DE3833441A1 - Process for metallising aluminium oxide substrates - Google Patents
Process for metallising aluminium oxide substratesInfo
- Publication number
- DE3833441A1 DE3833441A1 DE19883833441 DE3833441A DE3833441A1 DE 3833441 A1 DE3833441 A1 DE 3833441A1 DE 19883833441 DE19883833441 DE 19883833441 DE 3833441 A DE3833441 A DE 3833441A DE 3833441 A1 DE3833441 A1 DE 3833441A1
- Authority
- DE
- Germany
- Prior art keywords
- substrate
- bath
- etching
- phosphoric acid
- copper
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 239000000758 substrate Substances 0.000 title claims abstract description 54
- PNEYBMLMFCGWSK-UHFFFAOYSA-N Alumina Chemical compound [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 title claims abstract description 12
- 238000000034 method Methods 0.000 title claims description 18
- NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical compound OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 claims abstract description 42
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 claims abstract description 27
- 229910000147 aluminium phosphate Inorganic materials 0.000 claims abstract description 21
- 239000010949 copper Substances 0.000 claims abstract description 19
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims abstract description 18
- 229910052802 copper Inorganic materials 0.000 claims abstract description 18
- 239000000203 mixture Substances 0.000 claims abstract description 12
- 238000001465 metallisation Methods 0.000 claims abstract description 6
- 229910000510 noble metal Inorganic materials 0.000 claims abstract description 5
- 238000005530 etching Methods 0.000 claims description 34
- KDLHZDBZIXYQEI-UHFFFAOYSA-N palladium Substances [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 claims description 16
- 229910018072 Al 2 O 3 Inorganic materials 0.000 claims description 12
- 150000002500 ions Chemical class 0.000 claims description 6
- 229910052763 palladium Inorganic materials 0.000 claims description 6
- 239000010970 precious metal Substances 0.000 claims description 6
- 239000000084 colloidal system Substances 0.000 claims description 4
- 238000001035 drying Methods 0.000 claims description 4
- 230000001681 protective effect Effects 0.000 claims description 4
- 229910021645 metal ion Inorganic materials 0.000 claims description 3
- 150000007522 mineralic acids Chemical class 0.000 claims description 3
- 238000007747 plating Methods 0.000 claims description 2
- FGUUSXIOTUKUDN-IBGZPJMESA-N C1(=CC=CC=C1)N1C2=C(NC([C@H](C1)NC=1OC(=NN=1)C1=CC=CC=C1)=O)C=CC=C2 Chemical compound C1(=CC=CC=C1)N1C2=C(NC([C@H](C1)NC=1OC(=NN=1)C1=CC=CC=C1)=O)C=CC=C2 FGUUSXIOTUKUDN-IBGZPJMESA-N 0.000 claims 1
- 238000007654 immersion Methods 0.000 claims 1
- 239000000126 substance Substances 0.000 claims 1
- 230000004913 activation Effects 0.000 abstract description 2
- 239000001117 sulphuric acid Substances 0.000 abstract 1
- 235000011149 sulphuric acid Nutrition 0.000 abstract 1
- 239000000243 solution Substances 0.000 description 23
- 239000000853 adhesive Substances 0.000 description 21
- 230000001070 adhesive effect Effects 0.000 description 21
- 229910052751 metal Inorganic materials 0.000 description 9
- 239000002184 metal Substances 0.000 description 9
- 239000003054 catalyst Substances 0.000 description 8
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 6
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 5
- 239000012190 activator Substances 0.000 description 5
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 4
- 239000000919 ceramic Substances 0.000 description 4
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 4
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 4
- 239000003638 chemical reducing agent Substances 0.000 description 3
- 229960002050 hydrofluoric acid Drugs 0.000 description 3
- 229910052709 silver Inorganic materials 0.000 description 3
- 239000004332 silver Substances 0.000 description 3
- UOCLXMDMGBRAIB-UHFFFAOYSA-N 1,1,1-trichloroethane Chemical compound CC(Cl)(Cl)Cl UOCLXMDMGBRAIB-UHFFFAOYSA-N 0.000 description 2
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 2
- CDBYLPFSWZWCQE-UHFFFAOYSA-L Sodium Carbonate Chemical compound [Na+].[Na+].[O-]C([O-])=O CDBYLPFSWZWCQE-UHFFFAOYSA-L 0.000 description 2
- 244000052616 bacterial pathogen Species 0.000 description 2
- 238000000151 deposition Methods 0.000 description 2
- 230000008021 deposition Effects 0.000 description 2
- 230000002349 favourable effect Effects 0.000 description 2
- 230000008018 melting Effects 0.000 description 2
- 238000002844 melting Methods 0.000 description 2
- 150000002739 metals Chemical class 0.000 description 2
- 229910052759 nickel Inorganic materials 0.000 description 2
- -1 palladium ions Chemical class 0.000 description 2
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 2
- BVKZGUZCCUSVTD-UHFFFAOYSA-L Carbonate Chemical compound [O-]C([O-])=O BVKZGUZCCUSVTD-UHFFFAOYSA-L 0.000 description 1
- KCXVZYZYPLLWCC-UHFFFAOYSA-N EDTA Chemical compound OC(=O)CN(CC(O)=O)CCN(CC(O)=O)CC(O)=O KCXVZYZYPLLWCC-UHFFFAOYSA-N 0.000 description 1
- KRHYYFGTRYWZRS-UHFFFAOYSA-M Fluoride anion Chemical compound [F-] KRHYYFGTRYWZRS-UHFFFAOYSA-M 0.000 description 1
- GRYLNZFGIOXLOG-UHFFFAOYSA-N Nitric acid Chemical compound O[N+]([O-])=O GRYLNZFGIOXLOG-UHFFFAOYSA-N 0.000 description 1
- 229910019142 PO4 Inorganic materials 0.000 description 1
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- 150000007513 acids Chemical class 0.000 description 1
- 239000003513 alkali Substances 0.000 description 1
- 229910001854 alkali hydroxide Inorganic materials 0.000 description 1
- 150000001339 alkali metal compounds Chemical class 0.000 description 1
- 150000008044 alkali metal hydroxides Chemical class 0.000 description 1
- 239000012670 alkaline solution Substances 0.000 description 1
- 238000004873 anchoring Methods 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000003197 catalytic effect Effects 0.000 description 1
- 238000006555 catalytic reaction Methods 0.000 description 1
- 229910017052 cobalt Inorganic materials 0.000 description 1
- 239000010941 cobalt Substances 0.000 description 1
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 description 1
- 230000000052 comparative effect Effects 0.000 description 1
- 239000008139 complexing agent Substances 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 229910000365 copper sulfate Inorganic materials 0.000 description 1
- ARUVKPQLZAKDPS-UHFFFAOYSA-L copper(II) sulfate Chemical compound [Cu+2].[O-][S+2]([O-])([O-])[O-] ARUVKPQLZAKDPS-UHFFFAOYSA-L 0.000 description 1
- RSJOBNMOMQFPKQ-UHFFFAOYSA-L copper;2,3-dihydroxybutanedioate Chemical compound [Cu+2].[O-]C(=O)C(O)C(O)C([O-])=O RSJOBNMOMQFPKQ-UHFFFAOYSA-L 0.000 description 1
- 238000005238 degreasing Methods 0.000 description 1
- 230000018044 dehydration Effects 0.000 description 1
- 238000006297 dehydration reaction Methods 0.000 description 1
- 239000008367 deionised water Substances 0.000 description 1
- 229910021641 deionized water Inorganic materials 0.000 description 1
- VQSGSDQVPMPPEH-UHFFFAOYSA-N dialuminum oxygen(2-) phosphoric acid Chemical compound P(O)(O)(O)=O.[O-2].[Al+3].[O-2].[O-2].[Al+3] VQSGSDQVPMPPEH-UHFFFAOYSA-N 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000009713 electroplating Methods 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 239000007791 liquid phase Substances 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 239000000155 melt Substances 0.000 description 1
- WSFSSNUMVMOOMR-NJFSPNSNSA-N methanone Chemical compound O=[14CH2] WSFSSNUMVMOOMR-NJFSPNSNSA-N 0.000 description 1
- 229910017604 nitric acid Inorganic materials 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 150000002940 palladium Chemical class 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 235000021317 phosphate Nutrition 0.000 description 1
- 150000003013 phosphoric acid derivatives Chemical class 0.000 description 1
- 229910052697 platinum Inorganic materials 0.000 description 1
- 238000005245 sintering Methods 0.000 description 1
- 229910000029 sodium carbonate Inorganic materials 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
- 238000001179 sorption measurement Methods 0.000 description 1
- 239000003381 stabilizer Substances 0.000 description 1
- 238000009864 tensile test Methods 0.000 description 1
- 230000008646 thermal stress Effects 0.000 description 1
- 230000001988 toxicity Effects 0.000 description 1
- 231100000419 toxicity Toxicity 0.000 description 1
- 238000002604 ultrasonography Methods 0.000 description 1
- 238000011144 upstream manufacturing Methods 0.000 description 1
- 239000000080 wetting agent Substances 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B41/00—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone
- C04B41/009—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone characterised by the material treated
-
- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B41/00—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone
- C04B41/45—Coating or impregnating, e.g. injection in masonry, partial coating of green or fired ceramics, organic coating compositions for adhering together two concrete elements
- C04B41/52—Multiple coating or impregnating multiple coating or impregnating with the same composition or with compositions only differing in the concentration of the constituents, is classified as single coating or impregnation
-
- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B41/00—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone
- C04B41/53—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone involving the removal of at least part of the materials of the treated article, e.g. etching, drying of hardened concrete
- C04B41/5338—Etching
- C04B41/5353—Wet etching, e.g. with etchants dissolved in organic solvents
-
- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B41/00—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone
- C04B41/80—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone of only ceramics
- C04B41/81—Coating or impregnation
- C04B41/89—Coating or impregnation for obtaining at least two superposed coatings having different compositions
-
- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B41/00—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone
- C04B41/80—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone of only ceramics
- C04B41/91—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone of only ceramics involving the removal of part of the materials of the treated articles, e.g. etching
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/16—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
- C23C18/18—Pretreatment of the material to be coated
- C23C18/1851—Pretreatment of the material to be coated of surfaces of non-metallic or semiconducting in organic material
- C23C18/1872—Pretreatment of the material to be coated of surfaces of non-metallic or semiconducting in organic material by chemical pretreatment
- C23C18/1886—Multistep pretreatment
- C23C18/1893—Multistep pretreatment with use of organic or inorganic compounds other than metals, first
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/48—Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the subgroups H01L21/06 - H01L21/326
- H01L21/4814—Conductive parts
- H01L21/4846—Leads on or in insulating or insulated substrates, e.g. metallisation
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/03—Use of materials for the substrate
- H05K1/0306—Inorganic insulating substrates, e.g. ceramic, glass
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/10—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern
- H05K3/18—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using precipitation techniques to apply the conductive material
- H05K3/181—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using precipitation techniques to apply the conductive material by electroless plating
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/38—Improvement of the adhesion between the insulating substrate and the metal
- H05K3/381—Improvement of the adhesion between the insulating substrate and the metal by special treatment of the substrate
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Ceramic Engineering (AREA)
- Materials Engineering (AREA)
- Organic Chemistry (AREA)
- Structural Engineering (AREA)
- Computer Hardware Design (AREA)
- Inorganic Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Chemically Coating (AREA)
- ing And Chemical Polishing (AREA)
- Catalysts (AREA)
Abstract
Description
Die Erfindung betrifft ein Verfahren zum Metallisieren von Aluminiumoxid-Substraten, wobei man zunÀchst das Substrat mit einem Gemisch aus PhosphorsÀure und SchwefelsÀure oberflÀchlich anÀtzt und dann auf der angeÀtzten OberflÀche stromlos ein Metall abscheidet.The invention relates to a method for metallizing Alumina substrates, starting with the substrate with a mixture of phosphoric acid and sulfuric acid etched on the surface and then on the etched surface deposits a metal without current.
Aluminiumoxid-Substrate sind ĂŒblicherweise nach dem Sintern so glatt, daĂ es schwer ist, Metallschichten auf ihnen haftfest abzuscheiden. Man hat daher versucht, die Substrat-OberflĂ€chen durch AnĂ€tzen aufzurauhen.Aluminum oxide substrates are usually after sintering so smooth that it's hard to put layers of metal on them to deposit firmly. One has therefore tried the Roughen substrate surfaces by etching.
GemÀà DE-OS 34 21 988 benutzt man zum AnĂ€tzen von Aluminiumoxid-Substraten Schmelzen von Alkalimetall- Verbindungen, insbesondere alkalische Verbindungen wie Alkalihydroxid oder Alkalicarbonat. Das Arbeiten mit alkalischen Schmelzen ist jedoch gefĂ€hrlich und unbequem. Man kann statt dessen die zu behandelnden Substrate in wĂ€Ărige alkalische Lösungen tauchen und anschlieĂend im Ofen aufheizen, bis sich auf der OberflĂ€che ein dĂŒnner rauher Film einer Schmelze gebildet hat (US-PS 36 90 921). Diese Variante ist zeitaufwendig und eignet sich nicht gut fĂŒr Automation. Nachteilig ist ferner, daĂ die Substrate beim Entfernen aus dem Ofen stark thermisch belastet werden.According to DE-OS 34 21 988 used for the etching of Alumina Substrates Melting Alkali Metal Compounds, especially alkaline compounds such as Alkali hydroxide or alkali carbonate. Working with However, alkaline melting is dangerous and uncomfortable. Man can instead the substrates to be treated in aqueous Dip alkaline solutions and then in the oven heat up until a thin, rough surface Film has formed a melt (US-PS 36 90 921). These Variant is time consuming and is not well suited for Automation. Another disadvantage is that the substrates when Removing from the oven can be subjected to severe thermal stress.
GemÀà DE-OS 33 45 353 erfolgt das AnĂ€tzen der OberflĂ€che eines Keramik-Substrates, z. B. aus Al2O3, in einem FluorwasserstoffsĂ€ure enthaltenden Medium, eventuell in Kombination mit einer vorgeschalteten Behandlung durch Natriumhydroxid. Nachteilig an der Verwendung der FluorwasserstoffsĂ€ure ist deren Giftigkeit und AggressivitĂ€t gegenĂŒber HautoberflĂ€chen. Nach eigenen Beobachtungen können bei Raumtemperatur Substrate mit ĂŒber 96% Al2O3 durch Fluorid-Ătzlösungen nicht mehr ausreichend aufgerauht und folglich auf ihnen festhaftende Metallschichten nicht erhalten werden.According to DE-OS 33 45 353, the surface of a ceramic substrate, for. B. from Al 2 O 3 , in a medium containing hydrofluoric acid, possibly in combination with an upstream treatment by sodium hydroxide. A disadvantage of using hydrofluoric acid is its toxicity and aggressiveness towards skin surfaces. According to our own observations, substrates with over 96% Al 2 O 3 can no longer be sufficiently roughened by fluoride etching solutions at room temperature and consequently metal layers adhering to them cannot be obtained.
GemÀà US-PS 32 96 012 wird zum Ătzen von Aluminiumoxid- Substraten 85%ige PhosphorsĂ€ure eingesetzt. Das so erhaltene Substrat mit poröse OberflĂ€che wird gespĂŒlt, gegebenenfalls mit Zinn/Palladium-Ionen aktiviert und erneut gespĂŒlt. SchlieĂlich wird stromlos Kupfer, z. B. aus alkalischen Kupfer-Tartrat-Lösungen, abgeschieden. Dieses Verfahren liefert ausreichende Haftfestigkeitswerte fĂŒr Aluminiumoxid-Keramik mit einem Reingehalt unter 80% Al2O3. Es eignet sich dagegen weniger gut fĂŒr Substrate mit höherem Gehalt an Al2O3.According to US Pat. No. 3,296,012, 85% phosphoric acid is used for the etching of aluminum oxide substrates. The substrate with porous surface thus obtained is rinsed, optionally activated with tin / palladium ions and rinsed again. Finally, copper, e.g. B. from alkaline copper tartrate solutions. This process provides sufficient adhesive strength values for alumina ceramics with a purity below 80% Al 2 O 3 . In contrast, it is less suitable for substrates with a higher content of Al 2 O 3 .
GemÀà Japanischer Offenlegungsschrift Sho-61-1 51 081 werden zum AnĂ€tzen von Aluminiumoxid-Substraten Gemische aus PhosphorsĂ€ure und einer anorganischen SĂ€ure (SalpetersĂ€ure, SalzsĂ€ure und FluorsĂ€ure) verwendet. Diese SĂ€uren sind flĂŒchtig und daher bei den angewandten Behandlungstemperaturen von 330-390°C in der flĂŒssigen Phase praktisch nicht mehr vorhanden. Sie sollen weniger den Ătzvorgang verbessern als die unter Wasserabspaltung verlaufende Bildung höher kondensierter Phosphate unterdrĂŒcken und so die Lebensdauer der PhosphorsĂ€urebĂ€der verlĂ€ngern. Dieses Verfahren hat den Nachteil, daĂ wegen der flĂŒchtigen Anteile bei den angegebenen Temperaturen DruckgefĂ€Ăe erforderlich sind.According to Japanese Patent Application Sho-61-1 51 081 for etching mixtures of aluminum oxide Phosphoric acid and an inorganic acid (nitric acid, Hydrochloric acid and fluoric acid). These acids are volatile and therefore in the applied Treatment temperatures of 330-390 ° C in the liquid Phase practically no longer exists. You are less supposed to Etching process better than that with dehydration ongoing formation of highly condensed phosphates suppress and so the lifespan of the phosphoric acid baths extend. This method has the disadvantage that because of the volatile components at the specified temperatures Pressure vessels are required.
Es bestand daher die Aufgabe ein Verfahren zu finden, mit dem sich Aluminiumoxid-Substrate ĂŒber 85% Al2O3, insbesondere ĂŒber 90%, insbesondere ĂŒber 95%, vorzugsweise ĂŒber 99% Al2O3 noch ausreichend anĂ€tzen lassen. Insbesondere sollte die Ătzung so verlaufen, daĂ die anschlieĂend aufgebrachten Metallschichten eine hohe Haftfestigkeit und optimale Strukturierbarkeit zeigten. Eine gute Haftfestigkeit ist wichtig fĂŒr die spĂ€tere Weiterverarbeitung, z. B. zum Anlöten von StromzufĂŒhrungen (lead frames) oder GehĂ€usedeckeln mittels Weich- oder Hartlot.The object was therefore to find a method with which aluminum oxide substrates over 85% Al 2 O 3 , in particular over 90%, in particular over 95%, preferably over 99% Al 2 O 3 can still be sufficiently etched. In particular, the etching should proceed in such a way that the subsequently applied metal layers showed high adhesive strength and optimal structurability. Good adhesive strength is important for later processing, e.g. B. for soldering power leads (lead frames) or housing covers using soft or hard solder.
Diese Nachteile werden durch das in Anspruch 1 angegebene erfindungsgemĂ€Ăe Verfahren behoben.These disadvantages are indicated by the claim 1 Process according to the invention eliminated.
Die nach dem Ătzen gespĂŒlte OberflĂ€che kann getrocknet oder naĂ weiter verarbeitet werden.The surface rinsed after the etching can be dried or wet processed further.
Auf der geĂ€tzten OberflĂ€che lassen sich nach dem erfindungsgemĂ€Ăen Verfahren die Metalle Silber, Gold, Palladium, Platin, Nickel, Kobalt und insbesondere Kupfer abscheiden. Die Ătztemperatur betrĂ€gt 200-300°C, vorzugsweise 200-280°C, insbesondere 200-250°C. Bei Temperaturen oberhalb von 250°C kann es zu starkem Abrauchen der SchwefelsĂ€ure kommen.After the method according to the invention the metals silver, gold, Palladium, platinum, nickel, cobalt and especially copper separate. The etching temperature is 200-300 ° C, preferably 200-280 ° C, especially 200-250 ° C. At Temperatures above 250 ° C can be too strong Coming out of sulfuric acid.
Bei Temperaturen von 220°C betrĂ€gt die Ătztemperatur vorzugsweise mindestens 20 Minuten, insbesondere mindestens 45 Minuten. Es hat sich gezeigt, daĂ die Haftfestigkeit einer auf die geĂ€tzte OberflĂ€che aufgetragenen Kupferschicht mit steigender Ătzdauer zunimmt und zwar nach der mathematischen Beziehung H = a + b · log t. Dabei bedeutet H die Haftfestigkeit und t die Dauer des Ătzens; a und b sind Konstante, die von Substrat, Temperatur und Badzusammensetzung abhĂ€ngen. Es ist gĂŒnstig fĂŒr gute Haftfestigkeitswerte, wenn die Ătzlösungen geringe Mengen Wasser enthalten, insbesondere 5-10 Gew.-%. Damit stimmt auch ĂŒberein, daĂ wĂ€hrend lĂ€ngerer Zeit gebrauchte Lösungen langsamer angreifen und (bei konstant gehaltener Einwirkungszeit) zu geringeren Haftfestigkeitswerten fĂŒhren.At temperatures of 220 ° C., the etching temperature is preferably at least 20 minutes, in particular at least 45 minutes. It has been shown that the adhesive strength of a copper layer applied to the etched surface increases with increasing etching duration, namely according to the mathematical relationship H = a + b · log t . H means the adhesive strength and t the duration of the etching; a and b are constants that depend on the substrate, temperature and bath composition. It is favorable for good adhesive strength values if the etching solutions contain small amounts of water, in particular 5-10% by weight. This also coincides with the fact that used solutions attack more slowly over a longer period of time and (with a constant exposure time) lead to lower adhesive strength values.
Es ist vorteilhaft, wenn nach dem AnĂ€tzen der SubstratflĂ€che die Keramik mit Lösungen behandelt wird, die die Adsorption von Metallkeimen begĂŒnstigen. HierfĂŒr sind im Handel "Conditioner-Lösungen" verfĂŒgbar. Damit wird die ProzeĂsicherheit erhöht und spĂ€ter der Anteil unvollkommen metallisierter Substrate vermindert.It is advantageous if after etching the substrate surface the ceramic is treated with solutions that increase the adsorption favor from metal germs. For this are on sale  "Conditioner solutions" available. With that the Process reliability increased and later the share was imperfect metallized substrates reduced.
AnschlieĂend wird das Substrat katalysiert werden. HierfĂŒr kommen insbesondere BĂ€der in Betracht, die Ionen von Metallen mit niedrigem Oxidationspotential enthalten, beispielsweise von Kupfer oder Edelmetallen wie Silber. Bevorzugt sind Lösungen die Pd++-Ionen enthalten. Verwendbar sind ferner "Katalysator"-Lösungen, die ein kolloidales Edelmetall (z. B. kolloidales Palladium) und vorzugsweise ein Schutzkolloid enthalten. Bei Verwendung kolloidaler Lösungen wird das umgebende Schutzkolloid anschlieĂend oxidativ durch einen "Aktivator" entfernt. Auch Silber- und Kupferlösungen besitzen katalytische Wirkung.The substrate will then be catalyzed. Baths which contain ions of metals with a low oxidation potential, for example of copper or precious metals such as silver, are particularly suitable for this. Solutions containing Pd ++ ions are preferred. "Catalyst" solutions that contain a colloidal noble metal (eg colloidal palladium) and preferably a protective colloid can also be used. When using colloidal solutions, the surrounding protective colloid is then oxidatively removed by an "activator". Silver and copper solutions also have a catalytic effect.
Hohe Konzentrationen an Pd2+ können sich gĂŒnstig auf die Haftfestigkeit der Metallisierungsschichten auswirken.High concentrations of Pd 2+ can have a favorable effect on the adhesive strength of the metallization layers.
Falls das Katalysator-Bad Pd++-Ionen enthĂ€lt, ist fĂŒr ihre Reduktion ein Reduktionsmittel notwendig. Das Reduktionsmittel kann bereits dem Edelmetall-Ionen enthaltenden Bad zugesetzt werden. Man kann auch das geĂ€tzte Substrat zunĂ€chst in ein Bad mit Edelmetall-Ionen ("Aktivator") und anschlieĂend in ein Bad des Reduktionsmittels ("Reduktor") eintauchen. In beiden FĂ€llen werden auf der OberflĂ€che des Substrates Keime des Edelmetalls gebildet, die die spĂ€tere Abscheidung des Metalls aus dem Metallisierungsbad gestatten.If the catalyst bath contains Pd ++ ions, a reducing agent is necessary for their reduction. The reducing agent can already be added to the bath containing noble metal ions. You can also immerse the etched substrate first in a bath with precious metal ions ("activator") and then in a bath of the reducing agent ("reductor"). In both cases, germs of the noble metal are formed on the surface of the substrate, which allow the later deposition of the metal from the metallization bath.
Vor dem Ătzen muĂ die OberflĂ€che des Substrates grĂŒndlich gereinigt werden. Dabei sind sĂ€mtliche organische Belegungen zu entfernen, z. B. durch eine Entfettung mit Trichlorethan oder eine Behandlung mit anorganischen SĂ€uren.Before etching, the surface of the substrate must be thorough getting cleaned. All organic assignments are included to remove e.g. B. by degreasing with trichloroethane or treatment with inorganic acids.
Die verwendbaren MetallisierungsbĂ€der sind dem Fachmann bekannt und im Handel verfĂŒgbar. Ein Kupfer enthaltendes Bad ist beschrieben in der US-PS 34 21 955. Die stromlose Abscheidung von Nickel und Kupfer wird beschrieben in dem Lehrbuch "Praktische Galvanotechnik, Eugen G. Lenze Verlag, Saulgau/WĂŒrtt., 1970).The metallization baths that can be used are known to the person skilled in the art known and commercially available. A copper containing bath  is described in US-PS 34 21 955. The currentless Deposition of nickel and copper is described in the Textbook "Practical Electroplating, Eugen G. Lenze Verlag, Saulgau / WĂŒrtt., 1970).
Innerhalb des angegebenen Bereichs PhosphorsĂ€ure/ SchwefelsĂ€ure ist es sinnvoll, mit steigendem Gehalt des Substrats an Aluminiumoxid den Anteil an SchwefelsĂ€ure zu erhöhen. Bei Substraten mit einem Gehalt von 95 bis 98,5% Al2O3 haben sich ĂtzbĂ€der einer Zusammensetzung PhosphorsĂ€ure/SchwefelsĂ€ure von 1 : 1 bis 3,5 : 1 bewĂ€hrt. Bei Substraten mit einem Reingehalt von mindestens 99%, vorzugsweise 99,4 bis 99,8% Al2O3 haben sich ĂtzbĂ€der mit einem GewichtsverhĂ€ltnis PhosphorsĂ€ure/SchwefelsĂ€ure von 0,8 : 1 bis 1,2 : 1 besonders bewĂ€hrt.Within the specified range of phosphoric acid / sulfuric acid, it makes sense to increase the proportion of sulfuric acid with increasing substrate alumina content. In the case of substrates with a content of 95 to 98.5% Al 2 O 3 , etching baths with a composition of phosphoric acid / sulfuric acid of 1: 1 to 3.5: 1 have proven successful. In the case of substrates with a purity of at least 99%, preferably 99.4 to 99.8% Al 2 O 3 , etching baths with a weight ratio of phosphoric acid / sulfuric acid of 0.8: 1 to 1.2: 1 have proven particularly useful.
Die Haftfestigkeit von Kupferschichten, die auf einem nach dem angegebenen Verfahren geĂ€tzten Substrat abgeschieden wurden, liegt höher als bei einer Ătzung mit reiner PhosphorsĂ€ure.The adhesive strength of copper layers on a post deposited the etched substrate is higher than with a pure etching Phosphoric acid.
WĂ€hrend es beim Ătzen der Substrate mit PhosphorsĂ€ure stets Bereiche gibt, die völlig ungeĂ€tzt sind und nicht verkupfert werden, tritt dieser Effekt bei Gemischen mit PhosphorsĂ€ure/ SchwefelsĂ€ure nur in unbedeutendem Umfang auf. Die Ausbeute an haftfest-metallisierten Substraten ist daher deutlich höher.While it is always when etching the substrates with phosphoric acid There are areas that are completely unetched and not copper-plated this effect occurs with mixtures with phosphoric acid / Only a minor amount of sulfuric acid. The yield on strongly metallized substrates is therefore clear higher.
Der Vergleich der OberflÀchenmorphologie der reinen
PhosphorsÀureÀtzung mit der GemischÀtzung aus PhosphorsÀure
und SchwefelsÀure zeigt, daà die reine PhosphorsÀure einen so
starken Korngrenzenangriff ausĂŒbt, daĂ z. T. Körner lose, d. h.
ohne Haftverbund zur Keramikmatrix, auf der OberflÀche
liegen. Dagegen erreicht man mit der GemischÀtzung ein stark
zerklĂŒftetes dreidimensionales Netzwerk, welches sehr gute
Verankerungspunkte fĂŒr die abzuscheidenden Metallschichten
bietet.
The comparison of the surface morphology of the pure phosphoric acid etching with the mixture etching of phosphoric acid and sulfuric acid shows that the pure phosphoric acid exerts such a strong grain boundary attack that, for. T. Grains lie loosely on the surface, ie without an adhesive bond to the ceramic matrix. On the other hand, the mixture etching achieves a strongly jagged three-dimensional network, which offers very good anchoring points for the metal layers to be deposited.
Die Erfindung wird durch die folgenden Beispiele nÀher erlÀutert:The invention is illustrated by the following examples explains:
Ein Aluminiumoxid-Substrat (Reingehalt 99,6% Al2O3) wurde mit Trichlorethan gereinigt und bei 160°C getrocknet. Das getrocknete Substrat wurde 20 Minuten in eine heiĂe Ătzlösung aus 50 Gew.-% PhosphorsĂ€ure (85%ig) und 50% SchwefelsĂ€ure (97%ig) bei 220°C getaucht. Danach wurde das Substrat intensiv mit warmem und kaltem Wasser gespĂŒlt und in einer Natriumcarbonat-haltigen Lösung neutralisiert. Man spĂŒlte mit Wasser unter gleichzeitiger Behandlung mit Ultraschall, um eventuell lose anhaftende Partikel von der SubstratoberflĂ€che zu entfernen.An alumina substrate (purity 99.6% Al 2 O 3 ) was cleaned with trichloroethane and dried at 160 ° C. The dried substrate was immersed in a hot etching solution of 50% by weight phosphoric acid (85%) and 50% sulfuric acid (97%) at 220 ° C. for 20 minutes. The substrate was then rinsed intensively with warm and cold water and neutralized in a solution containing sodium carbonate. It was rinsed with water with simultaneous treatment with ultrasound in order to remove any loose particles from the substrate surface.
Nach einer 30minĂŒtigen Trocknung im Trocknungsschrank bei 200°C wurde das Substrat 10 Minuten lang in eine handelsĂŒbliche Aktivatorlösung (Aktivator Neoganth, Hersteller: Schering AG) getaucht. Diese Lösung war alkalisch und enthielt ein Palladiumsalz. Nach SpĂŒlen mit entionisiertem Wasser wurde das Substrat in eine handelsĂŒbliche Reduktorlösung (Reduktor Neoganth 406, Hersteller: Schering AG) eingetaucht. Nach einer erneuten SpĂŒlung wurde das Substrat in ein Bad zur stromlosen Verkupferung eingetaucht, das Kupfersulfat, Formaldehyd, EthylendiamintetraessigsĂ€ure als Komplexbildner, Natronlauge und Stabilisatoren enthielt (Metalyt Cu 40, Firma Blasberg) und zwischen 10 und 60 Minuten metallisiert. Die so behandelten Substrate wiesen Haftfestigkeitswerte ĂŒber 15 MPa im Punktabzugstest auf.After drying in the drying cabinet for 30 minutes The substrate was placed in a 200 ° C for 10 minutes commercially available activator solution (activator neoganth, Manufacturer: Schering AG) immersed. This solution was alkaline and contained a palladium salt. After rinsing with deionized Water became a commercially available substrate Reductor solution (Neoganth 406 reductor, manufacturer: Schering AG) immersed. After rinsing again, it became Substrate immersed in a electroless copper plating bath, the copper sulfate, formaldehyde, ethylenediaminetetraacetic acid contained as complexing agents, sodium hydroxide solution and stabilizers (Metalyt Cu 40, Blasberg) and between 10 and 60 minutes metallized. The substrates treated in this way showed Adhesion strength values above 15 MPa in the point pull test.
Beispiel 1 wurde wiederholt, jedoch wurde die Temperatur der Ătzung auf 200°C abgesenkt. Der Wert der Haftfestigkeit erniedrigte sich. Example 1 was repeated, but the temperature was Etching reduced to 200 ° C. The value of the adhesive strength degraded. Â
Beispiel 1 wurde bei einer Ătztemperatur von 175°C wiederholt. Es zeigte sich, daĂ die abgeschiedene Kupferschicht auf dem Substrat nicht haftete.Example 1 was at an etching temperature of 175 ° C repeated. It turned out that the separated Copper layer did not adhere to the substrate.
Beispiel 1 wurde wiederholt mit einem Substrat aus 96%igem Aluminiumoxid und einer Ătzlösung aus 3 Teilen PhosphorsĂ€ure und 1 Teil SchwefelsĂ€ure. Auch mit dieser Behandlung wurden Haftfestigkeitswerte von ĂŒber 15 MPa im Punktabzugstest erreicht.Example 1 was repeated with a 96% substrate Aluminum oxide and an etching solution of 3 parts phosphoric acid and 1 part sulfuric acid. Even with this treatment Adhesive strength values of over 15 MPa in the point pull test reached.
Beispiel 1 wurde wiederholt mit einer handelsĂŒblichen Katalysatorlösung, die kolloidales Palladium enthielt. Der mittlere Haftfestigkeitswert war etwas geringer als in Beispiel 1.Example 1 was repeated with a commercially available Catalyst solution containing colloidal palladium. The average adhesive strength value was slightly lower than in Example 1.
Beispiel 1 wurde wiederholt, jedoch wurde eine Kupfer enthaltende Katalysatorlösung verwendet. Die Haftfestigkeitswerte lagen ĂŒber 15 MPa.Example 1 was repeated, but became a copper containing catalyst solution used. The adhesive strength values were over 15 MPa.
Das Substrat wurde wie im Beispiel 1 behandelt, jedoch wurde der Trockenschritt nach dem Ătzen durch Behandlung wĂ€hrend 6 Minuten mit einer handelsĂŒblichen Conditionerlösung (Blasolit-MSH, Firma Blasberg, Solingen) ersetzt. Diese Lösung enthielt ein Netzmittel. Der ionogene Pd-Katalysator von Beispiel 1 wurde ersetzt durch eine Katalysatorlösung mit kolloidalem Palladium ("Katalysatorlösung K 125", Firma Blasberg). Die ermittelten Haftfestigkeitswerte lagen etwas höher als im Beispiel 1.The substrate was treated as in Example 1, but was the drying step after the etching by treatment during 6 Minutes with a commercially available conditioner solution (Blasolit-MSH, Blasberg, Solingen) replaced. These Solution contained a wetting agent. The ionic Pd catalyst of Example 1 was replaced by a catalyst solution  with colloidal palladium ("catalyst solution K 125", company Blasberg). The determined adhesive strength values were somewhat higher than in example 1.
Die Haftfestigkeitswerte wurden mit einem sogenannten Punktabzugstest ermittelt. Da die Lagerung der Substrate einen EinfluĂ auf die Haftfestigkeit ausĂŒbt, wurden die Zugversuche jeweils eine Woche nach der Metallisierung der Proben durchgefĂŒhrt.The adhesive strength values were determined using a so-called Deduction test determined. Because the storage of the substrates has an influence on the adhesive strength, the Tensile tests one week after the metallization of the Rehearsals performed.
Hierzu werden mit einer konstanten Abzugsgeschwindigkeit von 0,25 mm/sek die auf die Kupfersubstrate aufgelöteten Kontaktstifte, die einen Durchmesser von 2,5 mm besitzen, in einer Zugmaschine abgezogen. Die benötigte Kraft (gemessen in N) geteilt durch die AbzugsflÀche (4,9 mm2) ergibt die Haftfestigkeit in N/mm2 (=MPa).For this purpose, the contact pins, which have a diameter of 2.5 mm and are soldered onto the copper substrates, are removed in a tractor at a constant removal speed of 0.25 mm / sec. The force required (measured in N) divided by the peel area (4.9 mm 2 ) gives the adhesive strength in N / mm 2 (= MPa).
Substrate (99,6% Al2O3) wurden 60 Minuten mit H2SO4/H3PO4 (1 : 1) bei 200°C geÀtzt. Aktivierung durch "Ronamet-Ronacat Activator", Hersteller: LeaRonal GmbH (7534 Birkenfeld 2). Katalyse mittels "Ronamet-Catayst M" (Hersteller: LeaRonal GmbH), enthaltend kolloidales Kupfer.Substrates (99.6% Al 2 O 3 ) were etched with H 2 SO 4 / H 3 PO 4 (1: 1) at 200 ° C for 60 minutes. Activation by "Ronamet-Ronacat Activator", manufacturer: LeaRonal GmbH (7534 Birkenfeld 2). Catalysis using "Ronamet-Catayst M" (manufacturer: LeaRonal GmbH), containing colloidal copper.
Nach Entfernung ĂŒberschĂŒssigen Katalysators wurde mit einem Dickkupferbad ("Ronamet-Ronadep 100", Hersteller LeaRonal GmbH) Kupfer (ca. 10 ”m) abgeschieden.After removal of excess catalyst, a Thick copper bath ("Ronamet-Ronadep 100", manufacturer LeaRonal GmbH) copper (approx. 10 ”m) deposited.
Der Punktabzugstest lieferte Haftfestigkeiten von im Mittel 19,3 MPa (Mittelwert, Standardabweichung 0,4 MPa). The point deduction test gave adhesive strengths of on average 19.3 MPa (mean, standard deviation 0.4 MPa). Â
Beispiel 8 wurde wiederholt jedoch wurde mit reiner PhosphorsÀure (87 Gew.-%) bei 220°C geÀtzt. Die mittlere Haftfestigkeit betrug 12 MPa (Standardabweichung 2,5 MPa). Dies zeigt, daà trotz höherer Temperatur die reine PhosphorsÀure dem Gemisch H3PO4/H2SO4 unterlegen war.Example 8 was repeated but was etched with pure phosphoric acid (87% by weight) at 220 ° C. The average adhesive strength was 12 MPa (standard deviation 2.5 MPa). This shows that, despite the higher temperature, the pure phosphoric acid was inferior to the H 3 PO 4 / H 2 SO 4 mixture.
Beispiel 8 wurde mit verringerten Ătzzeiten wiederholt. Bei Ătzzeiten von 30 min verringerte sich die Haftfestigkeit auf 16,5 MPa, bei Ătzzeiten von nur 10 min auf 13,8 MPa.Example 8 was repeated with reduced etching times. At Etching times of 30 minutes reduced the adhesive strength 16.5 MPa, with etching times from only 10 min to 13.8 MPa.
Claims (10)
- a) das Substrat mit einem Gemisch aus PhosphorsÀure und einer anorganischen SÀure bei erhöhter Temperatur anÀtzt,
- b) das Substrat spĂŒlt,
- c) das Substrat gegebenenfalls trocknet,
- d) das Substrat in ein Edelmetall oder Kupfer enthaltendes Bad eintaucht,
- e) das Substrat spĂŒlt und
- f) in einem Metallisierungsbad chemisch metallisiert,
- a) etching the substrate with a mixture of phosphoric acid and an inorganic acid at elevated temperature,
- b) rinsing the substrate,
- c) if necessary, drying the substrate,
- d) immersing the substrate in a bath containing precious metal or copper,
- e) rinsing the substrate and
- f) chemically metallized in a metallization bath,
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19883833441 DE3833441A1 (en) | 1988-10-01 | 1988-10-01 | Process for metallising aluminium oxide substrates |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19883833441 DE3833441A1 (en) | 1988-10-01 | 1988-10-01 | Process for metallising aluminium oxide substrates |
Publications (1)
Publication Number | Publication Date |
---|---|
DE3833441A1 true DE3833441A1 (en) | 1990-04-05 |
Family
ID=6364189
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE19883833441 Withdrawn DE3833441A1 (en) | 1988-10-01 | 1988-10-01 | Process for metallising aluminium oxide substrates |
Country Status (1)
Country | Link |
---|---|
DE (1) | DE3833441A1 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE4113263A1 (en) * | 1991-04-23 | 1992-10-29 | Siemens Ag | Copper@-coating of ceramic parts by electroless plating - used for metallisation of dielectric or coaxial resonators |
CN114804920A (en) * | 2021-01-18 | 2022-07-29 | æ±èç§æČ蟟ććŻŒäœç§ææéć Źćž | Novel high-temperature phosphoric acid etching machine and control mode thereof |
Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3296012A (en) * | 1965-04-30 | 1967-01-03 | Corning Glass Works | Electroless copper plating on ceramic material |
US3690921A (en) * | 1970-12-07 | 1972-09-12 | Ibm | Method for strongly adhering a metal film on ceramic substrates |
DE2605582B2 (en) * | 1975-02-18 | 1979-04-19 | Western Electric Co., Inc., New York, N.Y. (V.St.A.) | Process for etching a substrate surface made of lithium niobate |
DE3421989A1 (en) * | 1983-06-09 | 1984-12-13 | Kollmorgen Technologies Corp., Dallas, Tex. | METHOD FOR METALLIZING CERAMIC SURFACES |
DE3345353A1 (en) * | 1983-12-15 | 1985-08-29 | Licentia Patent-Verwaltungs-Gmbh, 6000 Frankfurt | Process and metallisation of a ceramic surface |
DE3523956A1 (en) * | 1985-07-04 | 1987-01-08 | Licentia Gmbh | METHOD FOR CHEMICALLY METALLIZING AN ELECTRICALLY POOR CONDUCTING BODY FROM AN INORGANIC MATERIAL |
DE3632513A1 (en) * | 1986-09-22 | 1988-03-24 | Schering Ag | METHOD FOR ADHESIVE GALVANIZING OF CERAMIC MATERIALS |
DE3421988C2 (en) * | 1983-06-09 | 1988-09-22 | Kollmorgen Technologies Corp., Dallas, Tex., Us | |
DE3737757C2 (en) * | 1986-11-08 | 1990-06-13 | Matsushita Electric Works, Ltd., Kadoma, Osaka, Jp | |
DE3744747C2 (en) * | 1986-11-08 | 1990-11-08 | Matsushita Electric Works, Ltd., Kadoma, Osaka, Jp | Ceramic substrates with chemically roughened surfaces |
-
1988
- 1988-10-01 DE DE19883833441 patent/DE3833441A1/en not_active Withdrawn
Patent Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3296012A (en) * | 1965-04-30 | 1967-01-03 | Corning Glass Works | Electroless copper plating on ceramic material |
US3690921A (en) * | 1970-12-07 | 1972-09-12 | Ibm | Method for strongly adhering a metal film on ceramic substrates |
DE2605582B2 (en) * | 1975-02-18 | 1979-04-19 | Western Electric Co., Inc., New York, N.Y. (V.St.A.) | Process for etching a substrate surface made of lithium niobate |
DE3421989A1 (en) * | 1983-06-09 | 1984-12-13 | Kollmorgen Technologies Corp., Dallas, Tex. | METHOD FOR METALLIZING CERAMIC SURFACES |
DE3421988C2 (en) * | 1983-06-09 | 1988-09-22 | Kollmorgen Technologies Corp., Dallas, Tex., Us | |
DE3345353A1 (en) * | 1983-12-15 | 1985-08-29 | Licentia Patent-Verwaltungs-Gmbh, 6000 Frankfurt | Process and metallisation of a ceramic surface |
DE3523956A1 (en) * | 1985-07-04 | 1987-01-08 | Licentia Gmbh | METHOD FOR CHEMICALLY METALLIZING AN ELECTRICALLY POOR CONDUCTING BODY FROM AN INORGANIC MATERIAL |
DE3632513A1 (en) * | 1986-09-22 | 1988-03-24 | Schering Ag | METHOD FOR ADHESIVE GALVANIZING OF CERAMIC MATERIALS |
DE3737757C2 (en) * | 1986-11-08 | 1990-06-13 | Matsushita Electric Works, Ltd., Kadoma, Osaka, Jp | |
DE3744747C2 (en) * | 1986-11-08 | 1990-11-08 | Matsushita Electric Works, Ltd., Kadoma, Osaka, Jp | Ceramic substrates with chemically roughened surfaces |
Non-Patent Citations (6)
Title |
---|
88-158931/23 * |
88-179653/26 * |
Derwent-Referat: 88-158930/26 * |
u.a.: Etching of High Alumina Ceramics to Promote Copper Adhesion. In: J. Electrochem. Soc.: ELECTROCHEMICAL SCIENCE AND TECHNOLOGY, Vol.120, No.11, 1973, S.1518-1522 * |
US-Z: AMEEN, J.G. * |
US-Z: BAUDRAND,Donald W.: Cleaning and Preparationof Ceramic And Metallized Ceramic Materials for Plating. In: PLATING AND SURFACE FINISHING, Okt. 1984, S.72-75 * |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE4113263A1 (en) * | 1991-04-23 | 1992-10-29 | Siemens Ag | Copper@-coating of ceramic parts by electroless plating - used for metallisation of dielectric or coaxial resonators |
CN114804920A (en) * | 2021-01-18 | 2022-07-29 | æ±èç§æČ蟟ććŻŒäœç§ææéć Źćž | Novel high-temperature phosphoric acid etching machine and control mode thereof |
CN114804920B (en) * | 2021-01-18 | 2024-03-15 | æ±èç§æČ蟟ććŻŒäœç§ææéć Źćž | Novel high-temperature phosphoric acid corrosion machine and control mode thereof |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
DE69728812T2 (en) | Method for increasing the solderability of a surface | |
DE3706951C2 (en) | ||
DE2014285C3 (en) | Process for preparing aluminum or aluminum alloy surfaces for electroless nickel plating | |
EP0209748B1 (en) | Process for chemically treating ceramic work pieces for subsequent metallization | |
DE2630151A1 (en) | PROCESS FOR THE PRODUCTION OF A COATING OF COPPER ON ALUMINUM | |
DE3110415C2 (en) | Process for the manufacture of printed circuit boards | |
DE3827893C2 (en) | ||
DE4032232C2 (en) | Process for electroless deposition of a metal on an aluminum substrate | |
DE3343052C2 (en) | Process for electroless gold plating of a metallized ceramic substrate | |
DE3833441A1 (en) | Process for metallising aluminium oxide substrates | |
EP1478607B1 (en) | Method for metallizing titanate-based ceramics | |
DE3814224C1 (en) | Process for pretreating aluminium nitride ceramic to be metallised | |
DE3345353A1 (en) | Process and metallisation of a ceramic surface | |
DE3137587C2 (en) | ||
DE1521080A1 (en) | Process for the application of metallic surface layers on workpieces made of titanium | |
DE1496899C3 (en) | Process for electroplating aluminum and aluminum alloys | |
DE2946343C2 (en) | Process for pretreating the surface of polyamide substrates for chemical metallization | |
DE4113263A1 (en) | Copper@-coating of ceramic parts by electroless plating - used for metallisation of dielectric or coaxial resonators | |
DE2448148C3 (en) | ||
DE19540122C2 (en) | Electroless plating method and its application | |
DE4228442C1 (en) | Electroless nickel@ coating of metallised ceramic - using treatment to activate only the metallised areas and avoid unwanted coating of ceramic areas | |
DE1621207C3 (en) | Aqueous bath and process for the germination of plastic surfaces with palladium | |
DE1621207B2 (en) | Aqueous bath and process for the germination of plastic surfaces with palladium | |
DE1812040C3 (en) | Process for chemical nickel plating of the surfaces of aluminum and aluminum alloys | |
DE1910106C3 (en) | Process for the pretreatment of dielectric materials prior to electroless nickel-boron deposition |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
8101 | Request for examination as to novelty | ||
8105 | Search report available | ||
8127 | New person/name/address of the applicant |
Owner name: HOECHST CERAMTEC AG, 95100 SELB, DE |
|
8110 | Request for examination paragraph 44 | ||
8130 | Withdrawal |