten Stoff, dadurch gekennzeichnet, daß die Primärstrahlung auf den Prüfkörper derart streifend oder schräg zum Auffallen gebracht wird, daß der Austritt der Elektronen der charakteristischen Sekundärstrahlung gegenüber dem Austritt derjenigen der nichtcharakteristischen Sekundärstrahlung überwiegt. a. Verfahren nach Anspruch i, dadurch gekennzeichnet, .daß der Prüfkörper eine solche Gestalt, z. B. spitze Kegel- oder Keilform, hat, daß die Strahlung schräg auf ihn fällt. 3. Verfahren nach Anspruch i, dadurch gekennzeichnet, daß die Einfallöffnung der Ionenkammer und die Lage des Probekörpers zu dieser öffnung so gewählt sind, daß ein schräger Einfall der Strah-Iung auf den Prüfkörper zustande kommt.PATENT CLAIMS: i. Method for the analysis of substances by excitation characteristic secondary rays at the one to be examined, within an ion chamber arranged substance, characterized in that the primary radiation on the test body is so grazed or inclined to be noticed that the exit of the electrons of the characteristic secondary radiation compared to the exit of that of the non-characteristic Secondary radiation predominates. a. Method according to claim i, characterized in that .that the test specimen has such a shape, e.g. B. pointed cone or wedge shape, that the radiation falls obliquely on him. 3. The method according to claim i, characterized in that that the incidence opening of the ion chamber and the position of the specimen in relation to this opening are chosen so that an oblique incidence of the radiation on the test body occurs comes.
DEM90020D 1925-06-06 1925-06-06 Process for the analysis of substances by excitation of characteristic secondary rays Expired DE449450C (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DEM90020D DE449450C (en) 1925-06-06 1925-06-06 Process for the analysis of substances by excitation of characteristic secondary rays

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DEM90020D DE449450C (en) 1925-06-06 1925-06-06 Process for the analysis of substances by excitation of characteristic secondary rays

Publications (1)

Publication Number Publication Date
DE449450C true DE449450C (en) 1927-09-14

Family

ID=7321447

Family Applications (1)

Application Number Title Priority Date Filing Date
DEM90020D Expired DE449450C (en) 1925-06-06 1925-06-06 Process for the analysis of substances by excitation of characteristic secondary rays

Country Status (1)

Country Link
DE (1) DE449450C (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100452532C (en) * 2001-10-22 2009-01-14 日商·胜美达股份有限公司 Antenna coil and transmission antenna thereof

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100452532C (en) * 2001-10-22 2009-01-14 日商·胜美达股份有限公司 Antenna coil and transmission antenna thereof

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