DE3676379D1 - Verfahren und schaltung zur schnellen reflektometrischen pruefung passiver komponenten im vhf-bereich. - Google Patents

Verfahren und schaltung zur schnellen reflektometrischen pruefung passiver komponenten im vhf-bereich.

Info

Publication number
DE3676379D1
DE3676379D1 DE8686401427T DE3676379T DE3676379D1 DE 3676379 D1 DE3676379 D1 DE 3676379D1 DE 8686401427 T DE8686401427 T DE 8686401427T DE 3676379 T DE3676379 T DE 3676379T DE 3676379 D1 DE3676379 D1 DE 3676379D1
Authority
DE
Germany
Prior art keywords
line
testing
reflectometric
fast
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE8686401427T
Other languages
English (en)
Inventor
Traon Andre Le
Brahim Haraoubia
Jean-Claude Pilet
Burgat Michel De
Jean-Loic Meury
Traon Flore Le
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Universite de Rennes 1
Original Assignee
Universite de Rennes 1
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Universite de Rennes 1 filed Critical Universite de Rennes 1
Application granted granted Critical
Publication of DE3676379D1 publication Critical patent/DE3676379D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/16—Measuring impedance of element or network through which a current is passing from another source, e.g. cable, power line
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/04—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
    • G01R27/06—Measuring reflection coefficients; Measuring standing-wave ratio

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Monitoring And Testing Of Transmission In General (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Amplifiers (AREA)
DE8686401427T 1985-07-01 1986-06-27 Verfahren und schaltung zur schnellen reflektometrischen pruefung passiver komponenten im vhf-bereich. Expired - Lifetime DE3676379D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8510007A FR2584196B1 (fr) 1985-07-01 1985-07-01 Procede et dispositif pour le test rapide, par reflectrometrie, dans les gammes v.h.f., de composants passifs

Publications (1)

Publication Number Publication Date
DE3676379D1 true DE3676379D1 (de) 1991-02-07

Family

ID=9320831

Family Applications (2)

Application Number Title Priority Date Filing Date
DE8686401427T Expired - Lifetime DE3676379D1 (de) 1985-07-01 1986-06-27 Verfahren und schaltung zur schnellen reflektometrischen pruefung passiver komponenten im vhf-bereich.
DE8686401426T Expired - Lifetime DE3681978D1 (de) 1985-07-01 1986-06-27 Verfahren und schaltung zur schnellen reflektometrischen pruefung passiver komponenten im vhf-bereich.

Family Applications After (1)

Application Number Title Priority Date Filing Date
DE8686401426T Expired - Lifetime DE3681978D1 (de) 1985-07-01 1986-06-27 Verfahren und schaltung zur schnellen reflektometrischen pruefung passiver komponenten im vhf-bereich.

Country Status (6)

Country Link
US (1) US4791351A (de)
EP (2) EP0207860B1 (de)
JP (1) JPS6296868A (de)
AT (2) ATE68605T1 (de)
DE (2) DE3676379D1 (de)
FR (1) FR2584196B1 (de)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2263783B (en) * 1992-01-27 1995-12-20 Marconi Instruments Ltd Circuits for use in the detection and location of a fault or faults in a device under test
US5430383A (en) * 1994-03-03 1995-07-04 Vlsi Technology, Inc. Method for measuring capacitive loads
JP3528363B2 (ja) * 1995-10-13 2004-05-17 ヤマハ株式会社 試験用半導体装置の評価方法
FI981990A (fi) 1998-09-15 2000-03-16 Nokia Networks Oy Mittausmenetelmä ja mittauslaite
US20090167322A1 (en) * 2007-12-28 2009-07-02 Erik Edmund Magnuson Systems and method for classifying a substance
US8750816B2 (en) * 2011-08-09 2014-06-10 Texas Instruments Incorporated Method to determine RF circuit antenna impedance
US9151795B2 (en) * 2012-11-21 2015-10-06 Avago Technologies General Ip (Singapore) Pte. Ltd. Apparatus for inspecting passive component having signal transmission line

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3479587A (en) * 1967-06-14 1969-11-18 Gen Radio Co Reflection-coefficient measuring apparatus
US4112382A (en) * 1973-11-30 1978-09-05 Ird Mechanalysis, Inc. Digital sweep circuit for generating sawtooth wave form
US4041395A (en) * 1976-08-02 1977-08-09 Integral Engineering & Manufacturing Corporation Transmitter performance monitor and antenna matching system
US4288875A (en) * 1980-02-08 1981-09-08 Rca Corporation Controlled local oscillator with apparatus for extending its frequency range
FR2514902A1 (fr) * 1981-10-20 1983-04-22 Cables De Lyon Geoffroy Delore Procede de mesure de l'impedance d'une prise de terre et dispositif en faisant application
US4506209A (en) * 1982-12-27 1985-03-19 Rockwell International Corporation Tracking impedance measuring system
DE3410730C2 (de) * 1984-03-23 1994-08-18 Deutsche Aerospace Meß-Richtkoppler
FR2564205B1 (fr) * 1984-05-10 1986-10-24 Univ Rennes Procede et dispositif pour le test rapide de condensateurs et de materiaux dielectriques

Also Published As

Publication number Publication date
JPS6296868A (ja) 1987-05-06
EP0207860A3 (en) 1988-05-25
US4791351A (en) 1988-12-13
EP0207860B1 (de) 1991-10-16
EP0211711A1 (de) 1987-02-25
ATE68605T1 (de) 1991-11-15
DE3681978D1 (de) 1991-11-21
EP0207860A2 (de) 1987-01-07
ATE59707T1 (de) 1991-01-15
FR2584196A1 (fr) 1987-01-02
FR2584196B1 (fr) 1988-04-22
EP0211711B1 (de) 1991-01-02

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee