DE3463843D1 - Tensile tester - Google Patents

Tensile tester

Info

Publication number
DE3463843D1
DE3463843D1 DE8484106992T DE3463843T DE3463843D1 DE 3463843 D1 DE3463843 D1 DE 3463843D1 DE 8484106992 T DE8484106992 T DE 8484106992T DE 3463843 T DE3463843 T DE 3463843T DE 3463843 D1 DE3463843 D1 DE 3463843D1
Authority
DE
Germany
Prior art keywords
tensile tester
tester
tensile
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE8484106992T
Other languages
German (de)
English (en)
Inventor
Sunao Ninomiya
Yasuhiro Miura
Hiromu Iwata
Shuji Matsuyama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Chemical Co Ltd
Original Assignee
Sumitomo Chemical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Chemical Co Ltd filed Critical Sumitomo Chemical Co Ltd
Application granted granted Critical
Publication of DE3463843D1 publication Critical patent/DE3463843D1/de
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/02—Details
    • G01N3/06—Special adaptations of indicating or recording means
    • G01N3/068—Special adaptations of indicating or recording means with optical indicating or recording means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02—Details not specific for a particular testing method
    • G01N2203/06—Indicating or recording means; Sensing means
    • G01N2203/0641—Indicating or recording means; Sensing means using optical, X-ray, ultraviolet, infrared or similar detectors
    • G01N2203/0647—Image analysis

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
DE8484106992T 1983-06-20 1984-06-19 Tensile tester Expired DE3463843D1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58110535A JPS603537A (ja) 1983-06-20 1983-06-20 ゴム・プラスチック用引張試験機

Publications (1)

Publication Number Publication Date
DE3463843D1 true DE3463843D1 (en) 1987-06-25

Family

ID=14538269

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8484106992T Expired DE3463843D1 (en) 1983-06-20 1984-06-19 Tensile tester

Country Status (4)

Country Link
US (1) US4605857A (OSRAM)
EP (1) EP0129242B1 (OSRAM)
JP (1) JPS603537A (OSRAM)
DE (1) DE3463843D1 (OSRAM)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3608884A1 (de) * 1986-03-17 1987-09-24 Mitec Moderne Ind Gmbh Messanordnung
JPS62287941A (ja) * 1986-06-02 1987-12-14 Mitsubishi Electric Corp 放電加工装置
US4754134A (en) * 1987-04-16 1988-06-28 Shin Meiwa Industry Co., Ltd. Method of and apparatus for inspecting a stripped wire end
DE3720248A1 (de) * 1987-06-19 1989-01-05 Schenck Ag Carl Verfahren und anordnung zur messung von verformungen an proben oder pruefkoerpern in pruefmaschinen
DE3740227C2 (de) * 1987-11-27 1994-03-24 Schenck Ag Carl Verfahren und Vorrichtung zur Messung von Verformungen an Proben oder Prüfkörpern in Prüfmaschinen
DE3720303C2 (de) * 1987-06-19 1993-09-30 Schenck Ag Carl Probeneinspannvorrichtung für Prüfmaschinen
EP0320122A3 (en) * 1987-11-30 1992-04-29 United Kingdom Atomic Energy Authority A method of position monitoring and apparatus therefor
JPH02106250A (ja) * 1988-10-14 1990-04-18 Hitachi Seiki Co Ltd Ｎｃ工作機械メインテナンスのための潤滑油管理方法とリトライカウント方法
JP2716304B2 (ja) * 1991-12-20 1998-02-18 本田技研工業株式会社 Ｎｃ装置の工具接合異常処理方法
FR2695207B1 (fr) * 1992-09-01 1994-12-09 Aerospatiale Installation pour mesurer la déformation in situ de chapelets d'éprouvettes soumis à des essais de fluage de longue durée.
US5383776A (en) * 1992-12-31 1995-01-24 Hoechst Celanese Corporation Apparatus for analyzing polymer defects
JP2692599B2 (ja) * 1994-07-27 1997-12-17 株式会社島津製作所 レーザー非接触伸び計
DE19520371B4 (de) * 1995-06-02 2005-06-02 Dantec Ettemeyer Gmbh Verfahren und Vorrichtung zur Vergrößerung des Meßbereichs von Speckle-Meßsystemen bei Dehnungsmessungen an einer Probe
DE19620419A1 (de) * 1996-05-21 1997-11-27 Ettemeyer Gmbh & Co Mes Und Pr Verfahren zur berührungslosen und markierungsfreien Messung von Verschiebungen
JP3373831B2 (ja) * 2000-01-19 2003-02-04 岸本産業株式会社 試験片の伸び測定方法及び装置
CN102288496A (zh) * 2011-08-15 2011-12-21 中核苏阀横店机械有限公司 一种标距仪
CN103063174A (zh) * 2011-10-20 2013-04-24 上海力远计算机科技有限公司 无线预应力张拉伸长量测量装置
CN105203041B (zh) * 2015-09-21 2017-11-10 南昌航空大学 一种宽带荧光积分强度比测量应变的方法
KR102798449B1 (ko) * 2020-03-04 2025-04-22 주식회사 엘지에너지솔루션 박막 시편의 물성 평가방법 및 인장시험 테스트용 박막 시편
CN112361941A (zh) * 2020-11-09 2021-02-12 天津正丽科技有限公司 一种快速定性检测隐形牙齿矫治器变形的装置及方法
KR102522830B1 (ko) * 2021-10-13 2023-04-17 박용수 시험편과 일체화된 신장 측정용 돌출눈금을 가진 인장시험용 고무 시험편
GB2618524B (en) * 2022-05-02 2025-02-05 Imetrum Ltd Non-contact deformation monitoring system

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2989690A (en) * 1959-04-29 1961-06-20 Gen Electric Elongation, length, and velocity gage
US3435231A (en) * 1965-08-10 1969-03-25 Instron Ltd Optical means for following the relative movement of two marks on a specimen during tensile testing
US3559253A (en) * 1968-11-05 1971-02-02 Cluett Peabody & Co Inc Textile web shrinking apparatus comprising means for measuring distance between index marks on the web
JPS4850084U (OSRAM) * 1971-10-12 1973-06-30
GB1416541A (en) * 1972-11-06 1975-12-03 Wallace Co Ltd H W Method and apparatus for following the motion of a datum mark
GB1553101A (en) * 1976-04-30 1979-09-19 Iwamoto Seisakusho Co Ltd Automatic tensile test apparatus

Also Published As

Publication number Publication date
JPS603537A (ja) 1985-01-09
EP0129242B1 (en) 1987-05-20
JPH0220930B2 (OSRAM) 1990-05-11
EP0129242A1 (en) 1984-12-27
US4605857A (en) 1986-08-12

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee