DE3379075D1 - X-ray examination apparatus - Google Patents
X-ray examination apparatusInfo
- Publication number
- DE3379075D1 DE3379075D1 DE8383201456T DE3379075T DE3379075D1 DE 3379075 D1 DE3379075 D1 DE 3379075D1 DE 8383201456 T DE8383201456 T DE 8383201456T DE 3379075 T DE3379075 T DE 3379075T DE 3379075 D1 DE3379075 D1 DE 3379075D1
- Authority
- DE
- Germany
- Prior art keywords
- examination apparatus
- ray examination
- ray
- examination
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP83201456A EP0137078B1 (de) | 1983-10-12 | 1983-10-12 | Röntgenuntersuchungsgerät |
Publications (1)
Publication Number | Publication Date |
---|---|
DE3379075D1 true DE3379075D1 (en) | 1989-03-02 |
Family
ID=8190998
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE8383201456T Expired DE3379075D1 (en) | 1983-10-12 | 1983-10-12 | X-ray examination apparatus |
Country Status (4)
Country | Link |
---|---|
US (1) | US4691334A (de) |
EP (1) | EP0137078B1 (de) |
JP (1) | JPS60122362A (de) |
DE (1) | DE3379075D1 (de) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CA1257714A (en) * | 1985-11-12 | 1989-07-18 | Michael Goldowsky | Goniometer |
EP0512620A3 (de) * | 1991-05-07 | 1995-07-05 | Koninklijke Philips Electronics N.V. | Röntgenanalyseapparat |
JP7485872B6 (ja) * | 2021-03-22 | 2024-06-18 | 株式会社リガク | 放射線測定装置 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
NL98987C (de) * | 1953-01-26 | |||
DE1245164B (de) * | 1964-05-23 | 1967-07-20 | Chirana Praha Np | Diffraktionsgoniometer, insbesondere Roentgengoniometer |
US3322948A (en) * | 1964-12-21 | 1967-05-30 | Owens Illinois Inc | X-ray diffraction goniometer wherein the specimen is stationary and the source and detector are movable |
US3440419A (en) * | 1966-02-03 | 1969-04-22 | California Inst Res Found | Dual purpose optical instrument capable of simultaneously acting as spectrometer and diffractometer |
US3852594A (en) * | 1973-07-25 | 1974-12-03 | Pepi Inc | X-ray diffraction apparatus |
US4095103A (en) * | 1976-03-12 | 1978-06-13 | Northwestern University | Apparatus and method for determination of residual stress in crystalline substances |
JPS5332789A (en) * | 1976-09-08 | 1978-03-28 | Hitachi Ltd | Method and apparatus for measuring of stress of white color x-ray |
JPS5772050A (en) * | 1980-10-22 | 1982-05-06 | Jeol Ltd | Goniometer such as x-ray microanalyzer |
DE3125803A1 (de) * | 1981-06-30 | 1983-01-13 | Siemens AG, 1000 Berlin und 8000 München | Kristall-roentgen-sequenzspektrometer |
-
1983
- 1983-10-12 DE DE8383201456T patent/DE3379075D1/de not_active Expired
- 1983-10-12 EP EP83201456A patent/EP0137078B1/de not_active Expired
-
1984
- 1984-10-11 US US06/659,799 patent/US4691334A/en not_active Expired - Fee Related
- 1984-10-12 JP JP59212784A patent/JPS60122362A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
EP0137078B1 (de) | 1989-01-25 |
JPS60122362A (ja) | 1985-06-29 |
EP0137078A1 (de) | 1985-04-17 |
US4691334A (en) | 1987-09-01 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |