DE3786227T2 - Oberflächeninterferometer. - Google Patents

Oberflächeninterferometer.

Info

Publication number
DE3786227T2
DE3786227T2 DE19873786227 DE3786227T DE3786227T2 DE 3786227 T2 DE3786227 T2 DE 3786227T2 DE 19873786227 DE19873786227 DE 19873786227 DE 3786227 T DE3786227 T DE 3786227T DE 3786227 T2 DE3786227 T2 DE 3786227T2
Authority
DE
Germany
Prior art keywords
surface interferometer
interferometer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE19873786227
Other languages
English (en)
Other versions
DE3786227D1 (de
Inventor
Gregory Allen Northrop
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of DE3786227D1 publication Critical patent/DE3786227D1/de
Application granted granted Critical
Publication of DE3786227T2 publication Critical patent/DE3786227T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G01B11/161—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02015—Interferometers characterised by the beam path configuration
    • G01B9/02017—Interferometers characterised by the beam path configuration with multiple interactions between the target object and light beams, e.g. beam reflections occurring from different locations
    • G01B9/02019—Interferometers characterised by the beam path configuration with multiple interactions between the target object and light beams, e.g. beam reflections occurring from different locations contacting different points on same face of object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02015—Interferometers characterised by the beam path configuration
    • G01B9/02027—Two or more interferometric channels or interferometers
    • G01B9/02028—Two or more reference or object arms in one interferometer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02097—Self-interferometers
DE19873786227 1986-11-07 1987-09-25 Oberflächeninterferometer. Expired - Fee Related DE3786227T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US92849686A 1986-11-07 1986-11-07

Publications (2)

Publication Number Publication Date
DE3786227D1 DE3786227D1 (de) 1993-07-22
DE3786227T2 true DE3786227T2 (de) 1993-12-02

Family

ID=25456316

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19873786227 Expired - Fee Related DE3786227T2 (de) 1986-11-07 1987-09-25 Oberflächeninterferometer.

Country Status (3)

Country Link
EP (1) EP0266539B1 (de)
JP (1) JPS63124901A (de)
DE (1) DE3786227T2 (de)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2516277A (en) * 2013-07-17 2015-01-21 Cambridge Consultants Optical apparatus and methods
WO2015008074A1 (en) * 2013-07-17 2015-01-22 Cambridge Consultants Limited Optical apparatus and methods
GB2516281A (en) * 2013-07-17 2015-01-21 Cambridge Consultants Optical apparatus and methods

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3832063A (en) * 1972-02-01 1974-08-27 Canon Kk Lens axis detection using an interferometer
US3788746A (en) * 1972-10-02 1974-01-29 Hewlett Packard Co Optical dilatometer
JPS567006A (en) * 1979-06-22 1981-01-24 Ibm Method of extending measurement range of interference
SE435966B (sv) * 1982-02-02 1984-10-29 Asea Ab Fiberoptiskt metdon
US4512661A (en) * 1982-09-02 1985-04-23 The United States Of America As Represented By The Aministration Of The National Aeronautics And Space Administration Dual differential interferometer

Also Published As

Publication number Publication date
EP0266539B1 (de) 1993-06-16
DE3786227D1 (de) 1993-07-22
EP0266539A2 (de) 1988-05-11
EP0266539A3 (de) 1991-08-07
JPS63124901A (ja) 1988-05-28

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee