DE3861623D1 - Vorichtung zur untersuchung von strahlungsbildern. - Google Patents

Vorichtung zur untersuchung von strahlungsbildern.

Info

Publication number
DE3861623D1
DE3861623D1 DE8888304395T DE3861623T DE3861623D1 DE 3861623 D1 DE3861623 D1 DE 3861623D1 DE 8888304395 T DE8888304395 T DE 8888304395T DE 3861623 T DE3861623 T DE 3861623T DE 3861623 D1 DE3861623 D1 DE 3861623D1
Authority
DE
Germany
Prior art keywords
radiation images
examining
examining radiation
images
radiation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE8888304395T
Other languages
English (en)
Inventor
Motosada Kiri
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Application granted granted Critical
Publication of DE3861623D1 publication Critical patent/DE3861623D1/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914—Measurement of spatial distribution of radiation
    • G01T1/2921—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras
    • G01T1/2928—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras using solid state detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/244—Auxiliary details, e.g. casings, cooling, damping or insulation against damage by, e.g. heat, pressure or the like
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
    • H01L31/10—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by potential barriers, e.g. phototransistors
    • H01L31/115—Devices sensitive to very short wavelength, e.g. X-rays, gamma-rays or corpuscular radiation

Landscapes

  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Molecular Biology (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Electromagnetism (AREA)
  • Computer Hardware Design (AREA)
  • Engineering & Computer Science (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Measurement Of Radiation (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Radiography Using Non-Light Waves (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
DE8888304395T 1987-05-15 1988-05-16 Vorichtung zur untersuchung von strahlungsbildern. Expired - Fee Related DE3861623D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62119766A JPS63284485A (ja) 1987-05-15 1987-05-15 放射線像受像装置

Publications (1)

Publication Number Publication Date
DE3861623D1 true DE3861623D1 (de) 1991-02-28

Family

ID=14769658

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8888304395T Expired - Fee Related DE3861623D1 (de) 1987-05-15 1988-05-16 Vorichtung zur untersuchung von strahlungsbildern.

Country Status (6)

Country Link
US (1) US4914302A (de)
EP (1) EP0291351B1 (de)
JP (1) JPS63284485A (de)
KR (1) KR920001115B1 (de)
CN (1) CN1016541B (de)
DE (1) DE3861623D1 (de)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0252245A (ja) * 1988-08-15 1990-02-21 Tokyo Electron Ltd Ｘ線検査装置
FR2652655A1 (fr) * 1989-10-04 1991-04-05 Commissariat Energie Atomique Dispositif matriciel de grandes dimensions pour la prise ou la restitution d'images.
US5121146A (en) * 1989-12-27 1992-06-09 Am International, Inc. Imaging diode array and system
JP3957803B2 (ja) * 1996-02-22 2007-08-15 キヤノン株式会社 光電変換装置
GB2315157B (en) * 1996-07-11 1998-09-30 Simage Oy Imaging apparatus
GB2319394B (en) * 1996-12-27 1998-10-28 Simage Oy Bump-bonded semiconductor imaging device
JPH11345956A (ja) * 1998-03-16 1999-12-14 Canon Inc 撮像装置
US6621084B1 (en) 1998-09-24 2003-09-16 Elgems Ltd. Pixelated photon detector
US20050067579A1 (en) * 2003-09-30 2005-03-31 Katsutoshi Tsuchiya Nuclear medicine imaging apparatus
US7065173B2 (en) * 2003-12-02 2006-06-20 General Electric Company Method and apparatus for thermal management of CT electronics
CZ2013669A3 (cs) * 2013-08-30 2015-01-07 České vysoké učení technické v Praze Ústav technické a experimentální fyziky Detektor ionizujícího záření umožňující vytvoření souvislého digitálního obrazu
JP2015161594A (ja) * 2014-02-27 2015-09-07 日立アロカメディカル株式会社 放射線検出器
CZ306067B6 (cs) 2015-05-12 2016-07-20 Advacam S.R.O. Modul detektoru ionizujícího záření
DE102017208955A1 (de) * 2017-05-29 2018-11-29 Siemens Healthcare Gmbh Detektorvorrichtung aufweisend einen Kühlluftpfad zum Kühlen eines Röntgendetektors

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2123114B1 (de) * 1971-01-08 1976-05-28 Thomson Csf
DE2741404A1 (de) * 1977-09-14 1979-03-22 Siemens Ag Anordnung zum herstellen eines koerperschnittbildes
US4386362A (en) * 1979-12-26 1983-05-31 Rca Corporation Center gate semiconductor device having pipe cooling means
US4546614A (en) * 1984-04-13 1985-10-15 General Dynamics Pomona Division Precooled detector leads
US4682032A (en) * 1986-01-17 1987-07-21 Itek Corporation Joule-Thomson cryostat having a chemically-deposited infrared detector and method of manufacture
US4740700A (en) * 1986-09-02 1988-04-26 Hughes Aircraft Company Thermally insulative and electrically conductive interconnect and process for making same

Also Published As

Publication number Publication date
US4914302A (en) 1990-04-03
CN1016541B (zh) 1992-05-06
JPS63284485A (ja) 1988-11-21
KR880014843A (ko) 1988-12-24
KR920001115B1 (ko) 1992-02-01
EP0291351B1 (de) 1991-01-23
EP0291351A1 (de) 1988-11-17
CN1037595A (zh) 1989-11-29

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee