DE3677481D1 - Austauschbare sonde mit zwischenspeicher. - Google Patents

Austauschbare sonde mit zwischenspeicher.

Info

Publication number
DE3677481D1
DE3677481D1 DE8686309184T DE3677481T DE3677481D1 DE 3677481 D1 DE3677481 D1 DE 3677481D1 DE 8686309184 T DE8686309184 T DE 8686309184T DE 3677481 T DE3677481 T DE 3677481T DE 3677481 D1 DE3677481 D1 DE 3677481D1
Authority
DE
Germany
Prior art keywords
buffer
replaceable probe
replaceable
probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE8686309184T
Other languages
English (en)
Inventor
David W Bogardus
Robin L Teitzel
David D Chapman
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tektronix Inc
Original Assignee
Tektronix Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tektronix Inc filed Critical Tektronix Inc
Application granted granted Critical
Publication of DE3677481D1 publication Critical patent/DE3677481D1/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/25—Testing of logic operation, e.g. by logic analysers

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
DE8686309184T 1985-11-25 1986-11-25 Austauschbare sonde mit zwischenspeicher. Expired - Fee Related DE3677481D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/801,450 US4701696A (en) 1985-11-25 1985-11-25 Retargetable buffer probe

Publications (1)

Publication Number Publication Date
DE3677481D1 true DE3677481D1 (de) 1991-03-14

Family

ID=25181133

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8686309184T Expired - Fee Related DE3677481D1 (de) 1985-11-25 1986-11-25 Austauschbare sonde mit zwischenspeicher.

Country Status (4)

Country Link
US (1) US4701696A (de)
EP (1) EP0227312B1 (de)
JP (1) JPS62130368A (de)
DE (1) DE3677481D1 (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4963824A (en) * 1988-11-04 1990-10-16 International Business Machines Corporation Diagnostics of a board containing a plurality of hybrid electronic components
JPH0547877U (ja) * 1991-11-28 1993-06-25 安藤電気株式会社 インサーキットエミュレータ用延長ケーブル
US5764071A (en) * 1996-01-05 1998-06-09 International Business Machines Corporation Method and system for testing an electronic module mounted on a printed circuit board
GB9811062D0 (en) * 1998-05-23 1998-07-22 Lucas Ind Plc Electronic assembly
US7921988B2 (en) * 2007-09-27 2011-04-12 Stewart Systems Global, LLC Oven drive system
CN101650396B (zh) * 2008-08-13 2012-05-16 鸿富锦精密工业（深圳）有限公司 测试治具
TWI407104B (zh) * 2008-08-22 2013-09-01 Hon Hai Prec Ind Co Ltd 測試治具
JP6242265B2 (ja) * 2014-03-27 2017-12-06 日置電機株式会社 クランプセンサおよび測定装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3808532A (en) * 1972-10-12 1974-04-30 Us Navy Extender test connector for plug-in module
FR2260257A1 (en) * 1974-01-31 1975-08-29 Cit Alcatel Extension for printed circuit card testing - has switches controlling connection between pivotal card and test bay
US4752928A (en) * 1985-05-06 1988-06-21 Tektronix, Inc. Transaction analyzer

Also Published As

Publication number Publication date
JPH0579148B2 (de) 1993-11-01
US4701696A (en) 1987-10-20
EP0227312A1 (de) 1987-07-01
EP0227312B1 (de) 1991-02-06
JPS62130368A (ja) 1987-06-12

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee