DE3884949D1 - Vorrichtung zur ausmessung des von einem objekt gestreuten mikrowellenfeldes. - Google Patents

Vorrichtung zur ausmessung des von einem objekt gestreuten mikrowellenfeldes.

Info

Publication number
DE3884949D1
DE3884949D1 DE88903857T DE3884949T DE3884949D1 DE 3884949 D1 DE3884949 D1 DE 3884949D1 DE 88903857 T DE88903857 T DE 88903857T DE 3884949 T DE3884949 T DE 3884949T DE 3884949 D1 DE3884949 D1 DE 3884949D1
Authority
DE
Germany
Prior art keywords
spreaded
measuring
microwave field
microwave
field
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE88903857T
Other languages
English (en)
Other versions
DE3884949T2 (de
Inventor
Patrice Berthaud
Jean-Charles Bolomey
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Centre National de la Recherche Scientifique CNRS
Original Assignee
Centre National de la Recherche Scientifique CNRS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Centre National de la Recherche Scientifique CNRS filed Critical Centre National de la Recherche Scientifique CNRS
Publication of DE3884949D1 publication Critical patent/DE3884949D1/de
Application granted granted Critical
Publication of DE3884949T2 publication Critical patent/DE3884949T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/0864—Measuring electromagnetic field characteristics characterised by constructional or functional features
    • G01R29/0878—Sensors; antennas; probes; detectors

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Variable-Direction Aerials And Aerial Arrays (AREA)
  • Geophysics And Detection Of Objects (AREA)
  • Radar Systems Or Details Thereof (AREA)
  • Waveguide Aerials (AREA)
DE3884949T 1987-04-21 1988-04-20 Vorrichtung zur ausmessung des von einem objekt gestreuten mikrowellenfeldes. Expired - Lifetime DE3884949T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR8705597A FR2614419B1 (fr) 1987-04-21 1987-04-21 Dispositif de mesure, en une pluralite de points, du champ micro-onde diffracte par un objet
PCT/FR1988/000191 WO1988008529A1 (fr) 1987-04-21 1988-04-20 Dispositif de mesure, en une pluralite de points, du champ micro-onde diffracte par un objet

Publications (2)

Publication Number Publication Date
DE3884949D1 true DE3884949D1 (de) 1993-11-18
DE3884949T2 DE3884949T2 (de) 1994-05-19

Family

ID=9350315

Family Applications (1)

Application Number Title Priority Date Filing Date
DE3884949T Expired - Lifetime DE3884949T2 (de) 1987-04-21 1988-04-20 Vorrichtung zur ausmessung des von einem objekt gestreuten mikrowellenfeldes.

Country Status (9)

Country Link
US (1) US5128621A (de)
EP (1) EP0355114B1 (de)
JP (1) JPH02503822A (de)
CA (1) CA1304781C (de)
DE (1) DE3884949T2 (de)
DK (1) DK520389A (de)
FI (1) FI93493C (de)
FR (1) FR2614419B1 (de)
WO (1) WO1988008529A1 (de)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2647550B1 (fr) * 1989-05-26 1994-06-03 France Maintenance Automatisme Procede de mesure de caracteristiques physiques, de detection et d'identification de zones de defauts d'une piece, notamment en matiere ligneuse, et dispositif pour la mise en oeuvre d'un tel procede
FR2663426B1 (fr) * 1990-06-14 1992-10-02 Centre Nat Rech Scient Dispositif de mesure, en une pluralite de points d'une surface du champ micro-onde rayonne par une source.
US5424633A (en) * 1991-01-22 1995-06-13 Advanced Test Technologies Inc. Contactless test method and system for testing printed circuit boards
FR2674028B1 (fr) * 1991-03-14 1994-10-21 Centre Nat Rech Scient Procede et dispositif de determination du diagramme de rayonnement d'une antenne.
US5248977A (en) * 1992-05-26 1993-09-28 Trw Inc. One-dimensional electronic image scanner
JP3006383B2 (ja) * 1993-05-24 2000-02-07 日本電気株式会社 電波耐性試験装置および電波耐性評価方法および電波照射部
US5672859A (en) * 1994-03-04 1997-09-30 N.V. Bekaert S.A. Reproduction apparatus with microwave detection
FR2757332B1 (fr) * 1996-12-18 1999-01-08 Commissariat Energie Atomique Dispositif emetteur-recepteur de micro-ondes
FI101751B1 (fi) * 1997-03-27 1998-08-14 Valmet Automation Inc Sakeuden mittaus- ja säätömenetelmä ja -järjestely
US6172510B1 (en) * 1998-12-30 2001-01-09 The United Sates Of America As Represented By The Secretary Of The Navy System for detection of flaws by use of microwave radiation
WO2000072652A2 (en) * 1999-05-27 2000-12-07 New Zealand Forest Research Institute Limited Method for imaging logs or stems and apparatus
KR100543725B1 (ko) * 2002-12-20 2006-01-20 충남대학교산학협력단 안테나 방사특성 측정 시스템 및 그 방법
FR2906369B1 (fr) * 2006-09-25 2009-03-06 Satimo Sa Dispositif micro-onde de controle d'un materiau
JP5317162B2 (ja) * 2008-03-18 2013-10-16 学校法人中部大学 プラズマ装置、プラズマ処理装置及びプラズマ処理方法
US20100328142A1 (en) * 2008-03-20 2010-12-30 The Curators Of The University Of Missouri Microwave and millimeter wave resonant sensor having perpendicular feed, and imaging system
US7746266B2 (en) * 2008-03-20 2010-06-29 The Curators Of The University Of Missouri Microwave and millimeter wave imaging system
JP5682952B2 (ja) * 2010-11-25 2015-03-11 日本電信電話株式会社 木材検査装置及び木材検査方法
EP2618128A1 (de) * 2012-01-19 2013-07-24 Canon Kabushiki Kaisha Erkennungsvorrichtung, Detektor und Bilderzeugungsvorrichtung damit
CN102706901B (zh) * 2012-06-01 2014-04-23 刘马宝 一种微波无损检测防护层下金属结构腐蚀的装置及方法
US10591423B1 (en) 2017-03-22 2020-03-17 Northrop Grumman Systems Corporation Inline fabric conductivity measurement
FR3090110B1 (fr) * 2018-12-14 2024-06-28 Univ Paris Sud Capteur micro-onde recyclable et/ou biodégradable et biocompatible
FR3090109B1 (fr) * 2018-12-14 2024-06-28 Univ Paris Sud Capteur micro-onde du type à micro-ruban

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2063967B1 (de) * 1969-10-15 1973-10-19 Bony Gilbert
FR2395620A1 (fr) * 1977-06-24 1979-01-19 Radant Etudes Perfectionnement au procede de balayage electronique utilisant des panneaux dielectriques dephaseurs
FR2400781A1 (fr) * 1977-06-24 1979-03-16 Radant Etudes Antenne hyperfrequence, plate, non dispersive, a balayage electronique
US4271389A (en) * 1979-05-22 1981-06-02 The United States Of America As Represented By The Secretary Of The Army Method and apparatus for physiologic facsimile imaging of biologic targets without multipath contamination using remote microwave interrogation
FR2506026A1 (fr) * 1981-05-18 1982-11-19 Radant Etudes Procede et dispositif pour l'analyse d'un faisceau de rayonnement d'ondes electromagnetiques hyperfrequence
FR2509064A1 (fr) * 1981-07-02 1983-01-07 Centre Nat Rech Scient Procede et dispositif d'imagerie rapide en microonde
DE3150202A1 (de) * 1981-12-18 1983-06-23 Philips Patentverwaltung Gmbh, 2000 Hamburg Anordnung zur messung der feuchte
US4634968A (en) * 1982-12-20 1987-01-06 The Narda Microwave Corporation Wide range radiation monitor
DE3531893A1 (de) * 1985-09-06 1987-03-19 Siemens Ag Verfahren zur bestimmung der verteilung der dielektrizitaetskonstanten in einem untersuchungskoerper sowie messanordnung zur durchfuehrung des verfahrens

Also Published As

Publication number Publication date
DK520389D0 (da) 1989-10-20
FR2614419A1 (fr) 1988-10-28
FR2614419B1 (fr) 1989-06-16
FI93493C (fi) 1995-04-10
FI895011A0 (fi) 1989-10-20
JPH02503822A (ja) 1990-11-08
FI93493B (fi) 1994-12-30
DK520389A (da) 1989-12-21
US5128621A (en) 1992-07-07
WO1988008529A1 (fr) 1988-11-03
EP0355114A1 (de) 1990-02-28
EP0355114B1 (de) 1993-10-13
DE3884949T2 (de) 1994-05-19
CA1304781C (fr) 1992-07-07

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Legal Events

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8364 No opposition during term of opposition