DE3150848C2 - - Google Patents

Info

Publication number
DE3150848C2
DE3150848C2 DE3150848A DE3150848A DE3150848C2 DE 3150848 C2 DE3150848 C2 DE 3150848C2 DE 3150848 A DE3150848 A DE 3150848A DE 3150848 A DE3150848 A DE 3150848A DE 3150848 C2 DE3150848 C2 DE 3150848C2
Authority
DE
Germany
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE3150848A
Other languages
German (de)
Other versions
DE3150848C3 (de
DE3150848A1 (de
Inventor
Hirotoshi Hagiwara
Hideo Hiraoka
Masaji Machida Tokio/Tokyo Jp Ishii
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Denka Co Ltd
Original Assignee
Denki Kagaku Kogyo KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Denki Kagaku Kogyo KK filed Critical Denki Kagaku Kogyo KK
Publication of DE3150848A1 publication Critical patent/DE3150848A1/de
Application granted granted Critical
Publication of DE3150848C2 publication Critical patent/DE3150848C2/de
Publication of DE3150848C3 publication Critical patent/DE3150848C3/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J1/00Details of electrodes, of magnetic control means, of screens, or of the mounting or spacing thereof, common to two or more basic types of discharge tubes or lamps
    • H01J1/02Main electrodes
    • H01J1/30Cold cathodes, e.g. field-emissive cathode
    • H01J1/304Field-emissive cathodes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/04Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
    • H01J37/06Electron sources; Electron guns
    • H01J37/073Electron guns using field emission, photo emission, or secondary emission electron sources
DE3150848A 1980-12-27 1981-12-22 Elektronenstrahlerzeugungssystem für hohe Helligkeit Expired - Fee Related DE3150848C3 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18551880A JPS57128433A (en) 1980-12-27 1980-12-27 High luminance electron gun

Publications (3)

Publication Number Publication Date
DE3150848A1 DE3150848A1 (de) 1982-08-19
DE3150848C2 true DE3150848C2 (US20040232935A1-20041125-M00002.png) 1987-03-05
DE3150848C3 DE3150848C3 (de) 1994-12-22

Family

ID=16172185

Family Applications (1)

Application Number Title Priority Date Filing Date
DE3150848A Expired - Fee Related DE3150848C3 (de) 1980-12-27 1981-12-22 Elektronenstrahlerzeugungssystem für hohe Helligkeit

Country Status (4)

Country Link
US (1) US4591754A (US20040232935A1-20041125-M00002.png)
JP (1) JPS57128433A (US20040232935A1-20041125-M00002.png)
DE (1) DE3150848C3 (US20040232935A1-20041125-M00002.png)
GB (1) GB2090698B (US20040232935A1-20041125-M00002.png)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0309767A1 (de) * 1987-09-28 1989-04-05 Siemens Aktiengesellschaft Strahlerzeugendes System für Elektronenstrahlmessgeräte

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3887891T2 (de) * 1988-11-01 1994-08-11 Ibm Niederspannungsquelle für schmale Elektronen-/Ionenstrahlenbündel.
US5633507A (en) * 1995-09-19 1997-05-27 International Business Machines Corporation Electron beam lithography system with low brightness
JP4052731B2 (ja) * 1998-06-18 2008-02-27 株式会社アドバンテスト 電子銃
US6252339B1 (en) 1998-09-17 2001-06-26 Nikon Corporation Removable bombardment filament-module for electron beam projection systems
JP2009146884A (ja) * 2007-11-22 2009-07-02 Mamoru Nakasuji 電子銃及び電子線装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58148B2 (ja) * 1972-08-22 1983-01-05 日本電子株式会社 デンシジユウ
US4055780A (en) * 1975-04-10 1977-10-25 National Institute For Researches In Inorganic Materials Thermionic emission cathode having a tip of a single crystal of lanthanum hexaboride
JPS5277661A (en) * 1975-12-24 1977-06-30 Jeol Ltd Electron gun
US4054946A (en) * 1976-09-28 1977-10-18 Bell Telephone Laboratories, Incorporated Electron source of a single crystal of lanthanum hexaboride emitting surface of (110) crystal plane
JPS55131946A (en) * 1979-03-31 1980-10-14 Chiyou Lsi Gijutsu Kenkyu Kumiai Electron gun

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0309767A1 (de) * 1987-09-28 1989-04-05 Siemens Aktiengesellschaft Strahlerzeugendes System für Elektronenstrahlmessgeräte

Also Published As

Publication number Publication date
GB2090698B (en) 1984-08-30
DE3150848C3 (de) 1994-12-22
JPS57128433A (en) 1982-08-10
DE3150848A1 (de) 1982-08-19
US4591754A (en) 1986-05-27
GB2090698A (en) 1982-07-14

Similar Documents

Publication Publication Date Title
FR2475522B1 (US20040232935A1-20041125-M00002.png)
FR2478872B1 (US20040232935A1-20041125-M00002.png)
FR2475446B1 (US20040232935A1-20041125-M00002.png)
FR2479224B1 (US20040232935A1-20041125-M00002.png)
FR2476819B1 (US20040232935A1-20041125-M00002.png)
FR2476551B1 (US20040232935A1-20041125-M00002.png)
FR2476421B1 (US20040232935A1-20041125-M00002.png)
FR2479063B1 (US20040232935A1-20041125-M00002.png)
FR2475113B1 (US20040232935A1-20041125-M00002.png)
FR2475151B1 (US20040232935A1-20041125-M00002.png)
FR2474988B1 (US20040232935A1-20041125-M00002.png)
FR2479000B1 (US20040232935A1-20041125-M00002.png)
DE3150848C2 (US20040232935A1-20041125-M00002.png)
FR2480321B1 (US20040232935A1-20041125-M00002.png)
FR2480277B1 (US20040232935A1-20041125-M00002.png)
FR2478366B1 (US20040232935A1-20041125-M00002.png)
FR2478064B1 (US20040232935A1-20041125-M00002.png)
FR2476730B1 (US20040232935A1-20041125-M00002.png)
FR2479672B1 (US20040232935A1-20041125-M00002.png)
FR2477997B1 (US20040232935A1-20041125-M00002.png)
FR2479179B1 (US20040232935A1-20041125-M00002.png)
FR2480560B3 (US20040232935A1-20041125-M00002.png)
DE3008541C2 (US20040232935A1-20041125-M00002.png)
FR2475424B1 (US20040232935A1-20041125-M00002.png)
FR2478633B1 (US20040232935A1-20041125-M00002.png)

Legal Events

Date Code Title Description
8110 Request for examination paragraph 44
8125 Change of the main classification

Ipc: H01J 37/063

D2 Grant after examination
8363 Opposition against the patent
8366 Restricted maintained after opposition proceedings
8305 Restricted maintenance of patent after opposition
D4 Patent maintained restricted
8339 Ceased/non-payment of the annual fee