DE3582494D1 - Verfahren und vorrichtung zur kalibrierung der ablenkung in einem oszilloskop. - Google Patents

Verfahren und vorrichtung zur kalibrierung der ablenkung in einem oszilloskop.

Info

Publication number
DE3582494D1
DE3582494D1 DE8585308290T DE3582494T DE3582494D1 DE 3582494 D1 DE3582494 D1 DE 3582494D1 DE 8585308290 T DE8585308290 T DE 8585308290T DE 3582494 T DE3582494 T DE 3582494T DE 3582494 D1 DE3582494 D1 DE 3582494D1
Authority
DE
Germany
Prior art keywords
distraction
oscilloscope
calibrating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE8585308290T
Other languages
English (en)
Inventor
Lawrence J Miller
Donald P Chitwood
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tektronix Inc
Original Assignee
Tektronix Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tektronix Inc filed Critical Tektronix Inc
Application granted granted Critical
Publication of DE3582494D1 publication Critical patent/DE3582494D1/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/002—Testing or calibrating of apparatus covered by the other groups of this subclass of cathode ray oscilloscopes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/20—Cathode-ray oscilloscopes
    • G01R13/202—Non-electric appliances, e.g. scales, masks

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
  • Manufacture Of Electron Tubes, Discharge Lamp Vessels, Lead-In Wires, And The Like (AREA)
  • Electrophonic Musical Instruments (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
DE8585308290T 1984-12-24 1985-11-14 Verfahren und vorrichtung zur kalibrierung der ablenkung in einem oszilloskop. Expired - Fee Related DE3582494D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/685,879 US4677340A (en) 1984-12-24 1984-12-24 Method and apparatus for calibrating deflection in an oscilloscope

Publications (1)

Publication Number Publication Date
DE3582494D1 true DE3582494D1 (de) 1991-05-16

Family

ID=24754046

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8585308290T Expired - Fee Related DE3582494D1 (de) 1984-12-24 1985-11-14 Verfahren und vorrichtung zur kalibrierung der ablenkung in einem oszilloskop.

Country Status (4)

Country Link
US (1) US4677340A (de)
EP (1) EP0195162B1 (de)
JP (1) JPS61155965A (de)
DE (1) DE3582494D1 (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4749907A (en) * 1985-12-02 1988-06-07 Tektronix, Inc. Method and apparatus for automatically calibrating a graticuled cathode ray tube
US4812713A (en) * 1986-05-01 1989-03-14 Blanchard Clark E Automatic closed loop scaling and drift correcting system and method
US4754329A (en) * 1987-04-13 1988-06-28 Tektronix, Inc. Focusing and screen calibration method for display screen coupled to video camera
US4897721A (en) * 1988-05-16 1990-01-30 Apple Computer Automated testing apparatus for screen alignment
JPH0769350B2 (ja) * 1990-10-18 1995-07-26 菊水電子工業株式会社 オシロスコープの垂直増幅器
JPH10271357A (ja) * 1997-03-27 1998-10-09 Nec Ic Microcomput Syst Ltd ダイナミック・フォーカス回路

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2778971A (en) * 1952-01-25 1957-01-22 Philco Corp Indexing system for color television
US2790107A (en) * 1955-04-04 1957-04-23 Philco Corp Indexing strip structure for cathode ray tubes
USRE24781E (en) * 1955-12-13 1960-02-09 Photocell indexing system
NL276162A (de) * 1961-08-21
GB1495161A (en) * 1975-01-02 1977-12-14 Elliott Bros Apparatus for use in determining a characteristic of a cathode ray tube
US4099092A (en) * 1976-08-18 1978-07-04 Atari, Inc. Television display alignment system and method
US4247869A (en) * 1979-04-16 1981-01-27 Tektronix, Inc. Method and apparatus for improving resolution and linearity in a beam-index display system
SU960999A1 (ru) * 1980-05-28 1982-09-23 За витель Способ измерени геометрических искажений растра электронно-лучевой трубки
US4439735A (en) * 1981-07-17 1984-03-27 Zenith Radio Corporation Method and apparatus for testing line screen CRT registration

Also Published As

Publication number Publication date
US4677340A (en) 1987-06-30
JPS61155965A (ja) 1986-07-15
EP0195162A2 (de) 1986-09-24
JPH043829B2 (de) 1992-01-24
EP0195162B1 (de) 1991-04-10
EP0195162A3 (en) 1987-03-18

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee