DE3069974D1 - Nonvolatile semiconductor memory device - Google Patents

Nonvolatile semiconductor memory device

Info

Publication number
DE3069974D1
DE3069974D1 DE8080105168T DE3069974T DE3069974D1 DE 3069974 D1 DE3069974 D1 DE 3069974D1 DE 8080105168 T DE8080105168 T DE 8080105168T DE 3069974 T DE3069974 T DE 3069974T DE 3069974 D1 DE3069974 D1 DE 3069974D1
Authority
DE
Germany
Prior art keywords
memory device
semiconductor memory
nonvolatile semiconductor
nonvolatile
semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE8080105168T
Other languages
English (en)
Inventor
Hiroshi Iwahashi
Masamichi Asano
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Application granted granted Critical
Publication of DE3069974D1 publication Critical patent/DE3069974D1/de
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76Unipolar devices, e.g. field effect transistors
    • H01L29/772Field effect transistors
    • H01L29/78Field effect transistors with field effect produced by an insulated gate
    • H01L29/788Field effect transistors with field effect produced by an insulated gate with floating gate
    • H01L29/7881Programmable transistors with only two possible levels of programmation

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Semiconductor Memories (AREA)
  • Non-Volatile Memory (AREA)
DE8080105168T 1979-08-31 1980-08-29 Nonvolatile semiconductor memory device Expired DE3069974D1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11111179A JPS5636166A (en) 1979-08-31 1979-08-31 Nonvolatile semiconductor memory

Publications (1)

Publication Number Publication Date
DE3069974D1 true DE3069974D1 (en) 1985-02-28

Family

ID=14552681

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8080105168T Expired DE3069974D1 (en) 1979-08-31 1980-08-29 Nonvolatile semiconductor memory device

Country Status (4)

Country Link
US (1) US4395724A (de)
EP (1) EP0024735B1 (de)
JP (1) JPS5636166A (de)
DE (1) DE3069974D1 (de)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4577215A (en) * 1983-02-18 1986-03-18 Rca Corporation Dual word line, electrically alterable, nonvolatile floating gate memory device
FR2638285B1 (fr) * 1988-10-25 1992-06-19 Commissariat Energie Atomique Circuit integre a haute densite d'integration tel que memoire eprom et procede d'obtention correspondant
JPH0379059A (ja) * 1989-08-22 1991-04-04 Hitachi Ltd 半導体集積回路装置およびその製造方法
JPH0677440A (ja) * 1992-08-27 1994-03-18 Mitsubishi Electric Corp 不揮発性半導体記憶装置およびその製造方法
JP2848211B2 (ja) * 1993-10-08 1999-01-20 日本電気株式会社 不揮発性半導体記憶装置
US5780894A (en) * 1996-02-23 1998-07-14 Nippon Steel Corporation Nonvolatile semiconductor memory device having stacked-gate type transistor
DE19929619C2 (de) * 1999-06-28 2001-06-28 Infineon Technologies Ag Halbleiter-Speicherzellenpaar

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL298353A (de) * 1963-09-25
JPS525233B2 (de) * 1972-02-29 1977-02-10
US4161039A (en) * 1976-12-15 1979-07-10 Siemens Aktiengesellschaft N-Channel storage FET
US4099196A (en) * 1977-06-29 1978-07-04 Intel Corporation Triple layer polysilicon cell
JPS5925381B2 (ja) * 1977-12-30 1984-06-16 富士通株式会社 半導体集積回路装置
US4203158A (en) * 1978-02-24 1980-05-13 Intel Corporation Electrically programmable and erasable MOS floating gate memory device employing tunneling and method of fabricating same
JPS55166964A (en) * 1979-06-14 1980-12-26 Mitsubishi Electric Corp Avalanche injection type non-volatile semiconductor memory

Also Published As

Publication number Publication date
EP0024735A3 (en) 1981-08-26
EP0024735B1 (de) 1985-01-16
US4395724A (en) 1983-07-26
JPS5636166A (en) 1981-04-09
EP0024735A2 (de) 1981-03-11
JPS6244702B2 (de) 1987-09-22

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Legal Events

Date Code Title Description
8320 Willingness to grant licences declared (paragraph 23)