DE3169482D1 - Ecl integrated circuit - Google Patents

Ecl integrated circuit

Info

Publication number
DE3169482D1
DE3169482D1 DE8181305983T DE3169482T DE3169482D1 DE 3169482 D1 DE3169482 D1 DE 3169482D1 DE 8181305983 T DE8181305983 T DE 8181305983T DE 3169482 T DE3169482 T DE 3169482T DE 3169482 D1 DE3169482 D1 DE 3169482D1
Authority
DE
Germany
Prior art keywords
integrated circuit
ecl integrated
ecl
circuit
integrated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE8181305983T
Other languages
English (en)
Inventor
Yasunori Kanai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Application granted granted Critical
Publication of DE3169482D1 publication Critical patent/DE3169482D1/de
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/003—Modifications for increasing the reliability for protection
    • H03K19/00307—Modifications for increasing the reliability for protection in bipolar transistor circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/316—Testing of analog circuits
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/02—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components
    • H03K19/08—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using semiconductor devices
    • H03K19/082—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using semiconductor devices using bipolar transistors
    • H03K19/086—Emitter coupled logic

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Computing Systems (AREA)
  • Mathematical Physics (AREA)
  • Power Engineering (AREA)
  • General Physics & Mathematics (AREA)
  • Logic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Bipolar Transistors (AREA)
  • Tests Of Electronic Circuits (AREA)
DE8181305983T 1980-12-25 1981-12-21 Ecl integrated circuit Expired DE3169482D1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55184563A JPS57107637A (en) 1980-12-25 1980-12-25 Ecl integrated circuit

Publications (1)

Publication Number Publication Date
DE3169482D1 true DE3169482D1 (en) 1985-04-25

Family

ID=16155390

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8181305983T Expired DE3169482D1 (en) 1980-12-25 1981-12-21 Ecl integrated circuit

Country Status (5)

Country Link
US (1) US4410816A (de)
EP (1) EP0055571B1 (de)
JP (1) JPS57107637A (de)
DE (1) DE3169482D1 (de)
IE (1) IE53052B1 (de)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57162838A (en) * 1981-03-31 1982-10-06 Fujitsu Ltd Emitter coupling type logical circuit
JPS6065557A (ja) * 1983-09-21 1985-04-15 Fujitsu Ltd 集積回路装置
US4719418A (en) * 1985-02-19 1988-01-12 International Business Machines Corporation Defect leakage screen system
US4656417A (en) * 1985-07-29 1987-04-07 International Business Machines Corporation Test circuit for differential cascode voltage switch
JPS62146014A (ja) * 1985-12-20 1987-06-30 Nec Corp エミツタ結合論理回路
US4692641A (en) * 1986-02-13 1987-09-08 Burr-Brown Corporation Level shifting circuitry for serial-to-parallel converter
US4682058A (en) * 1986-07-03 1987-07-21 Unisys Corporation Three-state logic circuit for wire-ORing to a data bus
US4967151A (en) * 1988-08-17 1990-10-30 International Business Machines Corporation Method and apparatus for detecting faults in differential current switching logic circuits
US4942358A (en) * 1988-11-02 1990-07-17 Motorola, Inc. Integrated circuit option identification circuit and method
US4902916A (en) * 1988-11-14 1990-02-20 International Business Machines Corporation Identification of defects in emitter-coupled logic circuits
US5291075A (en) * 1990-10-01 1994-03-01 Motorola, Inc. Fault detection circuit
US5742179A (en) * 1994-01-27 1998-04-21 Dyna Logic Corporation High speed programmable logic architecture
US5614844A (en) * 1994-01-27 1997-03-25 Dyna Logic Corporation High speed programmable logic architecture
US5463332A (en) * 1994-07-22 1995-10-31 National Semiconductor Corporation Multiple differential input ECL or/nor gate
US6246259B1 (en) 1998-02-23 2001-06-12 Xilinx, Inc. High-speed programmable logic architecture having active CMOS device drivers
JP4447515B2 (ja) 2005-06-08 2010-04-07 トヨタ紡織株式会社 車両用シートの操作レバー配置構造

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3430071A (en) * 1965-04-05 1969-02-25 Rca Corp Logic circuit
US4074188A (en) * 1975-08-01 1978-02-14 Testline Instruments, Inc. Low impedance fault detection system and method
JPS5931892B2 (ja) * 1976-11-19 1984-08-04 日本電気株式会社 半導体集積回路

Also Published As

Publication number Publication date
IE53052B1 (en) 1988-05-25
EP0055571A3 (en) 1982-12-01
JPS57107637A (en) 1982-07-05
JPH0357651B2 (de) 1991-09-02
IE813065L (en) 1982-06-25
US4410816A (en) 1983-10-18
EP0055571A2 (de) 1982-07-07
EP0055571B1 (de) 1985-03-20

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Legal Events

Date Code Title Description
8339 Ceased/non-payment of the annual fee