DE3381664D1 - Holographisches elektronenmikroskop. - Google Patents
Holographisches elektronenmikroskop.Info
- Publication number
- DE3381664D1 DE3381664D1 DE8383101275T DE3381664T DE3381664D1 DE 3381664 D1 DE3381664 D1 DE 3381664D1 DE 8383101275 T DE8383101275 T DE 8383101275T DE 3381664 T DE3381664 T DE 3381664T DE 3381664 D1 DE3381664 D1 DE 3381664D1
- Authority
- DE
- Germany
- Prior art keywords
- electron microscope
- holographic
- holographic electron
- microscope
- electron
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03H—HOLOGRAPHIC PROCESSES OR APPARATUS
- G03H5/00—Holographic processes or apparatus using particles or using waves other than those covered by groups G03H1/00 or G03H3/00 for obtaining holograms; Processes or apparatus for obtaining an optical image from them
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/22—Treatment of data
- H01J2237/226—Image reconstruction
- H01J2237/228—Charged particle holography
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/26—Electron or ion microscopes
- H01J2237/2614—Holography or phase contrast, phase related imaging in general, e.g. phase plates
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Holo Graphy (AREA)
- Microscoopes, Condenser (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57038013A JPS58155636A (ja) | 1982-03-12 | 1982-03-12 | ホログラフイ電子顕微鏡 |
Publications (1)
Publication Number | Publication Date |
---|---|
DE3381664D1 true DE3381664D1 (de) | 1990-07-19 |
Family
ID=12513688
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE8383101275T Expired - Lifetime DE3381664D1 (de) | 1982-03-12 | 1983-02-10 | Holographisches elektronenmikroskop. |
Country Status (5)
Country | Link |
---|---|
US (1) | US4532422A (de) |
EP (1) | EP0088890B1 (de) |
JP (1) | JPS58155636A (de) |
CA (1) | CA1204226A (de) |
DE (1) | DE3381664D1 (de) |
Families Citing this family (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2651154B2 (ja) * | 1987-09-04 | 1997-09-10 | 株式会社日立製作所 | 電子線ホログラフィ装置 |
US5192867A (en) * | 1989-01-13 | 1993-03-09 | Hitachi, Ltd. | Electron optical measurement apparatus |
JP2776862B2 (ja) * | 1989-01-13 | 1998-07-16 | 株式会社日立製作所 | 反射電子線ホログラフイー装置 |
US5200618A (en) * | 1990-03-09 | 1993-04-06 | University Of Wisconsin - Milwaukee | Method and apparatus for atomic imaging |
US5227630A (en) * | 1990-08-20 | 1993-07-13 | Board Of Regents Of The University Of Wisconsin System | Method and apparatus for imaging of an atomic environment |
US5095207A (en) * | 1991-01-07 | 1992-03-10 | University Of Wisconsin - Milwaukee | Method of three-dimensional atomic imaging |
US5517128A (en) * | 1993-01-05 | 1996-05-14 | Sentech Instruments Gmbh | Method and arrangement for charge carrier profiling in semiconductor structure by means of AFM scanning |
JP2002117800A (ja) | 2000-10-05 | 2002-04-19 | Jeol Ltd | 電子線バイプリズム装置を備えた電子顕微鏡 |
US7015469B2 (en) * | 2003-01-09 | 2006-03-21 | Jeol Usa, Inc. | Electron holography method |
JP5331120B2 (ja) * | 2007-10-30 | 2013-10-30 | ニュー・ヨーク・ユニヴァーシティ | ホログラフィックビデオ顕微鏡による粒子の追跡および特徴付け |
US9316578B2 (en) | 2008-10-30 | 2016-04-19 | New York University | Automated real-time particle characterization and three-dimensional velocimetry with holographic video microscopy |
US10983041B2 (en) | 2014-02-12 | 2021-04-20 | New York University | Fast feature identification for holographic tracking and characterization of colloidal particles |
ES2913524T3 (es) | 2014-11-12 | 2022-06-02 | Univ New York | Huellas coloidales para materiales blandos usando caracterización holográfica total |
WO2017048960A1 (en) * | 2015-09-18 | 2017-03-23 | New York University | Holographic detection and characterization of large impurity particles in precision slurries |
US11385157B2 (en) | 2016-02-08 | 2022-07-12 | New York University | Holographic characterization of protein aggregates |
US10670677B2 (en) | 2016-04-22 | 2020-06-02 | New York University | Multi-slice acceleration for magnetic resonance fingerprinting |
US11543338B2 (en) | 2019-10-25 | 2023-01-03 | New York University | Holographic characterization of irregular particles |
US11948302B2 (en) | 2020-03-09 | 2024-04-02 | New York University | Automated holographic video microscopy assay |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3591715A (en) * | 1969-10-13 | 1971-07-06 | Us Navy | Variable width video edge detector |
DE2204654C3 (de) * | 1972-01-28 | 1974-10-10 | Siemens Ag, 1000 Berlin Und 8000 Muenchen | Korpuskularstrahlgerät mit einem Leuchtschirm und einer Fernsehkamera |
JPS5331048B2 (de) * | 1972-06-15 | 1978-08-31 | ||
US3889056A (en) * | 1972-07-10 | 1975-06-10 | Coded Signatures Inc | Video signature decoder and comparator and method |
JPS5026470A (de) * | 1973-07-09 | 1975-03-19 | ||
JPS5033891A (de) * | 1973-07-25 | 1975-04-01 | ||
US4025898A (en) * | 1975-04-28 | 1977-05-24 | Lew Shaw | Recording representations of disrupted space patterns |
JPS5258980A (en) * | 1975-11-11 | 1977-05-14 | Mitsubishi Electric Corp | Optical measuring device for fringe patterns |
US4102577A (en) * | 1977-01-04 | 1978-07-25 | Fuji Photo Optical Co., Ltd. | Method of forming moire contour lines |
JPS53136425A (en) * | 1977-05-04 | 1978-11-29 | Nippon Telegr & Teleph Corp <Ntt> | Recording, regenerating and display system for contour moire stripe |
JPS5853504B2 (ja) * | 1979-07-03 | 1983-11-29 | 富士通株式会社 | 集積回路装置の試験方法 |
JPS5645560A (en) * | 1979-09-19 | 1981-04-25 | Hitachi Ltd | Oblique-image displaying system for scanning electron microscope or the like |
-
1982
- 1982-03-12 JP JP57038013A patent/JPS58155636A/ja active Granted
-
1983
- 1983-02-02 CA CA000420771A patent/CA1204226A/en not_active Expired
- 1983-02-10 DE DE8383101275T patent/DE3381664D1/de not_active Expired - Lifetime
- 1983-02-10 EP EP83101275A patent/EP0088890B1/de not_active Expired
- 1983-03-04 US US06/472,232 patent/US4532422A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
CA1204226A (en) | 1986-05-06 |
EP0088890B1 (de) | 1990-06-13 |
EP0088890A3 (en) | 1986-06-25 |
US4532422A (en) | 1985-07-30 |
EP0088890A2 (de) | 1983-09-21 |
JPS58155636A (ja) | 1983-09-16 |
JPH0377619B2 (de) | 1991-12-11 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |