DE3686795D1 - Schaltung zur erleichterung der evaluation. - Google Patents

Schaltung zur erleichterung der evaluation.

Info

Publication number
DE3686795D1
DE3686795D1 DE8686109824T DE3686795T DE3686795D1 DE 3686795 D1 DE3686795 D1 DE 3686795D1 DE 8686109824 T DE8686109824 T DE 8686109824T DE 3686795 T DE3686795 T DE 3686795T DE 3686795 D1 DE3686795 D1 DE 3686795D1
Authority
DE
Germany
Prior art keywords
circuit
easier evaluation
easier
evaluation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE8686109824T
Other languages
English (en)
Other versions
DE3686795T2 (de
Inventor
Toshijuki Yaguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Publication of DE3686795D1 publication Critical patent/DE3686795D1/de
Application granted granted Critical
Publication of DE3686795T2 publication Critical patent/DE3686795T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3177—Testing of logic operation, e.g. by logic analysers

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
DE19863686795 1985-08-23 1986-07-17 Schaltung zur erleichterung der evaluation. Expired - Fee Related DE3686795T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60184040A JPS6244674A (ja) 1985-08-23 1985-08-23 評価容易化回路

Publications (2)

Publication Number Publication Date
DE3686795D1 true DE3686795D1 (de) 1992-10-29
DE3686795T2 DE3686795T2 (de) 1993-03-25

Family

ID=16146305

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19863686795 Expired - Fee Related DE3686795T2 (de) 1985-08-23 1986-07-17 Schaltung zur erleichterung der evaluation.

Country Status (3)

Country Link
EP (1) EP0212268B1 (de)
JP (1) JPS6244674A (de)
DE (1) DE3686795T2 (de)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01213780A (ja) * 1988-02-23 1989-08-28 Nippon Kinsen Kikai Kk 金銭取出装置
DE3886038T2 (de) * 1988-07-13 1994-05-19 Philips Nv Speichergerät, das einen zur Ausführung einer Selbstprüfung adaptierten statischen RAM-Speicher enthält und integrierte Schaltung, die als eingebauten statischen RAM-Speicher ein solches Gerät enthält.
JPH10160807A (ja) * 1996-12-04 1998-06-19 Philips Japan Ltd 試験回路を含む論理装置と論理装置の試験方法

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4216539A (en) * 1978-05-05 1980-08-05 Zehntel, Inc. In-circuit digital tester
US4433414A (en) * 1981-09-30 1984-02-21 Fairchild Camera And Instrument Corporation Digital tester local memory data storage system

Also Published As

Publication number Publication date
DE3686795T2 (de) 1993-03-25
JPS6244674A (ja) 1987-02-26
EP0212268A2 (de) 1987-03-04
EP0212268B1 (de) 1992-09-23
EP0212268A3 (en) 1988-04-27

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee