DE3379813D1 - Sampling circuit - Google Patents

Sampling circuit

Info

Publication number
DE3379813D1
DE3379813D1 DE8383106012T DE3379813T DE3379813D1 DE 3379813 D1 DE3379813 D1 DE 3379813D1 DE 8383106012 T DE8383106012 T DE 8383106012T DE 3379813 T DE3379813 T DE 3379813T DE 3379813 D1 DE3379813 D1 DE 3379813D1
Authority
DE
Germany
Prior art keywords
sampling circuit
sampling
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE8383106012T
Other languages
German (de)
English (en)
Inventor
Tsutomu Sugawara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Application granted granted Critical
Publication of DE3379813D1 publication Critical patent/DE3379813D1/de
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K17/00Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/51Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
    • H03K17/56Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices
    • H03K17/60Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being bipolar transistors
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C27/00Electric analogue stores, e.g. for storing instantaneous values
    • G11C27/02Sample-and-hold arrangements
    • G11C27/024Sample-and-hold arrangements using a capacitive memory element
    • G11C27/026Sample-and-hold arrangements using a capacitive memory element associated with an amplifier
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C27/00Electric analogue stores, e.g. for storing instantaneous values
    • G11C27/02Sample-and-hold arrangements
DE8383106012T 1982-06-28 1983-06-20 Sampling circuit Expired DE3379813D1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57111216A JPS592433A (ja) 1982-06-28 1982-06-28 サンプル回路

Publications (1)

Publication Number Publication Date
DE3379813D1 true DE3379813D1 (en) 1989-06-08

Family

ID=14555464

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8383106012T Expired DE3379813D1 (en) 1982-06-28 1983-06-20 Sampling circuit

Country Status (5)

Country Link
US (1) US4559457A (US20100056889A1-20100304-C00004.png)
EP (1) EP0097902B1 (US20100056889A1-20100304-C00004.png)
JP (1) JPS592433A (US20100056889A1-20100304-C00004.png)
KR (1) KR860000906B1 (US20100056889A1-20100304-C00004.png)
DE (1) DE3379813D1 (US20100056889A1-20100304-C00004.png)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL8403819A (nl) * 1984-12-17 1986-07-16 Philips Nv Schakelinrichting voor het onderdrukken van een signaal.
US4806790A (en) * 1987-02-16 1989-02-21 Nec Corporation Sample-and-hold circuit
US5111072A (en) * 1990-08-29 1992-05-05 Ncr Corporation Sample-and-hold switch with low on resistance and reduced charge injection
WO2001073789A1 (en) * 2000-03-28 2001-10-04 Koninklijke Philips Electronics N.V. A track and hold amplifier
WO2008101161A1 (en) * 2007-02-15 2008-08-21 Delphi Technologies, Inc. Liquid properties sensor circuit
KR101293116B1 (ko) * 2012-04-24 2013-08-02 주식회사 오토산업 전류센서의 비대칭 반전 출력 특성 구현 장치

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3526786A (en) * 1967-09-19 1970-09-01 Honeywell Inc Control apparatus
US3694668A (en) * 1970-01-02 1972-09-26 Bunker Ramo Track and hold system
US3643110A (en) * 1970-11-30 1972-02-15 Motorola Inc Sample and hold circuit
JPS56137598A (en) * 1980-03-27 1981-10-27 Victor Co Of Japan Ltd Sample hold circuit

Also Published As

Publication number Publication date
KR840005288A (ko) 1984-11-05
JPS592433A (ja) 1984-01-09
EP0097902B1 (en) 1989-05-03
JPH0226815B2 (US20100056889A1-20100304-C00004.png) 1990-06-13
EP0097902A2 (en) 1984-01-11
US4559457A (en) 1985-12-17
KR860000906B1 (ko) 1986-07-16
EP0097902A3 (en) 1987-03-25

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee