DE3766054D1 - Nichtfluechtiges speichersystem mit testmoeglichkeit. - Google Patents

Nichtfluechtiges speichersystem mit testmoeglichkeit.

Info

Publication number
DE3766054D1
DE3766054D1 DE8787901871T DE3766054T DE3766054D1 DE 3766054 D1 DE3766054 D1 DE 3766054D1 DE 8787901871 T DE8787901871 T DE 8787901871T DE 3766054 T DE3766054 T DE 3766054T DE 3766054 D1 DE3766054 D1 DE 3766054D1
Authority
DE
Germany
Prior art keywords
storage system
volatile storage
test possibility
possibility
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE8787901871T
Other languages
English (en)
Inventor
David Eby
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SK Hynix Inc
NCR International Inc
Original Assignee
NCR Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US06/834,995 external-priority patent/US4658380A/en
Application filed by NCR Corp filed Critical NCR Corp
Application granted granted Critical
Publication of DE3766054D1 publication Critical patent/DE3766054D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

DE8787901871T 1986-02-28 1987-02-12 Nichtfluechtiges speichersystem mit testmoeglichkeit. Expired - Lifetime DE3766054D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US06/834,995 US4658380A (en) 1986-02-28 1986-02-28 CMOS memory margining control circuit for a nonvolatile memory
PCT/US1987/000298 WO1987005432A1 (en) 1986-02-28 1987-02-12 Nonvolatile memory system having a testing capability

Publications (1)

Publication Number Publication Date
DE3766054D1 true DE3766054D1 (de) 1990-12-13

Family

ID=26775518

Family Applications (2)

Application Number Title Priority Date Filing Date
DE1987901871 Pending DE259444T1 (de) 1986-02-28 1987-02-12 Nichtfluechtiges speichersystem mit testmoeglichkeit.
DE8787901871T Expired - Lifetime DE3766054D1 (de) 1986-02-28 1987-02-12 Nichtfluechtiges speichersystem mit testmoeglichkeit.

Family Applications Before (1)

Application Number Title Priority Date Filing Date
DE1987901871 Pending DE259444T1 (de) 1986-02-28 1987-02-12 Nichtfluechtiges speichersystem mit testmoeglichkeit.

Country Status (1)

Country Link
DE (2) DE259444T1 (de)

Also Published As

Publication number Publication date
DE259444T1 (de) 1988-09-01

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: NCR INTERNATIONAL INC., DAYTON, OHIO, US

8328 Change in the person/name/address of the agent

Free format text: KAHLER, K., DIPL.-ING., 8948 MINDELHEIM KAECK, J., DIPL.-ING. DIPL.-WIRTSCH.-ING., 8910 LANDSBERG FIENER, J., PAT.-ANWAELTE, 8948 MINDELHEIM

8327 Change in the person/name/address of the patent owner

Owner name: AT&T GLOBAL INFORMATION SOLUTIONS INTERNATIONAL IN

8327 Change in the person/name/address of the patent owner

Owner name: AT&T GLOBAL INFORMATION SOLUTIONS INTERNATIONAL IN

8327 Change in the person/name/address of the patent owner

Owner name: NCR INTERNATIONAL, INC. (N.D.GES.D.STAATES DELAWAR

8327 Change in the person/name/address of the patent owner

Owner name: NCR INTERNATIONAL, INC. (N.D.GES.D.STAATES DELAWAR

8328 Change in the person/name/address of the agent

Free format text: V. BEZOLD & SOZIEN, 80799 MUENCHEN

8339 Ceased/non-payment of the annual fee
8327 Change in the person/name/address of the patent owner

Owner name: HYNIX SEMICONDUCTOR INC., ICHON, KYONGGI, KR

Owner name: NCR INTERNATIONAL, INC. (N.D.GES.D.STAATES DEL, US