DE3585866D1 - Koaxialverbindungsstueck. - Google Patents
Koaxialverbindungsstueck.Info
- Publication number
- DE3585866D1 DE3585866D1 DE8585111749T DE3585866T DE3585866D1 DE 3585866 D1 DE3585866 D1 DE 3585866D1 DE 8585111749 T DE8585111749 T DE 8585111749T DE 3585866 T DE3585866 T DE 3585866T DE 3585866 D1 DE3585866 D1 DE 3585866D1
- Authority
- DE
- Germany
- Prior art keywords
- coaxial connector
- coaxial
- connector
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R24/00—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure
- H01R24/38—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure having concentrically or coaxially arranged contacts
- H01R24/40—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure having concentrically or coaxially arranged contacts specially adapted for high frequency
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
- G01R1/07371—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate card or back card with apertures through which the probes pass
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R2103/00—Two poles
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
- Coupling Device And Connection With Printed Circuit (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US65298584A | 1984-09-21 | 1984-09-21 |
Publications (1)
Publication Number | Publication Date |
---|---|
DE3585866D1 true DE3585866D1 (de) | 1992-05-21 |
Family
ID=24619029
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE8585111749T Expired - Fee Related DE3585866D1 (de) | 1984-09-21 | 1985-09-17 | Koaxialverbindungsstueck. |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP0177809B1 (de) |
JP (1) | JPS6177286A (de) |
DE (1) | DE3585866D1 (de) |
Families Citing this family (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4708661A (en) * | 1986-07-28 | 1987-11-24 | Tektronix, Inc. | Modified BNC connector for active probe |
US4739259A (en) * | 1986-08-01 | 1988-04-19 | Tektronix, Inc. | Telescoping pin probe |
JPH0178029U (de) * | 1987-11-13 | 1989-05-25 | ||
US6586954B2 (en) | 1998-02-10 | 2003-07-01 | Celadon Systems, Inc. | Probe tile for probing semiconductor wafer |
US6201402B1 (en) | 1997-04-08 | 2001-03-13 | Celadon Systems, Inc. | Probe tile and platform for large area wafer probing |
US6037787A (en) * | 1998-03-24 | 2000-03-14 | Teradyne, Inc. | High performance probe interface for automatic test equipment |
DE69901939T2 (de) * | 1998-03-24 | 2003-01-23 | Teradyne Inc., Boston | Koaxialsonden-schnittstelle für automatische testeinrichtungen |
US6911835B2 (en) * | 2002-05-08 | 2005-06-28 | Formfactor, Inc. | High performance probe system |
US6965244B2 (en) | 2002-05-08 | 2005-11-15 | Formfactor, Inc. | High performance probe system |
TWI327226B (en) | 2002-06-28 | 2010-07-11 | Celadon Systems Inc | Shielded probe apparatus |
US6902416B2 (en) | 2002-08-29 | 2005-06-07 | 3M Innovative Properties Company | High density probe device |
US6963207B2 (en) | 2003-03-06 | 2005-11-08 | Celadon Systems, Inc. | Apparatus and method for terminating probe apparatus of semiconductor wafer |
US7170305B2 (en) | 2005-02-24 | 2007-01-30 | Celadon Systems, Inc. | Apparatus and method for terminating probe apparatus of semiconductor wafer |
US6975128B1 (en) | 2003-03-28 | 2005-12-13 | Celadon Systems, Inc. | Electrical, high temperature test probe with conductive driven guard |
US6824427B1 (en) * | 2003-05-13 | 2004-11-30 | 3M Innovative Properties Company | Coaxial probe interconnection system |
US7728609B2 (en) | 2007-05-25 | 2010-06-01 | Celadon Systems, Inc. | Replaceable probe apparatus for probing semiconductor wafer |
EP2290753B1 (de) * | 2009-08-31 | 2012-12-05 | ERNI Electronics GmbH | Steckverbinder und Multilayerplatine |
EP2771948B1 (de) * | 2011-10-24 | 2018-12-05 | Ardent Concepts Inc. | Kabelabschluss mit kontrollierter impedanz mit flexiblen verbindungselementen |
CN113589004B (zh) * | 2021-08-05 | 2024-02-02 | 淄博信易杰电气有限公司 | 一种高压信号发生器 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3350500A (en) * | 1964-12-29 | 1967-10-31 | Amp Inc | Connections for coaxial cable means |
JPS5228236A (en) * | 1975-08-29 | 1977-03-03 | Hitachi Ltd | Variable periodic clock generating circuit |
JPS5237834U (de) * | 1975-09-10 | 1977-03-17 |
-
1985
- 1985-07-16 JP JP60155295A patent/JPS6177286A/ja active Granted
- 1985-09-17 EP EP19850111749 patent/EP0177809B1/de not_active Expired
- 1985-09-17 DE DE8585111749T patent/DE3585866D1/de not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP0177809A1 (de) | 1986-04-16 |
EP0177809B1 (de) | 1992-04-15 |
JPS6337465B2 (de) | 1988-07-26 |
JPS6177286A (ja) | 1986-04-19 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |