DE3171862D1 - Test system - Google Patents
Test systemInfo
- Publication number
- DE3171862D1 DE3171862D1 DE8181110860T DE3171862T DE3171862D1 DE 3171862 D1 DE3171862 D1 DE 3171862D1 DE 8181110860 T DE8181110860 T DE 8181110860T DE 3171862 T DE3171862 T DE 3171862T DE 3171862 D1 DE3171862 D1 DE 3171862D1
- Authority
- DE
- Germany
- Prior art keywords
- test system
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
- G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
- G01R31/31912—Tester/user interface
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/006—Identification
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Human Computer Interaction (AREA)
- Quality & Reliability (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Or Calibration Of Command Recording Devices (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE8181110860T DE3171862D1 (en) | 1981-04-23 | 1981-12-31 | Test system |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19813116079 DE3116079A1 (de) | 1981-04-23 | 1981-04-23 | Pruefsystem |
DE8181110860T DE3171862D1 (en) | 1981-04-23 | 1981-12-31 | Test system |
Publications (1)
Publication Number | Publication Date |
---|---|
DE3171862D1 true DE3171862D1 (en) | 1985-09-19 |
Family
ID=6130634
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE19813116079 Ceased DE3116079A1 (de) | 1981-04-23 | 1981-04-23 | Pruefsystem |
DE8181110860T Expired DE3171862D1 (en) | 1981-04-23 | 1981-12-31 | Test system |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE19813116079 Ceased DE3116079A1 (de) | 1981-04-23 | 1981-04-23 | Pruefsystem |
Country Status (3)
Country | Link |
---|---|
US (1) | US4488299A (de) |
EP (1) | EP0063650B1 (de) |
DE (2) | DE3116079A1 (de) |
Families Citing this family (31)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4617642A (en) * | 1982-05-06 | 1986-10-14 | Data General Corporation | Select switch responsive to a break code |
DE3244081A1 (de) * | 1982-11-29 | 1984-05-30 | Siemens AG, 1000 Berlin und 8000 München | Schaltungsanordnung zur adressierung von baugruppen |
US4630224A (en) * | 1984-04-19 | 1986-12-16 | The United States Of America As Represented By The Secretary Of The Navy | Automation initialization of reconfigurable on-line automatic test system |
JPS6125263A (ja) * | 1984-07-13 | 1986-02-04 | Sony Corp | 電子機器制御システム |
US4672529A (en) * | 1984-10-26 | 1987-06-09 | Autech Partners Ltd. | Self contained data acquisition apparatus and system |
US4686627A (en) * | 1984-12-24 | 1987-08-11 | Honeywell Inc. | Electrical test apparatus |
US4937827A (en) * | 1985-03-01 | 1990-06-26 | Mentor Graphics Corporation | Circuit verification accessory |
US4775930A (en) * | 1985-11-12 | 1988-10-04 | Westinghouse Electric Corp. | Electronic key check for ensuring proper cradles insertion by respective processing board |
US4744084A (en) * | 1986-02-27 | 1988-05-10 | Mentor Graphics Corporation | Hardware modeling system and method for simulating portions of electrical circuits |
DE3744200A1 (de) * | 1987-12-24 | 1989-07-13 | Heidelberger Druckmasch Ag | Vorrichtung, verfahren zur sicherung von daten |
US4947355A (en) * | 1988-05-05 | 1990-08-07 | John Fluke Mfg. Co., Inc. | Modular electronic instrument system having automated calibration capability |
US5036479A (en) * | 1989-04-20 | 1991-07-30 | Trw Inc. | Modular automated avionics test system |
US5067129A (en) * | 1989-08-16 | 1991-11-19 | International Business Machines Corp. | Service processor tester |
US5179345A (en) * | 1989-12-13 | 1993-01-12 | International Business Machines Corporation | Method and apparatus for analog testing |
US5157781A (en) * | 1990-01-02 | 1992-10-20 | Motorola, Inc. | Data processor test architecture |
US5086271A (en) * | 1990-01-12 | 1992-02-04 | Reliability Incorporated | Driver system and distributed transmission line network for driving devices under test |
US5414712A (en) * | 1991-07-23 | 1995-05-09 | Progressive Computing, Inc. | Method for transmitting data using a communication interface box |
DE4304366B4 (de) * | 1993-02-13 | 2004-01-29 | Diehl Stiftung & Co. | Elektronisches Schaltgerät |
US5793218A (en) * | 1995-12-15 | 1998-08-11 | Lear Astronics Corporation | Generic interface test adapter |
FR2751082B1 (fr) * | 1996-07-10 | 1998-11-06 | Aerospatiale | Dispositif de commutation notamment de systeme sous test |
US5896494A (en) * | 1996-12-31 | 1999-04-20 | Compaq Computer Corporation | Diagnostic module dispatcher |
US6064721A (en) * | 1997-10-22 | 2000-05-16 | Telecommunications Techniques Corporation | Modular test instrument |
US5956280A (en) * | 1998-03-02 | 1999-09-21 | Tanisys Technology, Inc. | Contact test method and system for memory testers |
US6891803B1 (en) | 1998-12-18 | 2005-05-10 | Sunrise Telecom, Inc. | Telecommunications transmission test set |
WO2000077649A1 (de) * | 1999-06-15 | 2000-12-21 | Ascom Ag | Verfahren zur kennzeichnung einer hardwarevariante einer elektrischen oder elektronischen hardwareeinheit |
US6515484B1 (en) * | 2000-10-31 | 2003-02-04 | Associated Research, Inc. | Electrical test instrument having an improved operator interface |
WO2004018386A2 (en) * | 2002-08-26 | 2004-03-04 | Merck & Co., Inc. | Acetophenone potentiators of metabotropic glutamate receptors |
US6975130B2 (en) * | 2003-12-30 | 2005-12-13 | Teradyne, Inc. | Techniques for controlling movement of a circuit board module along a card cage slot |
US7752004B1 (en) * | 2004-01-09 | 2010-07-06 | Cisco Technology, Inc. | Method and apparatus for configuring plurality of devices on printed circuit board into desired test port configuration |
JP2006275986A (ja) * | 2005-03-30 | 2006-10-12 | Advantest Corp | 診断プログラム、切替プログラム、試験装置、および診断方法 |
JP4571534B2 (ja) * | 2005-05-12 | 2010-10-27 | 株式会社アドバンテスト | 試験装置、診断プログラムおよび診断方法 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
AT273241B (de) * | 1967-12-01 | 1969-08-11 | Siemens Ag | Schaltungsanordung für Fernmeldeanlagen, insbesondere Fernsprechvermittlungsanlagen, mit zentralen und individuellen Geräten |
US4055801A (en) * | 1970-08-18 | 1977-10-25 | Pike Harold L | Automatic electronic test equipment and method |
DE2043992C2 (de) * | 1970-09-04 | 1979-05-23 | Siemens Ag, 1000 Berlin U. 8000 Muenchen | Schaltungsanordnung für Fernmeldeanlagen, insbesondere Fernsprechvermittlungsanlagen, mit zentralen und individuellen Geräten |
US3921139A (en) * | 1974-03-08 | 1975-11-18 | Westinghouse Electric Corp | Test system having memory means at test module |
DE2631483A1 (de) * | 1976-07-13 | 1978-01-19 | Siemens Ag | Verfahren zum pruefen von steckbaren einheiten in einem rechnergesteuerten pruefgeraet |
US4044244A (en) * | 1976-08-06 | 1977-08-23 | International Business Machines Corporation | Automatic tester for complex semiconductor components including combinations of logic, memory and analog devices and processes of testing thereof |
US4168796A (en) * | 1978-04-13 | 1979-09-25 | Ncr Corporation | Tester with driver/sensor circuit having programmable termination devices |
US4291404A (en) * | 1979-11-20 | 1981-09-22 | Lockheed Corporation | Automatic circuit tester with improved voltage regulator |
US4393498A (en) * | 1981-01-22 | 1983-07-12 | The Boeing Company | Method and apparatus for testing systems that communicate over digital buses by transmitting and receiving signals in the form of standardized multi-bit binary encoded words |
US4402055A (en) * | 1981-01-27 | 1983-08-30 | Westinghouse Electric Corp. | Automatic test system utilizing interchangeable test devices |
US4397021A (en) * | 1981-06-15 | 1983-08-02 | Westinghouse Electric Corp. | Multi-processor automatic test system |
-
1981
- 1981-04-23 DE DE19813116079 patent/DE3116079A1/de not_active Ceased
- 1981-12-31 EP EP19810110860 patent/EP0063650B1/de not_active Expired
- 1981-12-31 DE DE8181110860T patent/DE3171862D1/de not_active Expired
-
1982
- 1982-04-13 US US06/367,915 patent/US4488299A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
US4488299A (en) | 1984-12-11 |
EP0063650A1 (de) | 1982-11-03 |
DE3116079A1 (de) | 1982-11-11 |
EP0063650B1 (de) | 1985-08-14 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8363 | Opposition against the patent | ||
8339 | Ceased/non-payment of the annual fee |