DE3313449C2 - - Google Patents

Info

Publication number
DE3313449C2
DE3313449C2 DE19833313449 DE3313449A DE3313449C2 DE 3313449 C2 DE3313449 C2 DE 3313449C2 DE 19833313449 DE19833313449 DE 19833313449 DE 3313449 A DE3313449 A DE 3313449A DE 3313449 C2 DE3313449 C2 DE 3313449C2
Authority
DE
Germany
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE19833313449
Other languages
German (de)
Other versions
DE3313449A1 (de
Inventor
Helmut Dipl.-Ing. 7750 Konstanz De Mittelbach
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
COMPUTER GESELLSCHAFT KONSTANZ MBH 7750 KONSTANZ DE
Original Assignee
COMPUTER GESELLSCHAFT KONSTANZ MBH 7750 KONSTANZ DE
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by COMPUTER GESELLSCHAFT KONSTANZ MBH 7750 KONSTANZ DE filed Critical COMPUTER GESELLSCHAFT KONSTANZ MBH 7750 KONSTANZ DE
Priority to DE19833313449 priority Critical patent/DE3313449A1/de
Publication of DE3313449A1 publication Critical patent/DE3313449A1/de
Application granted granted Critical
Publication of DE3313449C2 publication Critical patent/DE3313449C2/de
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31905—Interface with the device under test [DUT], e.g. arrangements between the test head and the DUT, mechanical aspects, fixture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
DE19833313449 1983-04-13 1983-04-13 Vorrichtung zum pruefen von flachbaugruppen Granted DE3313449A1 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE19833313449 DE3313449A1 (de) 1983-04-13 1983-04-13 Vorrichtung zum pruefen von flachbaugruppen

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19833313449 DE3313449A1 (de) 1983-04-13 1983-04-13 Vorrichtung zum pruefen von flachbaugruppen

Publications (2)

Publication Number Publication Date
DE3313449A1 DE3313449A1 (de) 1984-10-25
DE3313449C2 true DE3313449C2 (es) 1987-01-02

Family

ID=6196325

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19833313449 Granted DE3313449A1 (de) 1983-04-13 1983-04-13 Vorrichtung zum pruefen von flachbaugruppen

Country Status (1)

Country Link
DE (1) DE3313449A1 (es)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102721835A (zh) * 2012-07-03 2012-10-10 航天科工防御技术研究试验中心 测试适配器

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61141022A (ja) * 1984-12-14 1986-06-28 インタ−ナショナル　ビジネス　マシ−ンズ　コ−ポレ−ション キ−ボ−ド・インタ−フエ−ス回路の試験装置
DE3544137A1 (de) * 1985-12-13 1987-06-19 Siemens Ag Anordnung zum unmittelbaren zurueckfuehren von sendedaten als empfangsdaten in einem nachrichtentechnischen geraet
DE4124708A1 (de) * 1991-07-25 1993-01-28 Siemens Ag Einrichtung zum pruefen von entsprechend dem anwendungsfall miteinander verbundenen elektronischen komponenten einer baugruppe
DE4213905A1 (de) * 1992-04-28 1993-11-04 Siemens Nixdorf Inf Syst Verfahren zum pruefen von mit einer vielzahl von unterschiedlichen bauelementen bestueckten baugruppen
DE4442531A1 (de) * 1994-11-30 1996-06-05 Alcatel Mobile Comm Deutsch Verfahren zum Testen einer Funkeinrichtung

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2511923C3 (de) * 1975-03-19 1981-11-12 Telefonbau Und Normalzeit Gmbh, 6000 Frankfurt Schaltungsanordnung zur Funktionsprüfung und Fehlerlokalisierung von Flachbangruppen

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102721835A (zh) * 2012-07-03 2012-10-10 航天科工防御技术研究试验中心 测试适配器
CN102721835B (zh) * 2012-07-03 2014-06-04 航天科工防御技术研究试验中心 测试适配器

Also Published As

Publication number Publication date
DE3313449A1 (de) 1984-10-25

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Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
D2 Grant after examination
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee