DE3579928D1 - Verfahren und vorrichtung zum nachweis von minderwertigen behaeltern. - Google Patents

Verfahren und vorrichtung zum nachweis von minderwertigen behaeltern.

Info

Publication number
DE3579928D1
DE3579928D1 DE8585103495T DE3579928T DE3579928D1 DE 3579928 D1 DE3579928 D1 DE 3579928D1 DE 8585103495 T DE8585103495 T DE 8585103495T DE 3579928 T DE3579928 T DE 3579928T DE 3579928 D1 DE3579928 D1 DE 3579928D1
Authority
DE
Germany
Prior art keywords
container
light beams
detecting low
reflected
projected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE8585103495T
Other languages
German (de)
English (en)
Inventor
Ryosaku Tagaya
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Eisai Co Ltd
Original Assignee
Eisai Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Eisai Co Ltd filed Critical Eisai Co Ltd
Application granted granted Critical
Publication of DE3579928D1 publication Critical patent/DE3579928D1/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
    • G01N21/9054—Inspection of sealing surface and container finish

Landscapes

  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Physics & Mathematics (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Filling Of Jars Or Cans And Processes For Cleaning And Sealing Jars (AREA)
  • Examining Or Testing Airtightness (AREA)
  • Sorting Of Articles (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
DE8585103495T 1984-03-30 1985-03-25 Verfahren und vorrichtung zum nachweis von minderwertigen behaeltern. Expired - Fee Related DE3579928D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59062663A JPS60205337A (ja) 1984-03-30 1984-03-30 不良アンプル剤を検出する方法及び装置

Publications (1)

Publication Number Publication Date
DE3579928D1 true DE3579928D1 (de) 1990-11-08

Family

ID=13206752

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8585103495T Expired - Fee Related DE3579928D1 (de) 1984-03-30 1985-03-25 Verfahren und vorrichtung zum nachweis von minderwertigen behaeltern.

Country Status (7)

Country Link
US (1) US4664525A (OSRAM)
EP (1) EP0156346B1 (OSRAM)
JP (1) JPS60205337A (OSRAM)
AT (1) ATE57260T1 (OSRAM)
CA (1) CA1234610A (OSRAM)
DE (1) DE3579928D1 (OSRAM)
MX (1) MX158299A (OSRAM)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH067110B2 (ja) * 1985-11-22 1994-01-26 エーザイ株式会社 容器に付着した汚れを検出する方法
US4868404A (en) * 1987-04-23 1989-09-19 Hajime Industries, Ltd. Surface inspection apparatus using a mask system to monitor uneven surfaces
US4975568A (en) * 1988-02-10 1990-12-04 Takeda Chemical Industries, Ltd. Container inspecting apparatus with a light shielding member shaped to container profile
JP2808123B2 (ja) * 1988-11-16 1998-10-08 キヤノン株式会社 異物検出装置
DE4002034C1 (OSRAM) * 1989-12-05 1991-05-02 Elpatronic Ag, Zug, Ch
DE10322459B3 (de) * 2003-05-16 2004-11-11 Krones Ag Inspektionsvorrichtung für Flaschen
GB2288016B (en) * 1994-03-31 1998-05-13 Tomra Systems As Device for generating,detecting and recognizing a contour image of a liquid container
US5895911A (en) * 1998-01-22 1999-04-20 Emhart Glass S.A. Glass container body check detector
US6937339B2 (en) * 2001-03-14 2005-08-30 Hitachi Engineering Co., Ltd. Inspection device and system for inspecting foreign matters in a liquid filled transparent container
FR2846423B1 (fr) * 2002-10-25 2005-12-23 Bsn Glasspack Procede et dispositif pour detecter des defauts de surface presentes par unr bague d'un recipient de revolution transparent ou translucide
US7010863B1 (en) 2004-01-26 2006-03-14 Owens-Brockway Glass Container Inc. Optical inspection apparatus and method for inspecting container lean
US7148961B1 (en) 2004-11-10 2006-12-12 Owens-Brockway Glass Container Inc. Container sidewall inspection
JP4707511B2 (ja) * 2005-09-14 2011-06-22 株式会社日立情報制御ソリューションズ 光透過性容器充填液体中の異物検査装置
BR112012024633B1 (pt) 2010-04-01 2020-03-17 Nippon Steel Corporation Dispositivo de medição de partícula e método de medição de partícula
JP5726628B2 (ja) * 2011-05-17 2015-06-03 倉敷紡績株式会社 透明体ボトルの外観検査装置及び外観検査方法
PL2715323T3 (pl) * 2011-06-01 2016-09-30 Zespół i sposób kontroli dla jednodawkowej osłony dla przezroczystego opakowania do przechowywania przezroczystej cieczy
DE102013103992A1 (de) * 2013-04-19 2014-10-23 Krones Ag Testbehältnis zum Testen von Inspektionseinrichtungen
US10527557B2 (en) * 2017-12-29 2020-01-07 Radiant Vision Systems, LLC Adaptive diffuse illumination systems and methods
JP7129456B2 (ja) * 2019-11-15 2022-09-01 エフ ホフマン－ラ ロッシュ アクチェン ゲゼルシャフト 検査室サンプル容器の特性を判定するための装置、検査室自動化システム、および検査室サンプル容器の特性を判定するための方法
JP7545176B1 (ja) * 2023-09-27 2024-09-04 株式会社メック 欠陥検査装置及び欠陥検査方法

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3439178A (en) * 1965-02-08 1969-04-15 Owens Illinois Inc Radiation-sensitive apparatus for inspecting wall thickness of hollow containers
US3627423A (en) * 1970-02-17 1971-12-14 Schering Corp Method and apparatus for detecting particular matter in sealed liquids
US3814946A (en) * 1972-12-04 1974-06-04 Asahi Glass Co Ltd Method of detecting defects in transparent and semitransparent bodies
US4025201A (en) * 1975-04-21 1977-05-24 Ball Brothers Service Corporation Method and apparatus for video inspection of articles of manufacture by decussate paths of light
JPS5273786A (en) * 1975-12-17 1977-06-21 Oki Electric Ind Co Ltd Object abnormality detector
JPS5321974A (en) * 1976-08-12 1978-02-28 Mitsubishi Electric Corp Apparatus for inspecting glass bottles of the like
GB1600400A (en) * 1977-10-13 1981-10-14 Ti Fords Ltd Bottle inspection apparatus
US4310250A (en) * 1980-02-01 1982-01-12 Erwin Sick Gmbh Apparatus for monitoring for faults in translucent strip material
US4522497A (en) * 1981-06-17 1985-06-11 Ciba Geigy Ag Web scanning apparatus
US4500203A (en) * 1982-09-30 1985-02-19 Owens-Illinois, Inc. Method and apparatus for inspecting articles

Also Published As

Publication number Publication date
EP0156346A2 (en) 1985-10-02
JPS60205337A (ja) 1985-10-16
EP0156346B1 (en) 1990-10-03
MX158299A (es) 1989-01-20
JPH0426423B2 (OSRAM) 1992-05-07
ATE57260T1 (de) 1990-10-15
EP0156346A3 (en) 1987-05-13
CA1234610A (en) 1988-03-29
US4664525A (en) 1987-05-12

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Legal Events

Date Code Title Description
8328 Change in the person/name/address of the agent

Free format text: HOFFMEISTER, H., DIPL.-PHYS. DR.RER.NAT., PAT.-ANW., 4400 MUENSTER

8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee