DE3370374D1 - Ellipsometers - Google Patents

Ellipsometers

Info

Publication number
DE3370374D1
DE3370374D1 DE8383106329T DE3370374T DE3370374D1 DE 3370374 D1 DE3370374 D1 DE 3370374D1 DE 8383106329 T DE8383106329 T DE 8383106329T DE 3370374 T DE3370374 T DE 3370374T DE 3370374 D1 DE3370374 D1 DE 3370374D1
Authority
DE
Germany
Prior art keywords
ellipsometers
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE8383106329T
Other languages
English (en)
Inventor
Jean-Claude Andre Chastang
Walter William Hildenbrand
Menachem Levanoni
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Application granted granted Critical
Publication of DE3370374D1 publication Critical patent/DE3370374D1/de
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G01B11/0641—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of polarization
    • G01B11/065—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of polarization using one or more discrete wavelengths
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G01N21/211—Ellipsometry
DE8383106329T 1982-08-09 1983-06-29 Ellipsometers Expired DE3370374D1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US40658782A 1982-08-09 1982-08-09

Publications (1)

Publication Number Publication Date
DE3370374D1 true DE3370374D1 (en) 1987-04-23

Family

ID=23608645

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8383106329T Expired DE3370374D1 (en) 1982-08-09 1983-06-29 Ellipsometers

Country Status (3)

Country Link
EP (1) EP0102470B1 (de)
JP (1) JPS5930004A (de)
DE (1) DE3370374D1 (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4672196A (en) * 1984-02-02 1987-06-09 Canino Lawrence S Method and apparatus for measuring properties of thin materials using polarized light
GB2343509B (en) * 1986-05-23 2001-01-17 British Aerospace Laser detectors
JPH066906Y2 (ja) * 1987-12-16 1994-02-23 西部瓦斯株式会社 コイル管の巻きぐせ解消装置
GB2220481B (en) * 1988-01-11 1991-11-06 Commw Of Australia Differential ellipsometer
DE68904230T2 (de) * 1988-04-29 1993-05-06 Hughes Aircraft Co System zur automatischen kontrolle der deposition einer schicht in real-zeit.
DE4013211A1 (de) * 1990-04-25 1991-10-31 Fraunhofer Ges Forschung Ellipsometer
US5277747A (en) * 1992-09-15 1994-01-11 Bell Communications Research, Inc. Extraction of spatially varying dielectric function from ellipsometric data
FR2698443B1 (fr) * 1992-11-25 1995-03-10 Lyon Ecole Centrale Procédé et appareil pour mesurer par ellipsométrie la température d'un objet, notamment semi-conducteur.

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5017874A (de) * 1973-06-15 1975-02-25
US3880524A (en) * 1973-06-25 1975-04-29 Ibm Automatic ellipsometer
GB1493087A (en) * 1975-04-28 1977-11-23 Ibm Ellipsometer
US4105337A (en) * 1977-05-11 1978-08-08 Bell Telephone Laboratories, Incorporated Self-induced rotation ellipsometer
US4168126A (en) * 1977-07-05 1979-09-18 Altman Associates, Inc. Electro-optical measuring system using precision light translator
JPS5599045A (en) * 1979-01-24 1980-07-28 Japan Spectroscopic Co Surface reflection measuring apparatus

Also Published As

Publication number Publication date
EP0102470A1 (de) 1984-03-14
JPH0326764B2 (de) 1991-04-11
JPS5930004A (ja) 1984-02-17
EP0102470B1 (de) 1987-03-18

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee