DE3373534D1 - Measuring machine - Google Patents

Measuring machine

Info

Publication number
DE3373534D1
DE3373534D1 DE8383304431T DE3373534T DE3373534D1 DE 3373534 D1 DE3373534 D1 DE 3373534D1 DE 8383304431 T DE8383304431 T DE 8383304431T DE 3373534 T DE3373534 T DE 3373534T DE 3373534 D1 DE3373534 D1 DE 3373534D1
Authority
DE
Germany
Prior art keywords
measuring machine
measuring
machine
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE8383304431T
Other languages
English (en)
Inventor
Takao Katayama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Application granted granted Critical
Publication of DE3373534D1 publication Critical patent/DE3373534D1/de
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/02—Measuring arrangements characterised by the use of mechanical techniques for measuring length, width or thickness

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
DE8383304431T 1982-09-14 1983-08-01 Measuring machine Expired DE3373534D1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57158880A JPS5948601A (ja) 1982-09-14 1982-09-14 測長器

Publications (1)

Publication Number Publication Date
DE3373534D1 true DE3373534D1 (en) 1987-10-15

Family

ID=15681402

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8383304431T Expired DE3373534D1 (en) 1982-09-14 1983-08-01 Measuring machine

Country Status (4)

Country Link
US (1) US4550506A (de)
EP (1) EP0106437B1 (de)
JP (1) JPS5948601A (de)
DE (1) DE3373534D1 (de)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0573511U (ja) * 1992-03-06 1993-10-08 株式会社ミクロテック 触針式測定器
US5870833A (en) * 1997-08-06 1999-02-16 Clorox Company Balancing container finish measuring device
JP4121615B2 (ja) * 1997-10-31 2008-07-23 オリンパス株式会社 内視鏡
WO2009046109A2 (en) * 2007-10-05 2009-04-09 Oceaneering International, Inc. Controllable caliper
JP5770763B2 (ja) * 2013-02-26 2015-08-26 株式会社サンテック 測定器

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US1531357A (en) * 1924-03-07 1925-03-31 Elisha Jesse Cady Micrometer caliper
US2594077A (en) * 1951-05-10 1952-04-22 Sheffield Corp Gauging device
US4008523A (en) * 1972-02-28 1977-02-22 Optograms, Inc. Digital electro-optical micrometer and gages
GB1353441A (en) * 1972-04-07 1974-05-15 Werkzeugmasch Okt Veb Measuring instrument
US3987552A (en) * 1974-07-01 1976-10-26 Inductosyn Corporation Measuring apparatus
US4080740A (en) * 1977-02-08 1978-03-28 Haley Ernest K Web centerline locating system
US4208796A (en) * 1979-02-23 1980-06-24 Colt Industries Operating Corp. (Pratt & Whitney Machine Tool Division) Gage for direct internal measurement
JPS5641846A (en) * 1979-09-11 1981-04-18 Nec Corp Manufacture of optical fiber base material
JPS5679901A (en) * 1979-12-05 1981-06-30 Mitsutoyo Mfg Co Ltd Length measuring instrument
IT1128168B (it) * 1980-07-22 1986-05-28 Micrometro Italia Srl Micrometro a lettura digitale

Also Published As

Publication number Publication date
JPS5948601A (ja) 1984-03-19
EP0106437B1 (de) 1987-09-09
EP0106437A1 (de) 1984-04-25
US4550506A (en) 1985-11-05

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee