DE3577482D1 - Mehrfachtaktgeber. - Google Patents

Mehrfachtaktgeber.

Info

Publication number
DE3577482D1
DE3577482D1 DE8585101475T DE3577482T DE3577482D1 DE 3577482 D1 DE3577482 D1 DE 3577482D1 DE 8585101475 T DE8585101475 T DE 8585101475T DE 3577482 T DE3577482 T DE 3577482T DE 3577482 D1 DE3577482 D1 DE 3577482D1
Authority
DE
Germany
Prior art keywords
multiple clock
clock
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE8585101475T
Other languages
English (en)
Inventor
Keiichiro Ide
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Application granted granted Critical
Publication of DE3577482D1 publication Critical patent/DE3577482D1/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31922—Timing generation or clock distribution
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/78—Generating a single train of pulses having a predetermined pattern, e.g. a predetermined number

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Manipulation Of Pulses (AREA)
DE8585101475T 1984-02-15 1985-02-12 Mehrfachtaktgeber. Expired - Fee Related DE3577482D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59027644A JPS60170949A (ja) 1984-02-15 1984-02-15 マルチクロツク発生装置

Publications (1)

Publication Number Publication Date
DE3577482D1 true DE3577482D1 (de) 1990-06-07

Family

ID=12226635

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8585101475T Expired - Fee Related DE3577482D1 (de) 1984-02-15 1985-02-12 Mehrfachtaktgeber.

Country Status (4)

Country Link
US (1) US4623845A (de)
EP (1) EP0152094B1 (de)
JP (1) JPS60170949A (de)
DE (1) DE3577482D1 (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4862096A (en) * 1987-05-13 1989-08-29 Tektronix, Inc. Programmable multiphase sequence controller
US5121417A (en) * 1988-09-02 1992-06-09 Eastman Kodak Company Count-locked loop timing generator
JPH04336308A (ja) * 1991-05-13 1992-11-24 Nec Corp マイクロコンピュータ
CA2127192C (en) * 1993-07-01 1999-09-07 Alan Brent Hussey Shaping ate bursts, particularly in gallium arsenide
US5642068A (en) * 1994-08-08 1997-06-24 Mosaid Technologies Incorporated Clock period dependent pulse generator
JPH09319456A (ja) * 1996-06-03 1997-12-12 Mitsubishi Electric Corp 発振停止検出装置

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5832178A (ja) * 1981-08-19 1983-02-25 Advantest Corp Ｉｃテスタ

Also Published As

Publication number Publication date
US4623845A (en) 1986-11-18
EP0152094A3 (en) 1986-11-12
JPH0464431B2 (de) 1992-10-14
EP0152094A2 (de) 1985-08-21
JPS60170949A (ja) 1985-09-04
EP0152094B1 (de) 1990-05-02

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee