DE29504037U1 - Test and power supply device for test objects - Google Patents

Test and power supply device for test objects

Info

Publication number
DE29504037U1
DE29504037U1 DE29504037U DE29504037U DE29504037U1 DE 29504037 U1 DE29504037 U1 DE 29504037U1 DE 29504037 U DE29504037 U DE 29504037U DE 29504037 U DE29504037 U DE 29504037U DE 29504037 U1 DE29504037 U1 DE 29504037U1
Authority
DE
Germany
Prior art keywords
test
power supply
supply device
objects
test objects
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE29504037U
Other languages
German (de)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Feinmetall GmbH
Original Assignee
Feinmetall GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Feinmetall GmbH filed Critical Feinmetall GmbH
Priority to DE29504037U priority Critical patent/DE29504037U1/en
Publication of DE29504037U1 publication Critical patent/DE29504037U1/en
Priority to DE19522428A priority patent/DE19522428C1/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/66—Structural association with built-in electrical component
    • H01R13/6608—Structural association with built-in electrical component with built-in single component
    • H01R13/6625—Structural association with built-in electrical component with built-in single component with capacitive component
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2831—Testing of materials or semi-finished products, e.g. semiconductor wafers or substrates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
DE29504037U 1995-03-09 1995-03-09 Test and power supply device for test objects Expired - Lifetime DE29504037U1 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
DE29504037U DE29504037U1 (en) 1995-03-09 1995-03-09 Test and power supply device for test objects
DE19522428A DE19522428C1 (en) 1995-03-09 1995-06-21 Test and current supply device for test items esp. for testing chips on wafer with several connection pads

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE29504037U DE29504037U1 (en) 1995-03-09 1995-03-09 Test and power supply device for test objects

Publications (1)

Publication Number Publication Date
DE29504037U1 true DE29504037U1 (en) 1995-04-27

Family

ID=8005103

Family Applications (2)

Application Number Title Priority Date Filing Date
DE29504037U Expired - Lifetime DE29504037U1 (en) 1995-03-09 1995-03-09 Test and power supply device for test objects
DE19522428A Expired - Fee Related DE19522428C1 (en) 1995-03-09 1995-06-21 Test and current supply device for test items esp. for testing chips on wafer with several connection pads

Family Applications After (1)

Application Number Title Priority Date Filing Date
DE19522428A Expired - Fee Related DE19522428C1 (en) 1995-03-09 1995-06-21 Test and current supply device for test items esp. for testing chips on wafer with several connection pads

Country Status (1)

Country Link
DE (2) DE29504037U1 (en)

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3702184A1 (en) * 1986-01-27 1987-07-30 Feinmetall Gmbh Test device for wafer testing
DE3734647A1 (en) * 1986-10-14 1988-04-21 Feinmetall Gmbh Pin board
US5225777A (en) * 1992-02-04 1993-07-06 International Business Machines Corporation High density probe

Also Published As

Publication number Publication date
DE19522428C1 (en) 1996-10-17

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Legal Events

Date Code Title Description
R207 Utility model specification

Effective date: 19950608

R156 Lapse of ip right after 3 years

Effective date: 19981201