DE3779568D1 - Optische vorrichtung zur beleuchtung einer probe in einem spektralellipsometer mit hoher seitlicher aufloesung. - Google Patents

Optische vorrichtung zur beleuchtung einer probe in einem spektralellipsometer mit hoher seitlicher aufloesung.

Info

Publication number
DE3779568D1
DE3779568D1 DE8787201918T DE3779568T DE3779568D1 DE 3779568 D1 DE3779568 D1 DE 3779568D1 DE 8787201918 T DE8787201918 T DE 8787201918T DE 3779568 T DE3779568 T DE 3779568T DE 3779568 D1 DE3779568 D1 DE 3779568D1
Authority
DE
Germany
Prior art keywords
spectralellipsometer
lighting
sample
optical device
lateral resolution
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE8787201918T
Other languages
English (en)
Other versions
DE3779568T2 (de
Inventor
Marko Societe Civile S P Erman
Claude Societe Civile S P Hily
Bris Jean Societe Civile S Le
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Philips Gloeilampenfabrieken NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Gloeilampenfabrieken NV filed Critical Philips Gloeilampenfabrieken NV
Application granted granted Critical
Publication of DE3779568D1 publication Critical patent/DE3779568D1/de
Publication of DE3779568T2 publication Critical patent/DE3779568T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0208—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using focussing or collimating elements, e.g. lenses or mirrors; performing aberration correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/04—Slit arrangements slit adjustment
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G01N21/211—Ellipsometry

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)
DE8787201918T 1986-10-10 1987-10-07 Optische vorrichtung zur beleuchtung einer probe in einem spektralellipsometer mit hoher seitlicher aufloesung. Expired - Fee Related DE3779568T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8614123A FR2605100B1 (fr) 1986-10-10 1986-10-10 Dispositif optique d'eclairement d'un echantillon pour un ellipsometre spectroscopique a haute resolution laterale

Publications (2)

Publication Number Publication Date
DE3779568D1 true DE3779568D1 (de) 1992-07-09
DE3779568T2 DE3779568T2 (de) 1993-01-21

Family

ID=9339748

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8787201918T Expired - Fee Related DE3779568T2 (de) 1986-10-10 1987-10-07 Optische vorrichtung zur beleuchtung einer probe in einem spektralellipsometer mit hoher seitlicher aufloesung.

Country Status (5)

Country Link
US (1) US4790659A (de)
EP (1) EP0267634B1 (de)
JP (1) JPS63127133A (de)
DE (1) DE3779568T2 (de)
FR (1) FR2605100B1 (de)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5042951A (en) * 1989-09-19 1991-08-27 Therma-Wave, Inc. High resolution ellipsometric apparatus
US5706212A (en) * 1996-03-20 1998-01-06 Board Of Regents Of University Of Nebraska Infrared ellipsometer/polarimeter system, method of calibration, and use thereof
DE4301889A1 (de) * 1993-01-14 1994-07-21 Sentech Instr Gmbh Verfahren zum Bestimmen charakteristischer Größen transparenter Schichten mit Hilfe der Ellipsometrie
US6734967B1 (en) * 1995-01-19 2004-05-11 Kla-Tencor Technologies Corporation Focused beam spectroscopic ellipsometry method and system
US5608526A (en) * 1995-01-19 1997-03-04 Tencor Instruments Focused beam spectroscopic ellipsometry method and system
US5581350A (en) * 1995-06-06 1996-12-03 Tencor Instruments Method and system for calibrating an ellipsometer
US7301631B1 (en) 2004-09-17 2007-11-27 J.A. Woollam Co., Inc. Control of uncertain angle of incidence of beam from Arc lamp
US6483580B1 (en) 1998-03-06 2002-11-19 Kla-Tencor Technologies Corporation Spectroscopic scatterometer system
US20020030813A1 (en) * 1999-03-29 2002-03-14 Norton Adam E. Spectroscopic measurement system using an off-axis spherical mirror and refractive elements
JP4168543B2 (ja) * 1998-10-08 2008-10-22 株式会社ニコン 光学特性測定ユニット
US6184984B1 (en) 1999-02-09 2001-02-06 Kla-Tencor Corporation System for measuring polarimetric spectrum and other properties of a sample
US6784991B2 (en) * 2001-06-18 2004-08-31 Therma-Wave, Inc. Diffractive optical elements and grid polarizers in focusing spectroscopic ellipsometers
JP4938219B2 (ja) * 2001-12-19 2012-05-23 ケーエルエー−テンカー コーポレイション 光学分光システムを使用するパラメトリック・プロフィーリング
US7050162B2 (en) 2002-01-16 2006-05-23 Therma-Wave, Inc. Optical metrology tool having improved contrast
US8189193B1 (en) 2004-04-23 2012-05-29 J.A. Woollam Co., Inc. System and method of applying horizontally oriented arc-lamps in ellipsometer or the like systems
US7738105B1 (en) 2004-04-23 2010-06-15 Liphardt Martin M System and method of applying horizontally oriented arc-lamps in ellipsometer or the like systems
US7515253B2 (en) 2005-01-12 2009-04-07 Kla-Tencor Technologies Corporation System for measuring a sample with a layer containing a periodic diffracting structure
US10018815B1 (en) 2014-06-06 2018-07-10 J.A. Woolam Co., Inc. Beam focusing and reflective optics
US10338362B1 (en) 2014-06-06 2019-07-02 J.A. Woollam Co., Inc. Beam focusing and reflecting optics with enhanced detector system
US9442016B2 (en) 2014-06-06 2016-09-13 J.A. Woollam Co., Inc Reflective focusing optics
US9921395B1 (en) 2015-06-09 2018-03-20 J.A. Woollam Co., Inc. Beam focusing and beam collecting optics with wavelength dependent filter element adjustment of beam area

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3521957A (en) * 1965-09-01 1970-07-28 Yissum Res Dev Co Grazing incidence spectroscopic methods and apparatus
JPS5011266B1 (de) * 1968-12-31 1975-04-30

Also Published As

Publication number Publication date
DE3779568T2 (de) 1993-01-21
EP0267634A1 (de) 1988-05-18
FR2605100B1 (fr) 1988-12-09
JPS63127133A (ja) 1988-05-31
FR2605100A1 (fr) 1988-04-15
US4790659A (en) 1988-12-13
EP0267634B1 (de) 1992-06-03

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: PHILIPS ELECTRONICS N.V., EINDHOVEN, NL

8339 Ceased/non-payment of the annual fee