DE3751180D1 - Abbildender Kohärenzmesser. - Google Patents
Abbildender Kohärenzmesser.Info
- Publication number
- DE3751180D1 DE3751180D1 DE3751180T DE3751180T DE3751180D1 DE 3751180 D1 DE3751180 D1 DE 3751180D1 DE 3751180 T DE3751180 T DE 3751180T DE 3751180 T DE3751180 T DE 3751180T DE 3751180 D1 DE3751180 D1 DE 3751180D1
- Authority
- DE
- Germany
- Prior art keywords
- imaging
- coherence
- meter
- coherence meter
- imaging coherence
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000003384 imaging method Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
- G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S3/00—Direction-finders for determining the direction from which infrasonic, sonic, ultrasonic, or electromagnetic waves, or particle emission, not having a directional significance, are being received
- G01S3/78—Direction-finders for determining the direction from which infrasonic, sonic, ultrasonic, or electromagnetic waves, or particle emission, not having a directional significance, are being received using electromagnetic waves other than radio waves
- G01S3/782—Systems for determining direction or deviation from predetermined direction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
- G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
- G01J2009/0211—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods for measuring coherence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
- G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
- G01J2009/0249—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods with modulation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J3/26—Generating the spectrum; Monochromators using multiple reflection, e.g. Fabry-Perot interferometer, variable interference filters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
- G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
- G01J9/0246—Measuring optical wavelength
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Engineering & Computer Science (AREA)
- Radar, Positioning & Navigation (AREA)
- Remote Sensing (AREA)
- Spectrometry And Color Measurement (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US06/884,694 US4735507A (en) | 1986-07-11 | 1986-07-11 | Imaging coherent radiometer |
Publications (2)
Publication Number | Publication Date |
---|---|
DE3751180D1 true DE3751180D1 (de) | 1995-04-27 |
DE3751180T2 DE3751180T2 (de) | 1995-07-27 |
Family
ID=25385164
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE3751180T Expired - Fee Related DE3751180T2 (de) | 1986-07-11 | 1987-07-10 | Abbildender Kohärenzmesser. |
Country Status (3)
Country | Link |
---|---|
US (1) | US4735507A (de) |
EP (1) | EP0256300B1 (de) |
DE (1) | DE3751180T2 (de) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB8727446D0 (en) * | 1987-11-24 | 1988-11-16 | British Aerospace | Electro-optic imaging system |
US5225888A (en) * | 1990-12-26 | 1993-07-06 | International Business Machines Corporation | Plasma constituent analysis by interferometric techniques |
US5245408A (en) * | 1991-01-11 | 1993-09-14 | The United States Of America As Represented By The Director, National Security Agency | Electro-optic coherent light detector |
JPH0719965A (ja) * | 1993-06-30 | 1995-01-20 | Ando Electric Co Ltd | 光波長計 |
EP0767361B1 (de) * | 1993-07-22 | 2000-02-23 | Applied Spectral Imaging Ltd. | Verfahren und Vorrichtung zur Spektralen Bilderfassung |
WO1995024621A1 (en) * | 1994-03-09 | 1995-09-14 | The Secretary Of State For Defence | Coherence imaging system |
EP0754955A1 (de) * | 1995-07-19 | 1997-01-22 | Optosys Ag | Verfahren zur differentiellen Messung des Einfallswinkels eines Lichtstrahles und Vorrichtung zur Durchführung des Verfahrens |
US7154659B1 (en) * | 2002-04-18 | 2006-12-26 | General Photonics Corporation | Optical depolarizers and DGD generators based on optical delay |
US7586584B2 (en) * | 2005-11-10 | 2009-09-08 | Elbit Systems Ltd. | Determination of range to a coherent light source using laser speckle pattern |
US7675610B2 (en) * | 2007-04-05 | 2010-03-09 | The United States Of America As Represented By The Secretary Of The Army | Photon counting, chirped AM LADAR system and related methods |
Family Cites Families (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4147424A (en) * | 1967-01-16 | 1979-04-03 | Itek Corporation | Radiation discrimination system |
US3582212A (en) * | 1968-08-27 | 1971-06-01 | Zeiss Jena Veb Carl | Fabry-perot resonators |
US3612691A (en) * | 1969-02-07 | 1971-10-12 | Sanders Associates Inc | Monchromaticity detector |
US3644046A (en) * | 1969-04-02 | 1972-02-22 | Owens Illinois Inc | Method and apparatus for measuring interferometer fringe patterns |
NL7010130A (de) * | 1970-07-09 | 1972-01-11 | ||
US3694088A (en) * | 1971-01-25 | 1972-09-26 | Bell Telephone Labor Inc | Wavefront measurement |
US3824018A (en) * | 1971-09-10 | 1974-07-16 | Perkin Elmer Corp | Coherent light source detector |
FR2163861A5 (de) * | 1971-12-03 | 1973-07-27 | Anvar | |
US3873207A (en) * | 1973-03-09 | 1975-03-25 | Xerox Corp | Polarizing interferometer |
FR2309846A1 (fr) * | 1974-11-14 | 1976-11-26 | Anvar | Procede et dispositif de determination du nombre d'ondes de rayonnements optiques et application a l'asservissement de lasers |
US4053231A (en) * | 1975-12-18 | 1977-10-11 | Nasa | Interferometer mirror tilt correcting system |
US4309108A (en) * | 1977-01-17 | 1982-01-05 | The Perkin-Elmer Corporation | Analyzer for coherent radiation |
US4536089A (en) * | 1977-01-17 | 1985-08-20 | The Perkin-Elmer Corporation | Analyzer for coherent radiation |
US4170416A (en) * | 1977-01-17 | 1979-10-09 | The Perkin-Elmer Corporation | Apparatus for analyzing coherent radiation |
FR2428829A1 (fr) * | 1978-06-16 | 1980-01-11 | Comp Generale Electricite | Dispositif de mesure de la fonction de coherence mutuelle d'un faisceau laser |
US4346999A (en) * | 1980-09-29 | 1982-08-31 | Rockwell International Corporation | Digital heterodyne wavefront analyzer |
US4600307A (en) * | 1983-07-29 | 1986-07-15 | The Perkin-Elmer Corporation | Coherent radiation detecting apparatus |
US4595292A (en) * | 1983-07-29 | 1986-06-17 | The Perkin-Elmer Corporation | Apparatus for detecting coherent radiation and unequal path interferometers |
US4594002A (en) * | 1984-07-05 | 1986-06-10 | The Perkin-Elmer Corporation | Apparatus for analyzing coherent radiation |
-
1986
- 1986-07-11 US US06/884,694 patent/US4735507A/en not_active Expired - Lifetime
-
1987
- 1987-07-10 DE DE3751180T patent/DE3751180T2/de not_active Expired - Fee Related
- 1987-07-10 EP EP87110016A patent/EP0256300B1/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP0256300B1 (de) | 1995-03-22 |
US4735507A (en) | 1988-04-05 |
EP0256300A3 (en) | 1990-03-14 |
EP0256300A2 (de) | 1988-02-24 |
DE3751180T2 (de) | 1995-07-27 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |