DE3679809D1 - Elektrische testspitze. - Google Patents

Elektrische testspitze.

Info

Publication number
DE3679809D1
DE3679809D1 DE8686402883T DE3679809T DE3679809D1 DE 3679809 D1 DE3679809 D1 DE 3679809D1 DE 8686402883 T DE8686402883 T DE 8686402883T DE 3679809 T DE3679809 T DE 3679809T DE 3679809 D1 DE3679809 D1 DE 3679809D1
Authority
DE
Germany
Prior art keywords
electric test
test tip
tip
electric
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE8686402883T
Other languages
English (en)
Inventor
James S Cooney
Stephen T Sicard
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Augat Inc
Original Assignee
Augat Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Augat Inc filed Critical Augat Inc
Application granted granted Critical
Publication of DE3679809D1 publication Critical patent/DE3679809D1/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G01R1/06738—Geometry aspects related to tip portion
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R11/00—Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts
    • H01R11/11—End pieces or tapping pieces for wires, supported by the wire and for facilitating electrical connection to some other wire, terminal or conductive member
    • H01R11/18—End pieces terminating in a probe

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Geometry (AREA)
  • Measuring Leads Or Probes (AREA)
DE8686402883T 1985-12-20 1986-12-19 Elektrische testspitze. Expired - Fee Related DE3679809D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/811,707 US4636026A (en) 1985-12-20 1985-12-20 Electrical test probe

Publications (1)

Publication Number Publication Date
DE3679809D1 true DE3679809D1 (de) 1991-07-18

Family

ID=25207324

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8686402883T Expired - Fee Related DE3679809D1 (de) 1985-12-20 1986-12-19 Elektrische testspitze.

Country Status (5)

Country Link
US (1) US4636026A (de)
EP (1) EP0232653B1 (de)
JP (1) JPS62157576A (de)
CA (1) CA1241992A (de)
DE (1) DE3679809D1 (de)

Families Citing this family (46)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4897043A (en) * 1986-06-23 1990-01-30 Feinmetall Gmbh Resilient contact pin
EP0251040B1 (de) * 1986-06-23 1991-11-21 Feinmetall Gesellschaft mit beschrÀ¤nkter Haftung Federkontaktstift und Verfahren zu seiner Herstellung
US4803424A (en) * 1987-08-31 1989-02-07 Augat Inc. Short-wire bed-of-nails test fixture
US4838801A (en) * 1987-11-02 1989-06-13 Augat Inc. Leadless component socket
US5038467A (en) * 1989-11-09 1991-08-13 Advanced Interconnections Corporation Apparatus and method for installation of multi-pin components on circuit boards
US5205742A (en) * 1991-08-22 1993-04-27 Augat Inc. High density grid array test socket
US5215472A (en) * 1991-08-22 1993-06-01 Augat Inc. High density grid array socket
US5221209A (en) * 1991-08-22 1993-06-22 Augat Inc. Modular pad array interface
JPH05182729A (ja) * 1991-12-26 1993-07-23 Yamaichi Electron Co Ltd 電気部品用接触子
US5227718A (en) * 1992-03-10 1993-07-13 Virginia Panel Corporation Double-headed spring contact probe assembly
US5420519A (en) * 1992-03-10 1995-05-30 Virginia Panel Corporation Double-headed spring contact probe assembly
US5936421A (en) * 1994-10-11 1999-08-10 Virginia Panel Corporation Coaxial double-headed spring contact probe assembly and coaxial surface contact for engagement therewith
US5942906A (en) * 1994-11-18 1999-08-24 Virginia Panel Corporation Interface system utilizing engagement mechanism
US6244904B1 (en) 1998-01-16 2001-06-12 The Whitaker Corporation Electrical connector for attaching conductors to speaker leads
US6132245A (en) * 1998-05-04 2000-10-17 The Whitaker Corporation Electrical connector for a speaker cabinet
US6007369A (en) * 1998-06-17 1999-12-28 The Whitaker Corporation Wire retention contact in an electrical connector
AU1820900A (en) * 1998-11-25 2000-06-13 Rika Electronics International, Inc. Electrical contact system
US6106316A (en) * 1999-02-10 2000-08-22 International Business Machines Corporation Multistage connector for carriers with combined pin-array and pad-array
JP2000323241A (ja) * 1999-05-12 2000-11-24 Honda Tsushin Kogyo Co Ltd コネクタ
US6506082B1 (en) * 2001-12-21 2003-01-14 Interconnect Devices, Inc. Electrical contact interface
US6688906B2 (en) 2002-05-28 2004-02-10 Agilent Technologies Inc. Probes and methods for testing electrical circuits
TW200536211A (en) * 2004-04-16 2005-11-01 Advanced Connection Tech Inc Electric connector
US7690925B2 (en) * 2005-02-24 2010-04-06 Advanced Interconnections Corp. Terminal assembly with pin-retaining socket
US7154286B1 (en) * 2005-06-30 2006-12-26 Interconnect Devices, Inc. Dual tapered spring probe
CN2833960Y (zh) * 2005-09-30 2006-11-01 番禺得意精密电子工业有限公司 电连接器
TWM289241U (en) * 2005-10-07 2006-04-01 Lotes Co Ltd Electric connector
SG131790A1 (en) * 2005-10-14 2007-05-28 Tan Yin Leong Probe for testing integrated circuit devices
US7097485B1 (en) * 2005-12-02 2006-08-29 Advanced Connection Technology Inc. Electrical connector having resilient conductive terminals
US7300288B1 (en) * 2006-08-21 2007-11-27 Lotes Co., Ltd. Electrical connector
US7862391B2 (en) 2007-09-18 2011-01-04 Delaware Capital Formation, Inc. Spring contact assembly
JP5624740B2 (ja) * 2009-07-30 2014-11-12 株式会社ヨコオ コンタクトプローブ及びソケット
WO2011013731A1 (ja) * 2009-07-30 2011-02-03 株式会社ヨコオ コンタクトプローブ及びソケット
US7794237B1 (en) * 2009-08-21 2010-09-14 Hon Hai Precision Ind. Co., Ltd. Electrical connector having improved retaining arrangement between the housing and the contacts
US7927109B1 (en) 2009-10-30 2011-04-19 Hon Hai Precision Ind. Co., Ltd. Electrical connector having plated conductive layer
JP5647869B2 (ja) * 2010-11-18 2015-01-07 株式会社エンプラス 電気接触子及び電気部品用ソケット
US8210855B1 (en) * 2011-03-11 2012-07-03 Cheng Uei Precision Industry Co., Ltd. Electrical connector
JP6013731B2 (ja) * 2011-12-27 2016-10-25 株式会社エンプラス コンタクトプローブおよびその製造方法
MY168237A (en) * 2012-10-12 2018-10-15 Jf Microtechnology Sdn Bhd Ground contact of an integrated circuit testing apparatus
JP6107144B2 (ja) * 2013-01-09 2017-04-05 株式会社ソシオネクスト コンタクタ
US9172160B2 (en) * 2013-03-13 2015-10-27 Intel Corporation Vertical socket contact with flat force response
US10074923B1 (en) 2015-02-19 2018-09-11 Ohio Associated Enterprises, Llc Axial compliant compression electrical connector
US9853385B1 (en) 2015-02-19 2017-12-26 Ohio Associated Enterprises, Llc Axial compliant compression electrical connector
DE102015004151B4 (de) 2015-03-31 2022-01-27 Feinmetall Gmbh Verfahren zur Herstellung einer Federkontaktstift-Anordnung mit mehreren Federkontaktstiften
US10476191B2 (en) 2018-02-28 2019-11-12 Ohio Associated Enterprises, Llc Forked electrical contact pair with elastic tail
US10431920B1 (en) * 2018-04-17 2019-10-01 John O. Tate One-piece parallel multi-finger contact
JP2020017428A (ja) * 2018-07-26 2020-01-30 株式会社エンプラス プローブピンおよびソケット

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2934738A (en) * 1956-06-07 1960-04-26 Cambridge Thermionic Corp Electric meter probe
US2894205A (en) * 1957-01-08 1959-07-07 Hewlett Packard Co Probe assembly
DE1756777U (de) * 1957-09-28 1957-11-28 Pertrix Union Gmbh Elektrischer momentschalter.
US3435168A (en) * 1968-03-28 1969-03-25 Pylon Co Inc Electrical contact
GB2008337B (en) * 1977-11-18 1982-03-31 Bicc Ltd Electric contacts
US4200351A (en) * 1978-06-12 1980-04-29 Everett/Charles, Inc. Straight through electrical spring probe

Also Published As

Publication number Publication date
EP0232653B1 (de) 1991-06-12
EP0232653A1 (de) 1987-08-19
US4636026A (en) 1987-01-13
JPH0257675B2 (de) 1990-12-05
CA1241992A (en) 1988-09-13
JPS62157576A (ja) 1987-07-13

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee